部落格: #PROBES

文章

Female engineer using a Tektronix oscilloscope, shown with attached probes and device under test (DUT)

Scope ADC Resolution is Nothing Without Good Probes Thursday, September 19, 2024 作者： Andrea Vinci

Key Factors Determining the Accuracy of Electrical Signal Measurement Measurement accuracy is often misunderstood as being solely dependent on the specifications of the instrument, such as the number of waveforms displayed on its screen. However, true accuracy is much more complex. It is closely tied to how well the measurement setup preserves the integrity of the signal being measured. The …

#Probes

Probe Points: Understanding Low Frequency Response Friday, June 28, 2024 作者： Blair Battye

The Practice of AC Coupling and DC Reject Modes The practice of AC coupling the scope input or using a probe with DC reject capability is very common when looking at noise and/or ripple of DC power rails. Anytime there is insufficient DC offset available, then users often elect to use AC Coupling or DC Reject settings. With the focus on clean power, we see users more interested than ever before in …

#Oscilloscope #Probes

Tektronix’ Wide Bandgap Double Pulse Test Solution including the Wide Bandgap Double Pulse Test application (Opt. WBG-DPT) which runs on the 5 Series B MSO oscilloscope

The Importance of Double Pulse Testing for Designing Today’s Power Converters Thursday, June 27, 2024 作者： David Pereles

The field of power electronics is rapidly transitioning from the use of silicon semiconductor materials to wide bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN). One of the most common applications of GaN and SiC semiconductors is to enable smaller, faster and more efficient designs of power converters. Power converters operate at multiple stages throughout the power …

#Oscilloscope #Probes #Software

Tektronix power rail measurement with Passive Probes (below) and Power Rail Probes (above)

Achieving Better Energy Efficiency in AI Data Centers With Power Integrity Testing Tuesday, June 18, 2024 作者： Christopher Loberg

Introduction Deployment of AI-based technology is happening in the Data Center. The processor-intensive servers are driving up energy demands. The table below illustrates the magnitude of the impact. The International Energy Agency (IEA) predicts that data centers will account for up to seven percent of global electricity consumption by 2030; a number equivalent to the entire country of India’s …

#Oscilloscope #PowerSupplies #Probes #TekExplains

4 Key Testing Phases for Power Conversion Equipment Tuesday, February 14, 2023 作者： John Tucker

While the types of electrical tests required during the design and production of power conversion equipment are similar to those required for previous generations of devices, the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN) requires added rigor and new test strategies. Bench testing continues to play an important role at every stage of the development of …

#4200a #AFG #Oscilloscope #Probes #SMU

Gain Powerful Design Insights, Join Tektronix at DesignCon 2023 Wednesday, January 18, 2023 作者： Tektronix Expert

DesignCon 2023 is happening January 31 – February 2, 2023 at the Santa Clara Convention Center in Santa Clara, CA and we’ll be at Booth 727. Swing by and we’ll show you – in real time – practical applications to solve current and emerging test challenges. Here’s what you’ll find… Deep Dive Into DDR5 and LPDDR5/5X Explore the Tektronix memory solutions (leveraging powerful analysis tools) on AMD’s …

#EmbeddedDesign #Oscilloscope #PCIe #Probes

Engineer using a Tektronix Isolated probe with an oscilloscope

SiC MOSFETs Represent Opportunities and Measurement Challenges for EV Designers Tuesday, November 15, 2022 作者： Christopher Loberg

Innovation in semiconductor technology is enabling more efficient and dense power conversion in hybrid and electric vehicles. Wide bandgap silicon carbide (SiC) technology enables faster switching and lower switching loss in high voltage EV systems. However, the same fast switching and high voltage capabilities that make SiC MOSFETs so promising, also create measurement challenges. Probing the …

#Probes

New Ways to Access Ever-Smaller DRAM Memory Friday, April 1, 2022 作者： Ted Coleman

We’re in a new age of data. As our world becomes more enabled and new technologies are implemented, the world is experiencing an explosion in the amount of data being generated and processed. According to Statista global research, there will be 97 Zettabytes of data created this year. Even more jarring is the acceleration of the pace at which that data is being created; a 2020 study delivered by …

#Oscilloscope #Probes

5 series mixed signal oscilloscope with a Tektronix IsoVu probe

Best Practices When Handling Tektronix IsoVu Isolated Differential Probes Monday, December 20, 2021 作者： Cameron Lowe

In this article, we will explore in detail some best practices to follow when handling Tektronix's isolated differential probe, also known as IsoVu™ probes. What is IsoVu? IsoVu is the brand name used to describe Tektronix's isolated differential probes. Generation One (TIVHx/TIVMx) was released several years ago, and Generation Two (TIVPx) came out more recently. IsoVu probes were originally …

#Automotive #Oscilloscope #Probes #Semiconductors

What is an Oscilloscope Probe? Monday, May 3, 2021 作者： Andrea Vinci

An oscilloscope probe is a device that makes a physical and electrical connection between a test point or signal source and an oscilloscope. Depending on your measurement needs, this connection can be made with something as simple as a length of wire or with something as sophisticated as an active differential probe. Essentially, a probe is some sort of device or network that connects the signal …

#Probes #TekExplains

部落格

#Oscilloscope #SMU