與我們聯絡

與 Tek 業務代表即時對談。 上班時間:上午 6:00 - 下午 4:30 (太平洋時間)

致電

請致電

與 Tek 業務代表即時對談。 上班時間:上午 8:30 - 下午 5:30 (太平洋時間)

下載

下載手冊、產品規格表、軟體等等:

下載類型
機型或關鍵字

部落格: #EMI AND EMC

文章

EMI application
Building Your Own EMI Troubleshooting and Pre-Compliance Kit Monday, October 17, 2022
Dylan Stinson, Product Marketing Manager at Tektronix, recently penned an article for the Interference Technology’s 2022 EMC Testing Guide: How to Build Your Own EMI Troubleshooting and Pre-Compliance Kit. We wanted to share some of the key insights here. Failing EMI/EMC compliance testing can certainly ruin a design engineer’s day. The costs and time delays associated with a failed test can add …
Magnetisches und elektrisches Feld auf einer Leiterplatte
Identify Electromagnetic Interference (EMI) in 3-Steps Monday, July 26, 2021
Radiated emissions, most often referred to as electromagnetic interference (EMI), are carefully regulated to ensure reliable operation and safety for users of electrical and electronic equipment. Regulations limit the allowable radiated emissions, and to keep their products within these limits, designers invest significant time and effort. One reason why EMI poses challenges is that emissions are …
6 Series Oscilloscope with a Near Field Probe
Troubleshooting EMI – 2 Tips and a Case Study Tuesday, April 7, 2020
Your design is exceeding the radiated emissions allowed by EMC regulations, now what? Whether you’re performing pre-compliance testing or troubleshooting a failed formal compliance test, our latest generation oscilloscopes make what was once an overwhelming task far simpler and more straightforward. Below are two helpful tips and a case study to help you troubleshoot EMI. For an even deeper dive …
Tektronix to Demonstrate Wide Bandgap Power Solutions at APEC 2019
Tektronix to Demonstrate Wide Bandgap Power Solutions at APEC 2019 Saturday, March 16, 2019
The big news for Tektronix at the APEC 2019 Conference next week will be a new solutions kit for SiC MOSFET and GaN FET switching power conversion testing. Tektronix offers the only solution on the market that can accurately characterize all the critical parameters for optimizing power electronics topologies that use wide bandgap Silicon Carbide (SiC) and Gallium Nitride (GaN) semiconductors …