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데이터 시트 참고자료 번호: 릴리즈 날짜 BERTScope Clock Recovery Datasheet
65W-25479-9
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매뉴얼 매뉴얼 유형 부품 번호: 릴리즈 날짜 Tektronix BERTScope
Clock Recovery Declassification & Securities Instructions기밀 해제 077110200 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual프로그래머 077069605 Tektronix BERTScope
Clock Recovery Instruments Quick Start User Manual주 사용자 071285202 Tektronix BERTScope
BSAPCI3 Instructions사용자 071304600 Tektronix BERTScope
Clock Recovery Instruments Quick Start User Manual.주 사용자 071285201 BERTScope Clock Recovery Quick Start Guide
This Quick Start User Manual supports the Tektronix BERTScope CR125A, CR175A, and CR286A Clock Recovery instruments. Quick Start User Manual사용자 077055700 BERTScope
Clock Recovery Instruments Quick Start User Manual사용자 071285200
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기술 문서 문서 유형 릴리즈 날짜 Stress Calibration for Jitter >1UI
While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …애플리케이션 노트 Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+ …입문서 Stressed Eye Primer
In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.입문서 PCI Express® Transmitter PLL Testing — A Comparison of Methods
There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition …입문서 Stressed Eye: “Know What You’re Really Testing With”
BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.입문서 Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.입문서 Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.입문서 Dual-Dirac+ Scope Histograms and BERTScan Measurements
This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.입문서 Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally …입문서 BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.애플리케이션 노트 Comparing Jitter Using a BERTScope® Bit Error Rate Testing
Comparison of DCD and F/2 Jitter.애플리케이션 노트 Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture …애플리케이션 노트 Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial
BER Contour Measurement - What it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds.애플리케이션 노트 Clock Recovery’s Impact on Test and Measurement
As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship …애플리케이션 노트 아이다이어 그램기본 기술서
본 어플리케이션 노트에서는 아이다이어 그램 측정에 대한 노하우 및 전송선, 채널및 리시버 상에서 어떻게 아이다이어 그램을 측정하는지에 대한 기본적인 지식을 습득 하실 수 있습니다.애플리케이션 노트 BERTScope™ CR125A, 175A 및 286A 클록 복구 요약서(english)
Key Specs and Ordering Information for BERTScope CR125A, 175A, & 286A Clock Recovery.팩트 시트(Fact Sheet) BERTScope Content Archive
To request copies of historical content from SyntheSys Research (now Tektronix Inc.) related to BERTScope and the following applications, please click the link below.Request Now기술 브리프(Brief)
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소프트웨어 문서 유형 부품 번호: 릴리즈 날짜 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5608
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …애플리케이션 063430807 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5522
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …애플리케이션 063430806 BERTScopePC Software, V 10.15.1284
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B, DPP125C)and BSAITS instruments that are being operated as stand-alone instruments, i.e. not …애플리케이션 063430803 BERTScopeCR Help File V1.0
BERTScope Clock Recovery Instrument Help File for offline use.애플리케이션 066130900 BERTScopePC Software V 10.9.1024
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to …애플리케이션 1000000482
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FAQ FAQ ID On the PCIe PLL Bandwidth Tester Windows application that's used with the CR286A, there is a drop down under "Options" called "Enhanced Measurement" and has the options of "Standard", "Sensitive", and "Disabled".What does each option do?
In 8G mode only, some DUT’s are sensitive to the initialization routine, which involves forcing a re-lock of the DUT PLL several times to optimize the peaking measurement.The “Standard” selection uses a method that toggles the CR divider reset to …72106 What is the electrical specifications for SMAPOWERDIV used with the Clock Recovery in Tektronix BERT scopes?
NOMINAL IMPEDANCE: 50 ohm FREQUENCY RANGE: dc to 18.0 GHz INSERTION LOSS (between input & either output arm): 6 dB nominal, -0.2 dB, +1.2 to 10 GHz, 1.5 to 18 GHz MAXIMUM INPUT POWER: 1 watt CW, 1 kilowatt peak (5 μsec pulse width, 0.05% duty cycle …64616 How do I use TekExpress to perform a USB 3.0 Device Transmitter Test?
USB 3 Tx Testing ScriptHello and welcome to Tektronix! Today I’m going to walk through a USB 3 Device Transmitter Test using TekExpress.A USB 3 Transmitter test consists of acquiring the signal from a USB 3 Device and running it through various tests …69376
