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技術文件 文件類型 發行日期 High Voltage 1 kV Capacitance-Voltage Measurements with the Keithley S530-HV Parametric Test System
Introduction to High Voltage Capacitance-Voltage (C-V) Testing Due to the complexities typically associated with high voltage (1 kV) capacitance wafer-level testing, such as instrumentation setup, cabling, probing, automation, and safety …應用摘要 Measuring MOSFET Gate Charge Using the S530 Parametric Test System
Introduction Power MOSFETs are often used as high speed switching devices. The switching speed of these devices is affected by internal capacitances that are typically specified in data sheets in terms of Ciss and Coss, which are derived from …應用摘要 Testing High Power Semiconductor Devices from Inception to Market
Introduction This primer examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle …入門 9139B Probe Card Adapter Board Files
This zip file contains files for fabrication of a 9139B-PCA (Probe Card Adapter) probe card. Files include a fabrication print and Gerber files.規格 Making Microsecond Pulse and AC Measurements with the S530 Parametric Test System by Integrating 4200A-SCS Parameter Analyzer Applications
This application note describes how to generate microsecond pulsed I-V sweeps and tests, as well as make AC impedance measurements, with the S530 Parametric Test System by calling built-in user libraries from the 4200A-SCS Parameter Analyzer in the …應用摘要 Protecting Parametric Test Systems and the Test Environment from Damaging Transient Overvoltages and Overcurrents
Measuring breakdown parameters is increasingly required to predict a device’s safe region of operation. Sometimes, those breakdown conditions in reliability testing and breakdown test occur as a result of unexpected behaviors, such as a second …應用摘要 Programming and Erasing Flash Memory Devices Using the Keithley S530 Pulse Generator Option
This note provides an overview of how to use the S530 Parametric Test System’s pulse source option to program and erase NAND flash memory cells. For further information on these measurements and on the S530 Parametric Test System pulse option …應用摘要 Performing van der Pauw Sheet Resistance Measurements Using the Keithley S530 Parametric Tester
Accurate low voltage measurements are essential to many semiconductor tests. Often, test structures such as contact chains, vias, and metal structures have resistances on the order of tens to hundreds of milliohms. Measuring such small resistances …應用摘要