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  • Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU Instruments and ACS Basic Edition Software
    Technical Document

    Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU Instruments and ACS Basic Edition Software

    Keithley’s SourceMeter Source Measure Unit (SMU) instruments give both device test engineers and power module design engineers the tools they need to make the measurements they require. Whether they’re familiar with curve tracers, semiconductor parameter analyzers, or oscilloscopes, they can obtain accurate results simply and quickly. This application note highlights some of the most commonly performed tests, the challenges associated with them, and how Keithley SMU instruments and ACS Basic Edition Software can simplify the testing process.

    1KW-57464-0 | Date: Monday, August 16 2021

  • ACS Wafer Level Reliability Edition Datasheet
    Datasheet

    ACS Wafer Level Reliability Edition Datasheet

    Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …

    1KW-56418-3 | Date: Monday, December 04 2023

  • Measuring Breakdown Voltage on a Wide Bandgap MOSFET
    Videos, Webinars and Demos

    Measuring Breakdown Voltage on a Wide Bandgap MOSFET

    Watch this demonstration of a breakdown test on a Silicon Carbide MOSFET using a Keithley 2657A High Power System SourceMeter™ SMU Instrument, 8010 Test Fixture, and KickStart Software.

    | Date: Friday, September 30 2022

  • Re-Inventing High Power Semiconductor Device Characterization
    Technical Document

    Re-Inventing High Power Semiconductor Device Characterization

    This selection guide provides the information you need to select the best hardware and software for your power device characterization requirements.

    1KW-29154-0 (Keithley Number 3216) | Date: Wednesday, March 20 2013

  • Testing High Power Semiconductor Devices from Inception to Market
    Technical Document

    Testing High Power Semiconductor Devices from Inception to Market

    This primer discusses methods for efficient, flexible test and characterization throughout the life cycle of a power semiconductor device.

    1KW-60127-2 | Date: Tuesday, January 16 2024

  • Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization
    Technical Document

    Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization

    This e-guide explores some of the most common DC current vs. voltage (I-V) tests being performed today, the seemingly inherent complications posed by each, and how new techniques can help to not only overcome these challenges but enhance efficiency and productivity, as well.

    Date: Tuesday, June 30 2015

  • New High Power Semiconductor Devices are Pushing Instrumentation to Extremes
    Technical Document

    New High Power Semiconductor Devices are Pushing Instrumentation to Extremes

    Design and production of today’s semiconductors and power modules based on silicon carbide and gallium nitride demand more rigorous testing than with previous generations.  This technical brief provides information on how to cost-effectively achieve safe, accurate, and reliable testing to meet precise design requirements.

    1KW-73841-0 | Date: Wednesday, October 13 2021

  • Keithley Test Fixtures Selector Guide
    Technical Document

    Keithley Test Fixtures Selector Guide

    Selector guide for Keithley text fixtures

    1KW-4674-1 | Date: Monday, October 10 2022

  • Keithley Instrumentation for Electrochemical Test Methods and Applications
    Technical Document

    Keithley Instrumentation for Electrochemical Test Methods and Applications

    This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

    1KW-60158-1 | Date: Wednesday, April 25 2018

  • Kirchhoff’s Law saves the day when you need more power!
    Blog Entry

    Kirchhoff’s Law saves the day when you need more power!

    You’re designing a new device/component and you just realized that the source measure unit (SMU) instrument that you have been using to perform I-V characterization doesn’t have enough power to test …

    最終更新日： Tuesday, August 1, 2023