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データシート 文書番号： リリースの日付 BERTScope Clock Recovery Datasheet
65W-25479-9
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マニュアル マニュアルの種類 部品番号： リリースの日付 Tektronix BERTScope
Clock Recovery Declassification & Securities Instructions機密解除 077110200 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manualプログラマ 077069605 Tektronix BERTScope
Clock Recovery Instruments Quick Start User Manual主要ユーザ 071285202 Tektronix BERTScope
BSAPCI3 InstructionsUser 071304600
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技術情報 ドキュメントの種類 リリースの日付 BER等高線入門－アイ・ダイアグラムとBER
このアプリケーション・ノートでは、BER等高線測定の概要について説明します。具体的には、BER等高線とは何か、どのように構成され、ギガビット・スピードでのパラメータ性能に有効な観測方法である理由について説明します。さらに、BERTScopeビット・エラー・レート・テスタiによるBER等高線の例についても説明します。アプリケーション・ノート アイ・パターン（アイ・ダイアグラム）測定方法
アイ・パターン（アイ・ダイアグラム）の構造分析 このアプリケーション・ノートは、アイ・パターン（アイ・ダイアグラム）とは何か、その構造、アイ・ダイアグラム生成のための一般的なトリガ方法について説明します。また、アイ・ダイアグラムをスライスすることで得られるさまざまな情報についても説明します。さらに、トランスミッタ、チャンネル、レシーバ・テストの基本的な方法についても説明します。この分野に馴染のないエンジニアでも、一般的に使用される概念がわかるように書かれています。 図1 …アプリケーション・ノート Stress Calibration for Jitter >1UI
While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …アプリケーション・ノート Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Figure 1. An example Fibre Channel topology. Abstract The Fibre Channel standard is evolving to include the next generation "16G" data rate. Specifications show a line rate of 14 …入門書 Stressed Eye Primer
Figure 1. Conceptual picture of an ideal receiver. Figure 2. Simplified Receiver Block Diagram. Abstract Many high-speed serial …入門書 PCI Express® Transmitter PLL Testing — A Comparison of Methods
Abstract The electrical compliance test specification drafted by PCISIG requires testing loop response of the Phase Locked Loop (PLL) used in add-in cards to generate a local transmitter clock from a 100 MHz reference oscillator. There are several …入門書 Stressed Eye: “Know What You’re Really Testing With”
BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.入門書 Clock Recovery Primer, Part 2
Abstract Clock recovery is a common part of many measurements, whether as part of the test setup or part of the device under test. We’re going to look at clock recovery from a practical point of view, with emphasis on how it affects …入門書 Clock Recovery Primer, Part 1
Figure 1. If clock and data were to move in time by the same amount at the same time, a decision circuit could remove the effect of jitter. Abstract Clock recovery is a common part …入門書 Dual-Dirac+ Scope Histograms and BERTScan Measurements
Figure 1.1. Using an eye diagram to set a window around the crossing point and plot edge positions. Abstract Much has been written about the strengths and weaknesses of dual-Dirac …入門書 Evaluating Stress Components using BER-Based Jitter Measurements
Figure 1.1. Self-verification stress setup - connections to a BERTScope S or BERTScope with option SE (left). Stress user interface (right) showing the addition of individual impairments …入門書 BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
Abstract Jitter Map is a capability on the BERTScope that uses BER measurements tomeasure Total Jitter as well as decompose jitter beyond basic Random and Deterministic Jitter. This paper introduces the reader to the methodologies …アプリケーション・ノート Comparing Jitter Using a BERTScope® Bit Error Rate Testing
Introduction In most systems, it is desirable to have each data bit have the same duration (see Figures 1(a) and 2(d)). When bits vary in length, either randomly or systematically, this is known as jitter. One traditional form of …アプリケーション・ノート Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Introduction Mask testing is a common method of estimating whether a transmitted waveform is of sufficient quality to meet system requirements. In most systems the requirement is to pass bits error free, or at least at better than 1 …アプリケーション・ノート Clock Recovery’s Impact on Test and Measurement
Introduction Clock recovery plays a significant role in making accurate test measurements, whether incorporated into the test setup or as part of the device under test. As most gigabit communication systems are synchronous, the data …アプリケーション・ノート BERTScope™ CR125A+ 175A+ & 286A Clock Recovery Fact Sheet
Key Specs and Ordering Information for BERTScope CR125A, 175A, & 286A Clock Recovery.ファクト・シート
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ソフトウェア ドキュメントの種類 部品番号： リリースの日付 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5608
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Application 063430807 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5522
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Application 063430806 BERTScopePC Software, V 10.15.1284
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B, DPP125C)and BSAITS instruments that are being operated as stand-alone instruments, i.e. not …Application 063430803 BERTScopeCR Help File V1.0
BERTScope Clock Recovery Instrument Help File for offline use.Application 066130900 BERTScopePC Software V 10.9.1024
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to …Application 1000000482
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FAQ FAQ ID On the PCIe PLL Bandwidth Tester Windows application that's used with the CR286A, there is a drop down under "Options" called "Enhanced Measurement" and has the options of "Standard", "Sensitive", and "Disabled".What does each option do?
In 8G mode only, some DUT’s are sensitive to the initialization routine, which involves forcing a re-lock of the DUT PLL several times to optimize the peaking measurement.The “Standard” selection uses a method that toggles the CR divider reset to …72106 How do I use TekExpress to perform a USB 3.0 Device Transmitter Test?
USB 3 Tx Testing ScriptHello and welcome to Tektronix! Today I’m going to walk through a USB 3 Device Transmitter Test using TekExpress.A USB 3 Transmitter test consists of acquiring the signal from a USB 3 Device and running it through various tests …69376 What is the electrical specifications for SMAPOWERDIV used with the Clock Recovery in Tektronix BERT scopes?
NOMINAL IMPEDANCE: 50 ohm FREQUENCY RANGE: dc to 18.0 GHz INSERTION LOSS (between input & either output arm): 6 dB nominal, -0.2 dB, +1.2 to 10 GHz, 1.5 to 18 GHz MAXIMUM INPUT POWER: 1 watt CW, 1 kilowatt peak (5 μsec pulse width, 0.05% duty cycle …64616
