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Semiconductor Test Systems

Most Recent Fundamentals Application Notes Solution Briefs Videos Webinars
Application Notes

Measuring MOSFET Gate Charge Using the S530 Parametric Test System

6/5/2024

This application note describes how to make gate charge measurements on a MOSFET based on the JEDEC Gate Charge Test Method.

Solution Briefs

Evolving Materials and Testing for Emerging Generations of Power Electronics Design

5/15/2019

Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increa …

Videos
How to make automatic I-V and C-V measurements

How to make automatic I-V and C-V measurements

8/3/2016

In this video, we show you how to quickly set up your test for making automatic I-V and C-V measurements on the Keithley 4200A-SCS Parameter Analyzer.

Webinars
Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices

Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices

5/24/2019

Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made.