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Ensuring Precision and Reliability in Electronic Innovation

The pace of semiconductor development is accelerating around the world thanks to near-daily breakthroughs in technology, market demand, and government policies. We depend on semiconductors in nearly every aspect of our lives for connectivity, professional tasks, and relaxation. Quantifying and guaranteeing the dependability of these electronics is crucial. Semiconductor testing is the broad process of ensuring reliability and performance across the material, device, and system levels of the semiconductor world.

Tektronix’s Comprehensive Suite of Semiconductor Test Solutions

At Tektronix, we offer a range of semiconductor testing solutions tailored to the needs of designers, validation engineers and manufacturers. Keithley instruments deliver exceptional precision for validating device characteristics, from wafer to die to packaged device. EA Elektro-Automatik power supplies contribute high power for testing next-generation power semiconductors. And Tektronix oscilloscopes and signal sources help chip designers secure advances in high-speed data communications. With the global nature of the semiconductor industry, it's important to go with a vendor with global coverage, like Tektronix.

Keithley and Tektronix suite of semiconductor testing tools

Materials Testing

Materials testing in the power semiconductor industry involves examining materials like silicon carbide (SiC) and gallium nitride (GaN). This process, crucial for understanding their unique properties, plays a significant role in the manufacturing of power semiconductors. It contributes to the development of efficient and reliable electronic devices, shaping the future of the electronics industry. Learn more about the types of materials testing Tektronix offers below.

Laboratory setup featuring a probe station with a wafer and a Keithley instrument displaying a resistivity measurement.

Materials Research

Discover how materials like gallium arsenide (GaAs) and silicon carbide (SiC) are revolutionizing power transmission technologies. Dive deeper into this fascinating field with Tektronix and Keithley’s advanced test and measurement instrumentation.

Device Testing

Device testing in the power semiconductor industry is a key process that evaluates the functionality, performance, and reliability of semiconductor devices. This testing ensures that these devices meet the required performance, reliability, and quality standards before they are incorporated into electronic products. It includes various techniques, one of which is I-V characterization, a fundamental method for understanding the relationship between current and voltage in power semiconductors. Learn more about the types of device testing Tektronix offers below.

Scientist in cleanroom attire examining a semiconductor wafer under a microscope.

Wafer Level Testing

Learn about the intricate process of wafer testing and its pivotal role in ensuring the reliability and performance of semiconductor devices.
Technician in cleanroom attire holding a semiconductor wafer with colorful reflections, in a lab with a microscope

I-V Characterization

Learn about I-V Characterization, a fundamental method for understanding the relationship between current and voltage in semiconductors. This process is crucial for the development of wide bandgap semiconductors like silicon carbide (SiC) and gallium nitride (GaN).
Illustration of a battery icon integrated into a circuit board design, with glowing blue circuitry and binary code background.

Power Semiconductor

Learn about the role of power semiconductors in creating a clean, renewable, and reliable energy ecosystem. Understand the challenges and advancements in wide bandgap semiconductor technology like Silicon Carbide (SiC) and Gallium Nitride (GaN).
Wafer Level Reliability Semiconductor Testing with Keithley Instrument Using Pulse Measure Modules and Displaying HCI data plots

Reliability Testing

As new device designs are being developed, reliability testing within the semiconductor industry is more important than ever to ensure these innovations deliver both performance and durability.

System-Level Testing

System-Level Testing in the power semiconductor industry is an all-encompassing process that checks the functionality and performance of semiconductor devices within a system context. This method of testing is becoming increasingly important as it can identify design issues that may not be detected at the wafer probe and package test stages. It enables the testing of millions of chips in parallel at high speeds, thereby increasing throughput while ensuring maximum test coverage. As semiconductor geometries shrink and more complexity is integrated into chips or packages, this approach to testing is becoming essential.

Close-up of network cables connected to a switch in a data center, with glowing blue lines indicating data transfer.

High-Speed Serial Communication

Learn about the rapidly evolving high-speed digital standards that are meeting the performance demands of our data-driven world. Understand the new test challenges these standards bring and how they push the limits of today’s compliance and debug tools.
Close-up of server racks in a data center, showing multiple server units with indicator lights and ventilation panels.

Memory Testing

Learn about DDR Test Solutions for Memory Technologies, a critical aspect of 5G technology. Understand the complexities of DDR5 memory testing and how it improves bandwidth, density, and channel efficiency.

Resources Related to Semiconductor Testing

Using a Tektronix 5  Series MSO oscilloscope to test semiconductors based on wide-bandgap (WBG) materials.
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Are You Keeping Pace with Wide-Bandgap Test Requirements?

A new generation of wide-bandgap (WBG) materials such as silicon carbide (SiC) and gallium nitride (GaN) are becoming more prevalent.
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Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices

Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made. 
A Keithley parameter analyzer and external switch performing current-voltage (I-V) and capacitance-voltage (C-V measurements of MOSFET and MOScap devices.
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Simplifying MOSFET and MOSCAP Device Characterization e-Guide

This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements.
Power semiconductor device analysis on the touchscreen of a Tektronix oscilloscope.
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Testing High Power Semiconductor Devices from Inception to Market

This primer examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle.

Stages of Semiconductor Testing

Semiconductor testing is a critical process in the manufacturing of semiconductor devices, ensuring that the final products meet the required specifications and are of high quality. The testing process is typically divided into several stages, including wafer testing, package testing, and final testing.

Semiconductor scientist in protective clothes doing research on a personal computer while in a semiconductor fabrication facility.

Wafer Testing

Wafer testing, also known as wafer sort or wafer probing, is the first stage of semiconductor testing. It is performed on the semiconductor wafer itself before it is cut into individual dies. The purpose of wafer testing is to identify any defects or failures at an early stage, thereby reducing waste and improving yield. During wafer testing, each die on the wafer is tested for functionality using a probe card that makes electrical contact with the die’s pads. Tektronix offers complete wafer testing services for mission-critical devices. Their capabilities include testing of 4", 6", 8", 12" wafers (100mm, 150mm, 200mm, 300mm) analog, digital, and mixed signal test.

Learn more about Tektronix wafer testing services

 

Case Study: Wafer Testing

Imagine you’re an engineer at a semiconductor manufacturing facility. You’ve just received a new batch of silicon wafers and it’s your job to test them. You start by loading the wafers into the wafer prober, a machine that can automatically position the wafer so that each die is under the probe card. The probe card comes down and makes contact with the pads on the die. The machine then runs a series of electrical tests to check the functionality of the die. If a die fails any of these tests, it’s marked as defective and will be discarded after the wafer is cut into individual dies.

Semiconductor packaging with silicon die being extracted from semiconductor wafer and attached to substrate by pick and place machine.

Package Testing

After the wafer is cut into individual dies, the dies that passed the wafer testing are packaged. The packaged dies undergo another round of testing known as package testing or final testing. This stage of testing is more comprehensive and involves testing the packaged chips under various conditions to ensure they meet all the specified electrical, mechanical, and thermal performance criteria. Package testing can include tests for speed, power, and leakage current. Tektronix offers package testing services to ensure that your packaging will stand up to the rigors of distribution and storage.

Learn more about package testing services at Tektronix

Use Case: Package Testing

Now, imagine you’re in the package testing department. You receive the packaged dies from the wafer testing department. Your job is to ensure that these packaged chips are ready for the real world. You load the chips into the test sockets on a test board. The test equipment is programmed to run a series of tests that simulate the conditions the chips will face in their intended applications. These tests include checking the speed of the chip, its power consumption, and whether there are any leaks in the package. Any chips that fail these tests are discarded.

Final Testing

The final stage of semiconductor testing is the system-level testing or application testing. In this stage, the packaged chips are tested in a system similar to the one they will be used in. This ensures that the chips function correctly in real-world applications. Tektronix offers IC package test solutions to verify components and modules are operating at required performance levels.

Learn more about Final Testing

Semiconductor inspection system with digital microscope.

Use Case: Final Testing

Finally, you’re in the system-level testing department. Here, the chips are no longer tested in isolation. Instead, they’re placed in a system that’s similar to the one they’ll be used in. This could be a mobile phone, a car’s electronic system, or a server in a data center. You monitor the system’s performance, making sure that the chip is working as expected in its intended environment. If the chip passes these tests, it’s ready to be shipped out to the customers.
In conclusion, semiconductor testing is a rigorous process that ensures the quality and reliability of semiconductor devices. It helps in identifying and eliminating defective chips, thereby ensuring that only high-quality devices make it to the market.

 

Advanced Semiconductor Testing Techniques

 

 

Semiconductor Frequently Asked Questions

What is semiconductor testing?

Semiconductor testing involves evaluating chips to identify defects, verify functionality, and ensure compliance with industry standards. It helps guarantee that the chips perform flawlessly in various applications.

Why is semiconductor testing necessary?

Testing is essential because fabrication processes can introduce flaws. By identifying and rectifying these issues, we ensure that the chips meet quality standards and function correctly.

What are the different types of semiconductor testing?

  1. Functional Tests: These tests verify whether the chip performs its intended functions.
  2. Structural Tests: They highlight flaws resulting from manufacturing errors.
  3. Parametric Tests: These determine specific electronic characteristics (e.g., current and voltage levels).

What is Automated Test Equipment (ATE)?

ATE is a sophisticated testing tool that runs tests on one or more devices simultaneously. It includes hardware, software, signal generators, and testing probes. ATE ensures efficient testing during semiconductor production.

How does ATE work?

  1. Hardware: Includes complex electronic metering and stimulus devices.
  2. Software: Regulates data flow, creating unique test programs for different devices.
  3. Test Tools: Manage the transmission of data and stimulus signals.
  4. Testing Probes or Handlers: Interact with the devices being tested.

What are the categories of testers used in semiconductor testing?

  1. Boolean Testers: Evaluate digital logic.
  2. Memory Testers: Assess memory components.
  3. Analog Testers: Analyze analog circuits.