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Technical Document
Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU Instruments and ACS Basic Edition Software

Keithley’s SourceMeter Source Measure Unit (SMU) instruments give both device test engineers and power module design engineers the tools they need to make the measurements they require. Whether they’re familiar with curve tracers, semiconductor parameter analyzers, or oscilloscopes, they can obtain accurate results simply and quickly. This application note highlights some of the most commonly performed tests, the challenges associated with them, and how Keithley SMU instruments and ACS Basic Edition Software can simplify the testing process.

1KW-57464-0 | Date: Monday, August 16 2021
Datasheet
Series 2400 SourceMeter SMU Instruments

Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as …

1KW-2798-4 | Date: Monday, October 07 2024
Datasheet
ACS Wafer Level Reliability Edition Datasheet

Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …

1KW-56418-3 | Date: Monday, December 04 2023
Videos, Webinars and Demos
Measuring Breakdown Voltage on a Wide Bandgap MOSFET

Watch this demonstration of a breakdown test on a Silicon Carbide MOSFET using a Keithley 2657A High Power System SourceMeter™ SMU Instrument, 8010 Test Fixture, and KickStart Software.

| Date: Friday, September 30 2022
Technical Document
Source Measure Unit (SMU) Instruments Selector Guide

MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …

1KW-61458-2 | Date: Tuesday, August 24 2021
Technical Document
Testing High Power Semiconductor Devices from Inception to Market

This primer discusses methods for efficient, flexible test and characterization throughout the life cycle of a power semiconductor device.

1KW-60127-2 | Date: Tuesday, January 16 2024
Technical Document
New High Power Semiconductor Devices are Pushing Instrumentation to Extremes

Design and production of today’s semiconductors and power modules based on silicon carbide and gallium nitride demand more rigorous testing than with previous generations. This technical brief provides information on how to cost-effectively achieve safe, accurate, and reliable testing to meet precise design requirements.

1KW-73841-0 | Date: Wednesday, October 13 2021
Technical Document
Keithley Test Fixtures Selector Guide

Selector guide for Keithley text fixtures

1KW-4674-1 | Date: Monday, October 10 2022
Technical Document
Re-Inventing High Power Semiconductor Device Characterization

This selection guide provides the information you need to select the best hardware and software for your power device characterization requirements.

1KW-29154-0 (Keithley Number 3216) | Date: Wednesday, March 20 2013
Technical Document
Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization

This e-guide explores some of the most common DC current vs. voltage (I-V) tests being performed today, the seemingly inherent complications posed by each, and how new techniques can help to not only overcome these challenges but enhance efficiency and productivity, as well.

Date: Tuesday, June 30 2015