Power Efficiency

Ensure safe, precise and fast Si, SiC and GaN MOSFET testing in a lab and a wafer test environment. Learn more about the testing challenges resulting from the adoption of SiC and GaN into your designs and how to solve them. Discover how to minimize power draw and maximize battery life for your end-products. Accelerate the time-to-market for your designs.

Power Device Characterization

Safe, Precise, Fast MOSFET Testing for Si, SiC and GaN devices
Wide power envelope
Safely set up your test
2X Faster Device Characterization for improved time to market
Avoid expensive overdesigning of your wide bandgap device

Automated Parametric Test

Fully-automated HV Wafer-level testing
Move from high voltage to low voltage without changing test setup
Measure capacitance without manual reconfiguration Fast automation

SiC and GaN Power Conversion

Overcome high common mode voltages
Simultaneously measure multiple control and timing signals
Faster automated power measurements
Don't fail compliance

Double Pulse Testing

Measure turn-on and turn-off energy loss
Measure reverse recovery
Automated oscilloscope measurements
Easily generate gate drive signals

Maximizing Battery Life of IoT Devices

Determine the load current profile
Simulate any battery
Model any type of battery

Control Loop Analysis

Oscilloscope-based response measurement setup
Probe characteristics for control loop measurements
Measure stability margins with Bode plots
Control loop analysis system

Power Supply Measurement and Analysis

Switching loss measurement and analysis
In-circuit inductor and transformer measurements
GaN and SiC switching device measurements
Safe operating area (SOA)
Power supply rejection ratio
Control loop response

Analyzing Power Integrity on a PDN

Measure high-frequency ripple without blocking DC
Dealing with supplies from 1 V to 48 V and above
Minimizing measurement system noise contribution
PDN impedance measurements
Noise-hunting with synchronized spectrums and waveforms
Automated power rail measurements

Measurements on 3-Phase Variable Frequency Drives

Perform stable measurements on PWM 3-phase motor drives
Oscilloscope-based phasor diagrams
Measure system efficiency
DC bus measurements
Support for 2V2I, 3V3I star and delta configuration, as well as DC-in/3-phase out.

More applications in power efficiency:

EMI/EMC