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LPD64 Specifications and Performance Verification Manual

6 Series Low Profile Digitizer Specifications and Performance Verification

This document contains the specifications and performance verification procedures for 6 Series Low Profile Digitizer instruments.


該当製品:

LPD64

  • マニュアルの種類: 性能検査
  • 部品番号: 077156801
  • リリースの日付:
  • Revision: Rev A

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LPD64 Specifications and Performance Verification Manual

Important safety information

This manual contains information and warnings that must be followed by the user for safe operation and to keep the product in a safe condition.

To safely perform service on this product, see the Service safety summary that follows the General safety summary.

General safety summary

Use the product only as specified. Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it. Carefully read all instructions. Retain these instructions for future reference.

This product shall be used in accordance with local and national codes.

For correct and safe operation of the product, it is essential that you follow generally accepted safety procedures in addition to the safety precautions specified in this manual.

The product is designed to be used by trained personnel only.

Only qualified personnel who are aware of the hazards involved should remove the cover for repair, maintenance, or adjustment.

Before use, always check the product with a known source to be sure it is operating correctly.

This product is not intended for detection of hazardous voltages.

Use personal protective equipment to prevent shock and arc blast injury where hazardous live conductors are exposed.

While using this product, you may need to access other parts of a larger system. Read the safety sections of the other component manuals for warnings and cautions related to operating the system.

When incorporating this equipment into a system, the safety of that system is the responsibility of the assembler of the system.

To avoid fire or personal injury

Use proper power cord

Use only the power cord specified for this product and certified for the country of use. Do not use the provided power cord for other products.

Ground the product

This product is grounded through the grounding conductor of the power cord. To avoid electric shock, the grounding conductor must be connected to earth ground. Before making connections to the input or output terminals of the product, ensure that the product is properly grounded. Do not disable the power cord grounding connection.

Power disconnect

The power cord disconnects the product from the power source. See instructions for the location. Do not position the equipment so that it is difficult to operate the power cord; it must remain accessible to the user at all times to allow for quick disconnection if needed.

Connect and disconnect properly

Do not connect or disconnect probes or test leads while they are connected to a voltage source.

Use only insulated voltage probes, test leads, and adapters supplied with the product, or indicated by Tektronix to be suitable for the product.

Observe all terminal ratings

To avoid fire or shock hazard, observe all rating and markings on the product. Consult the product manual for further ratings information before making connections to the product.

Do not exceed the Measurement Category (CAT) rating and voltage or current rating of the lowest rated individual component of a product, probe, or accessory. Use caution when using 1:1 test leads because the probe tip voltage is directly transmitted to the product.

Do not apply a potential to any terminal, including the common terminal, that exceeds the maximum rating of that terminal.

Do not float the common terminal above the rated voltage for that terminal.

The measuring terminals on this product are not rated for connection to mains or Category II, III, or IV circuits.

Do not operate without covers

Do not operate this product with covers or panels removed, or with the case open. Hazardous voltage exposure is possible.

Avoid exposed circuitry

Do not touch exposed connections and components when power is present.

Do not operate with suspected failures

If you suspect that there is damage to this product, have it inspected by qualified service personnel.

Disable the product if it is damaged. Do not use the product if it is damaged or operates incorrectly. If in doubt about safety of the product, turn it off and disconnect the power cord. Clearly mark the product to prevent its further operation.

Before use, inspect voltage probes, test leads, and accessories for mechanical damage and replace when damaged. Do not use probes or test leads if they are damaged, if there is exposed metal, or if a wear indicator shows.

Examine the exterior of the product before you use it. Look for cracks or missing pieces.

Use only specified replacement parts.

Do not operate in wet/damp conditions

Be aware that condensation may occur if a unit is moved from a cold to a warm environment.

Do not operate in an explosive atmosphere

Keep product surfaces clean and dry

Remove the input signals before you clean the product.

Provide proper ventilation

Refer to the installation instructions in the manual for details on installing the product so it has proper ventilation.

Slots and openings are provided for ventilation and should never be covered or otherwise obstructed. Do not push objects into any of the openings.

Provide a safe working environment

Always place the product in a location convenient for viewing the display and indicators.

Avoid improper or prolonged use of keyboards, pointers, and button pads. Improper or prolonged keyboard or pointer use may result in serious injury.

Be sure your work area meets applicable ergonomic standards. Consult with an ergonomics professional to avoid stress injuries.

Use care when lifting and carrying the product. This product is provided with a handle or handles for lifting and carrying.

WARNING:The product is heavy. To reduce the risk of personal injury or damage to the device get help when lifting or carrying the product.

Use only the Tektronix rackmount hardware specified for this product.

Probes and test leads

Before connecting probes or test leads, connect the power cord from the power connector to a properly grounded power outlet.

Keep fingers behind the protective barrier, protective finger guard, or tactile indicator on the probes. Remove all probes, test leads and accessories that are not in use.

Use only correct Measurement Category (CAT), voltage, temperature, altitude, and amperage rated probes, test leads, and adapters for any measurement.

Beware of high voltages

Understand the voltage ratings for the probe you are using and do not exceed those ratings. Two ratings are important to know and understand:

  • The maximum measurement voltage from the probe tip to the probe reference lead.
  • The maximum floating voltage from the probe reference lead to earth ground.

These two voltage ratings depend on the probe and your application. Refer to the Specifications section of the manual for more information.

WARNING:To prevent electrical shock, do not exceed the maximum measurement or maximum floating voltage for the oscilloscope input BNC connector, probe tip, or probe reference lead.

Connect and disconnect properly.

Connect the probe output to the measurement product before connecting the probe to the circuit under test. Connect the probe reference lead to the circuit under test before connecting the probe input. Disconnect the probe input and the probe reference lead from the circuit under test before disconnecting the probe from the measurement product.

Connect the probe reference lead to earth ground only.

Inspect the probe and accessories

Before each use, inspect probe and accessories for damage (cuts, tears, or defects in the probe body, accessories, or cable jacket). Do not use if damaged.

Ground-referenced oscilloscope use

Do not float the reference lead of this probe when using with ground-referenced oscilloscopes. The reference lead must be connected to earth potential (0 V).

Floating measurement use

Do not float the reference lead of this probe above the rated float voltage.

Service safety summary

The Service safety summary section contains additional information required to safely perform service on the product. Only qualified personnel should perform service procedures. Read this Service safety summary and the General safety summary before performing any service procedures.

To avoid electric shock

Do not touch exposed connections.

Do not service alone

Do not perform internal service or adjustments of this product unless another person capable of rendering first aid and resuscitation is present.

Disconnect power

To avoid electric shock, switch off the product power and disconnect the power cord from the mains power before removing any covers or panels, or opening the case for servicing.

Use care when servicing with power on

Dangerous voltages or currents may exist in this product. Disconnect power, remove battery (if applicable), and disconnect test leads before removing protective panels, soldering, or replacing components.

Verify safety after repair

Always recheck ground continuity and mains dielectric strength after performing a repair.

Terms in this manual and on the product

These terms may appear in this manual:

WARNING:Warning statements identify conditions or practices that could result in injury or loss of life.
CAUTION:Caution statements identify conditions or practices that could result in damage to this product or other property.

These terms may appear on the product:

  • DANGER indicates an injury hazard immediately accessible as you read the marking.
  • WARNING indicates an injury hazard not immediately accessible as you read the marking.
  • CAUTION indicates a hazard to property including the product.

Terms on the product

These terms may appear on the product:

  • DANGER indicates an injury hazard immediately accessible as you read the marking.
  • WARNING indicates an injury hazard not immediately accessible as you read the marking.
  • CAUTION indicates a hazard to property including the product.

Symbols on the product



When this symbol is marked on the product, be sure to consult the manual to find out the nature of the potential hazards and any actions which have to be taken to avoid them. (This symbol may also be used to refer the user to ratings in the manual.)

The following symbols(s) may appear on the product.



CAUTION: Refer to Manual


Protective Ground (Earth) Terminal


Standby


Chassis Ground


Functional Earth Terminal

Specifications

This chapter contains specifications for the instrument. All specifications are typical unless noted as guaranteed. Typical specifications are provided for your convenience but are not guaranteed. Specifications that are marked with the ✔ symbol are guaranteed and checked in Performance Verification.

To meet specifications, these conditions must first be met:
  • The instrument must have been calibrated in an ambient temperature between 18 °C and 28 °C (64 °F and 82 °F).
  • The instrument must be operating within the environmental limits described in this manual.
  • The instrument must be powered from a source that meets the specifications.
  • The instrument must have been operating continuously for at least 20 minutes within the specified operating temperature range.
  • You must perform the Signal path compensation procedure after the warmup period. See the Signal path compensation procedure for how to perform signal path compensation. If the ambient temperature changes more than 5 °C (9 °F), repeat the procedure.

Analog channel input and vertical specification

Number of input channels
LPD64

4 SMA

Input coupling
DC
Input resistance selection

50 Ω

✓ Input impedance 50 Ω, DC coupled

50 Ω ±3%

Input VSWR, 50 Ω DC-coupled, typical
Input frequency VSWR < 100 mV/div VSWR ≥100 mV/div
<5 GHz 1.45 1.2
≤8 GHz 1.95 1.7
Maximum input voltage, 50 Ohm

2.3 VRMS at <100 mV/division, with peaks ≤ ±20 V

5.5 VRMS at >100 mV/division, with peaks ≤ ±20 V

DC balance

✓ 0.1 div with DC-50 Ω oscilloscope input impedance (50 Ω BNC terminated)

✓ 0.2 div at 1 mV/div with DC-50 Ω oscilloscope input impedance (50 Ω BNC terminated)

Number of digitized bits

8 bits at 25 GS/s; 8 GHz on all channels

12 bits at 12.5 GS/s; 4 GHz on all channels

13 bits at 6.25 GS/s (High Res); 2 GHz on all channels

14 bits at 3.125 GS/s (High Res); 1 GHz on all channels

15 bits at 1.25 GS/s (High Res); 500 MHz on all channels

16 bits at 625 MS/s (High Res); 500 MHz on all channels

For 12-bit mode, there are 4096 DL's (digitizing levels) in a captured waveform. For 8-bit mode, there are 256 DL's. DL is the abbreviation for digitization level. A DL is the smallest voltage level change that can be resolved by an A-D Converter. This value is also known as an LSB (least significant bit).

In an un-zoomed time-domain waveform plot, the full vertical scale of the plot (in 12-bit mode) is 4000 DLs ±48 DLs "off-screen" but are still available for measurements, analysis, and download.

In 8-bit mode, there are 250 DLs displayed. ±3 digitizing levels are "off-screen" but are still available for measurements, analysis, and download.

Sensitivity range, coarse
50 Ω
1 mV/div to 1 V/div in a 1-2-5 sequence
Sensitivity range, fine
50 Ω

Allows continuous adjustment from:

1 mV/div to 1 V/div

Sensitivity resolution, fine
≤1% of current setting
DC gain accuracy
✓50 Ohm

±2.0% (±2.0% at 2 mV/div, ±4% at 1 mV/div, typical). Immediately following SPC, add 2% for every 5 °C change in ambient.

±1.0% of full scale, (±1.0% of full scale at 2 mV/div, ± 2% at 1 mV/div, typical). Immediately following SPC, add 1% for every 5 °C change in ambient.

Offset ranges, maximum
Input signal cannot exceed maximum input voltage for the 50 Ω input path.
Volts/div SettingMaximum offset range, 50 Ω Input
1 mV/div - 99 mV/div±1 V
100 mV/div - 1 V/div±10 V
Position range
±5 divisions
✓Offset accuracy
±(0.005 X | offset - position | + DC balance); Offset, position, and DC Balance in units of Volts )
Digital nonlinearity

INL @ > 2 mV/div: ±16 DL's (12-bit reference)

INL @ ≤ 2 mV/div: ±20 DL's (12-bit reference)

DNL: ±1.0 DL's (12-bit digitizing scale) when oscilloscope is in Hi-Res mode.

Number of waveforms for average acquisition mode

2 to 10,240 Waveforms, default 16 waveforms

DC voltage measurement accuracy, Average acquisition mode
Measurement Type DC Accuracy (In Volts)
Average of ≥16 waveforms

±((DC Gain Accuracy) * |reading - (offset - position)| + Offset Accuracy + 0.05 * V/div setting)

Delta volts between any two averages of ≥16 waveforms acquired with the same oscilloscope setup and ambient conditions ±(DC Gain Accuracy * |reading| + 0.1 div)
DC voltage measurement accuracy, Sample acquisition mode, typical
Measurement Type DC Accuracy (In Volts)

Any Sample

±(DC Gain Accuracy * |reading - (offset - position)| + Offset Accuracy + 0.15+0.6 mV)

Delta volts between any two samples acquired with the same scope setup and ambient conditions

±(DC Gain Accuracy * |reading| + 0.15 div +1.2 mV)

Bandwidth selections
8 GHz model, 50 Ohm
20 MHz, 200 MHz, 250 MHz, 350 MHz, 500 MHz, 1 GHz, 2 GHz, 2.5 GHz, 3 GHz, 4 GHz, 5 GHz, 6 GHz, 7 GHz, and 8 GHz
6 GHz model, 50 Ohm
20 MHz, 200 MHz, 250 MHz, 350 MHz, 500 MHz, 1 GHz, 2 GHz, 2.5 GHz, 3 GHz, 4 GHz, 5 GHz, and 6 GHz
4 GHz model, 50 Ohm
20 MHz, 200 MHz, 250 MHz, 350 MHz, 500 MHz, 1 GHz, 2 GHz, 2.5 GHz, 3 GHz, and 4 GHz
2.5 GHz model, 50 Ohm
20 MHz, 200 MHz, 250 MHz, 350 MHz, 500 MHz, 1 GHz, 2 GHz, and 2.5 GHz
1 GHz model, 50 Ohm
20 MHz, 200 MHz, 250 MHz, 350 MHz, 500 MHz, and 1 GHz
Frequency response tolerance/flatness, 50 Ohm, all modes, typical

±0.5 dB from DC to 80% of bandwidth setting

Not valid for bandwidth settings ≤ 250 MHz or while using peak detect or envelope modes.

Phase response
±2.5 degrees, typical out to 7 GHz.
✓Analog bandwidth 50 Ω DC coupled
Model Volts/Div Setting Bandwidth
LPD64 BW-8000 1 mV/div - 1V/div DC - 8 GHz
LPD64 BW-6000 1 mV/div - 1V/div DC - 6 GHz
LPD64 BW-4000 1 mV/div - 1V/div DC - 4 GHz
LPD64 BW-2500 1 mV/div - 1V/div DC - 2.5 GHz
LPD64 BW-1000 1 mV/div - 1V/div DC - 1 GHz

The limits stated above are for ambient temperature of ≤ 30 °C and the bandwidth selection set to FULL. Reduce the upper bandwidth frequency by 1% for each °C above 30 °C.

Upper frequency limit, 250 MHz bandwidth limited, typical
50 Ω, DC-coupled
250 MHz, ± 5%
Upper frequency limit, 200 MHz bandwidth limited, typical
50 Ω, DC-coupled
200 MHz, ± 5%
Upper frequency limit, 20 MHz bandwidth limited, typical
50 Ω, DC-coupled
20 MHz, ± 5%
Calculated rise time

Calculated Rise Time (10% to 90%) equals 0.4/BW

Model 50 Ω TPP1000 Probe
1 mV-1 V 5 mV-10 V
LPD64 BW-8000 50ps 400ps
LPD64 BW-6000 66.67ps 400ps
LPD64 BW-4000 100ps 400ps
LPD64 BW-2500 160ps 400ps
LPD64 BW-2000 200ps 400ps
LPD64 BW-1000 400ps 400ps

The formula is calculated by measuring -3 dB bandwidth of the oscilloscope. The formula accounts for the rise time contribution of the oscilloscope independent of the rise time of the signal source.

Peak Detect or Envelope mode pulse response, typical
Minimum pulse width is >160 ps (25 GS/s)
Effective bits, 50 Ω, typical
50 mV/div, 25 GS/s, Sample Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz7 GHz
8 GHz6.56.56.56.46.46.3
7 GHz6.66.66.66.66.56.4
6 GHz6.86.86.86.76.7NA
5 GHz776.96.96.8NA
2 mV/div, 25 GS/s, Sample Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz7 GHz
8 GHz5.15.15.15.15.15.1
7 GHz5.35.35.35.35.35.3
6 GHz5.55.55.55.55.5NA
5 GHz5.655.655.655.655.65NA
50 mV/div, 12.5 GS/s, HiRes Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz
4 GHz7.257.257.257.17
3 GHz7.57.57.57.35NA
2.5 GHz7.67.67.67.4NA
2 GHz7.87.87.657.5NA
1 GHz8.28.28NANA
500 MHz8.58.5NANANA
350 MHz8.88.9NANANA
250 MHz8.99NANANA
200 MHz9NANANANA
20 MHz9.8NANANANA
2 mV/div, 12.5 GS/s, HiRes Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz
4 GHz5.95.95.95.855.8
3 GHz6.16.16.16.1NA
2.5 GHz6.26.26.26.2NA
2 GHz6.356.356.356.35NA
1 GHz6.86.86.8NANA
500 MHz7.27.2NANANA
350 MHz7.47.4NANANA
250 MHz7.57.5NANANA
200 MHz7.75NANANANA
20 MHz8.8NANANANA
Effective bits, 50 Ω
50 mV/div, 25 GS/s, Sample Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz7 GHz
8 GHz6.066.066.06

5.97

5.975.88
7 GHz6.156.156.156.156.065.97
6 GHz6.326.326.326.236.23NA
5 GHz6.486.486.406.406.32NA
2 mV/div, 25 GS/s, Sample Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz7 GHz
8 GHz4.754.754.754.754.754.75
7 GHz4.954.954.954.954.954.95
6 GHz5.155.155.155.155.15NA
5 GHz5.305.305.305.305.30NA
50 mV/div, 12.5 GS/s, HiRes Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz
4 GHz6.906.906.906.656.45
3 GHz7.157.157.157.00NA
2.5 GHz7.257.257.257.05NA
2 GHz7.457.457.307.15NA
1 GHz7.857.857.65NANA
500 MHz8.158.15NANANA
350 MHz8.458.55NANANA
250 MHz8.558.65NANANA
200 MHz8.65NANANANA
20 MHz8.90NANANANA
2 mV/div, 12.5 GS/s, HiRes Mode, 50 Ohm
Frequency
Bandwidth10 MHz250 MHz1 GHz2 GHz4 GHz
4 GHz5.555.555.555.505.45
3 GHz5.755.755.755.75NA
2.5 GHz5.855.855.855.85NA
2 GHz6.006.006.006.00NA
1 GHz6.456.456.45NANA
500 MHz6.856.85NANANA
350 MHz7.057.05NANANA
250 MHz7.157.15NANANA
200 MHz7.40NANANANA
20 MHz8.45NANANANA
Random noise, sample acquisition mode
✓ 50 Ω
Table 1. 25 GS/s, Sample Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
8 GHz 223 μV 224 μV 293 μV 482 μV 890 μV 2.1 mV 4.88 mV 42 mV
7 GHz 199 μV 202 μV 271 μV 440 μV 793 μV 1.85 mV 4.4 mV 37 mV
6 GHz 179 μV 180 μV 233 μV 388 μV 691 μV 1.67 mV 3.83 mV 33.4 mV
5 GHz 158 μV 160 μV 210 μV 338 μV 630 μV 1.49 mV 3.42 mV 29.7 mV
Table 2. 12.5 GS/s, HiRes Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
4 GHz 138 μV 139 μV 175 μV 271 μV 486 μV 1.15 mV 2.71 mV 23.1 mV
3 GHz 117 μV 119 μV 149 μV 226 μV 398 μV 960 μV 2.28 mV 19.2 mV
2.5 GHz 108 μV 110 μV 133 μV 203 μV 363 μV 856 μV 2.03 mV 17.1 mV
2 GHz 96.3 μV 97.6 μV 118 μV 186 μV 320 μV 745 μV 1.81 mV 14.9 mV
1 GHz 77.3 μV 72.4 μV 89.6 μV 128 μV 226 μV 534 μV 1.33 mV 10.8 mV
500 MHz 56 μV 56.2 μV 68 μV 91.9 μV 162 μV 396 μV 941 μV 7.92 mV
350 MHz 47.7 μV 47.3 μV 56.5 μV 77.3 μV 133 μV 307 μV 792 μV 6.14 mV
250 MHz 46.1 μV 46.7 μV 54 μV 74.7 μV 120 μV 280 μV 722 μV 5.6 mV
200 MHz 37.9 μV 38 μV 44.4 μV 65.8 μV 106 μV 247 μV 666 μV 4.94 mV
20 MHz 13 μV 13.3 μV 15.6 μV 22.6 μV 41.2 μV 105 μV 236 μV 2.11 mV
50 Ω, typical

Table 3. 25 GS/s, Sample Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
8 GHz 158 μV 158 μV 208 μV 342 μV 630 μV 1.49 mV 3.46 mV 29.7 mV
7 GHz 141 μV 143 μV 192 μV 311 μV 562 μV 1.31 mV 3.11 mV 26.2 mV
6 GHz 127 μV 127 μV 165 μV 274 μV 489 μV 1.18 mV 2.71 mV 23.6 mV
5 GHz 112 μV 113 μV 149 μV 239 μV 446 μV 1.05 mV 2.42 mV 21.1 mV
Table 4. 12.5 GS/s, HiRes Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
4 GHz 97.4 μV 98.7 μV 124 μV 192 μV 344 μV 817 μV 1.92 mV 16.3 mV
3 GHz 82.9 μV 84 μV 105 μV 160 μV 282 μV 680 μV 1.62 mV 13.6 mV
2.5 GHz 76.5 μV 77.5 μV 93.8 μV 144 μV 257 μV 606 μV 1.44 mV 12.1 mV
2 GHz 68.1 μV 69.1 μV 83.6 μV 131 μV 226 μV 528 μV 1.28 mV 10.6 mV
1 GHz 54.8 μV 51.2 μV 63.4 μV 90.9 μV 160 μV 378 μV 941 μV 7.65 mV
500 MHz 39.7 μV 39.8 μV 48.1 μV 65.1 μV 115 μV 280 μV 666 μV 5.6 mV
350 MHz 33.8 μV 33.5 μV 40 μV 54.8 μV 94.3 μV 217 μV 560 μV 4.35 mV
250 MHz 30.8 μV 31.2 μV 36.1 μV 49.9 μV 80.3 μV 187 μV 482 μV 3.75 mV
200 MHz 25.3 μV 25.4 μV 29.7 μV 44 μV 70.7 μV 165 μV 445 μV 3.3 mV
20 MHz 8.68 μV 8.9 μV 10.4 μV 15.1 μV 27.5 μV 70.4 μV 158 μV 1.41 mV
✓ High offset AC RMS Noise
50 Ω
Table 5. 25 GS/s, Sample Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
8 GHz 223 μV 224 μV 293 μV 482 μV 890 μV 2.1 mV 4.88 mV 42 mV
7 GHz 199 μV 202 μV 271 μV 440 μV 793 μV 1.85 mV 4.4 mV 37 mV
6 GHz 179 μV 180 μV 233 μV 388 μV 691 μV 1.67 mV 3.83 mV 33.4 mV
5 GHz 162 μV 164 μV 210 μV 338 μV 630 μV 1.49 mV 3.42 mV 29.7 mV
Table 6. 12.5 GS/s, HiRes Mode, RMS
V/div 1 mV/div 2 mV/div 5 mV/div 10 mV/div 20 mV/div 50 mV/div 100 mV/div 1 V/div
4 GHz 138 μV 139 μV 175 μV 271 μV 486 μV 1.15 mV 2.71 mV 23.1 mV
3 GHz 117 μV 119 μV 149 μV 226 μV 475 μV 975 μV 2.28 mV 21.4 mV
2 GHz 96.3 μV 97.6 μV 118 μV 212 μV 450 μV 920 μV 2.10 mV 21.0 mV
1 GHz 77.3 μV 72.4 μV 110 μV 190 μV 425 μV 900 μV 1.78 mV 19.2 mV
500 MHz 56 μV 56.2 μV 100 μV 182 μV 400 μV 840 μV 1.74 mV 16.8 mV
350 MHz 47.7 μV 47.3 μV 92.0 μV 165 μV 385 μV 770 μV 1.70 mV 16.1 mV
250 MHz 46.1 μV 46.7 μV 90.0 μV 145 μV 325 μV 675 μV 1.50 mV 15.8 mV
200 MHz 37.9 μV 38.0 μV 80.0 μV 120 μV 320 μV 660 μV 1.45 mV 15.2 mV
20 MHz 25.0 μV 25.0 μV 75.0 μV 115 μV 310 μV 560 μV 1.40 mV 13.0 mV
1 MΩ falls under the random noise specification at high offset levels.
Crosstalk (channel isolation), typical

≥80 dB up to 2 GHz

≥65 dB up to 5 GHz

≥55 dB up to 8 GHz

for any two channels set to 200 mV/div.

Overdrive recovery time, typical
500 ns pulse width:
50Ω400% Overdrive2000% Overdrive
Vertical scale 5%1%0.2%5%1%0.2%
2 mV / div< 50 ns50 ns300 ns---
10 mV / div< 50 ns50 ns300 ns50 ns50 ns400 ns
0.1 V / div< 50 ns50 ns300 ns---
100 us pulse width
50Ω400% Overdrive2000% Overdrive
Vertical scale 5%1%0.2%5%1%0.2%
2 mV / div< 50 ns50 ns1 µs---
10 mV / div< 50 ns50 ns1 µs< 50 ns50 ns150 µs
0.1 V / div< 50 ns50 ns1 µs---
SFDR analog channels, typical
SFDR, Single Tone
Bandwidth 50 mV/div 2 mV/div
8 GHz -45 dB -42 dB
4 GHz/High Res -51 dB -51 dB
2 GHz/High Res -56 dB -56 dB
Delay between analog channels, full bandwidth, typical

≤ 10 ps for any two channels with equal Volts/div or above 10 mV/div

Deskew range

-125 ns to +125 ns with a resolution of 40 ps (for Peak Detect and Envelope acquisition modes).

-125 ns to +125 ns with a resolution of 1 ps (for all other acquisition modes).

Timebase system

✓ Timebase accuracy

±1.0 x10-7 over any ≥1 ms time interval

Description Specification
Factory Tolerance

±12 ppb

At calibration, 25 °C ambient, over any ≥1 ms interval

Temperature stability

±20 ppb across the full operating range of 0 °C to 50 °C, after a sufficient soak time at the temperature

Tested at operating temperatures

Crystal aging

±300 PPB/Year and will not exceed ±2 PPM over 10 years without calibration.

Calibration will reduce this frequency error to under ±12 PPB

Frequency tolerance change at 25 °C over periods of 1 year and 10 years.

Sample rate range
ModelNumber of channels in useMaximum hardware capability
LPD6446.25 S/s to 25 GS/s on all channels (real time)
Interpolated waveform rate range
2.5 TS/sec, 1 TS/sec, 500 GS/sec, 250 GS/sec, 100 GS/sec, 50 GS/sec, and 25 GS/sec (Interpolated HIRes)
Record length range

All acquisition modes are 250 M maximum record length, down to 1 k minimum record length, adjustable in 1 sample increments.

Standard: 125 Mpoints

Option 6-RL-2: 250 Mpoints

Seconds/Division range
Model 1 K 10 K 100 K 1 M 10 M 62.5 M 125 M 250 M 500 M 1 G
Standard 62.5 M 40 ps - 16 s 400 ps - 160 s 4 ns - 1000 s 2.5 μs - 1000 s N/A N/A N/A N/A
Option 6-RL-1 125 M 40 ps - 16 s 400 ps - 160 s 4 ns - 1000 s 2.5 μs - 1000 s 5 μs - 1000 s N/A N/A N/A
Option 6-RL-2 250 M 40 ps - 16 s 400 ps - 160 s 4 ps - 1000 s 2.5 μs - 1000 s 5 μs - 1000 s 10 μs - 1000 s N/A N/A
Option 6-RL-3 500 Mpts 40 ps - 16 s 400 ps - 160 s 4 ps - 1000 s 2.5 us - 1000 s 5 us - 1000 s 10 us - 1000 s 20 us - 1000 s N/A
Option 6-RL-4: 1 Gpts 40 ps - 16 s 400 ps - 160 s 4 ps - 1000 s 2.5 us - 1000 s 5 us - 1000 s 10 us - 1000 s 20 us - 1000 s 40 us - 1000 s
Aperture uncertainty (sample jitter)
Time duration Typical jitter
<1 μs 80 fs
<1 ms 130 fs
Delta-time measurement accuracy, nominal

The formulas to calculate the peak-to-peak or rms nominal delta-time measurement accuracy (DTA) for a given instrument setting and input signal is as follows (assumes insignificant signal content above Nyquist frequency):



Where:

N = RSS of input-referred noise (VRMS) and dynamic noise estimate (VRMS)

SR 1 = Slew Rate (1st Edge) around 1st point in measurement

SR 2 = Slew Rate (2nd Edge) around 2nd point in measurement

Dynamic noise is noise that appears with a signal applied (such as distortion or interleave errors).

Dynamic noise estimate =

Tj = aperture uncertainty (sec rms - 80 fs for short durations)

t p = delta-time measurement duration (sec)

TBA = timebase accuracy or Reference Frequency Error (which is 20 ppb)

(Assumes insignificant error due to aliasing or over-drive.)

The term under the square root sign is the stability and is due to TIE (Time Interval Error). The errors due to this term occur throughout a single-shot measurement. The second term is due to both the absolute center-frequency accuracy and the center-frequency stability of the timebase and varies between multiple single-shot measurements over the observation interval (the amount of time from the first single-shot measurement to the final single-shot measurement).

Note:The formulas assume negligible errors due to measurement interpolation, and apply only when the interpolated sample rate is 25 GS/s or higher.

Trigger system

Trigger bandwidth (edge, pulse and logic), typical
Model Trigger type Trigger bandwidth

LPD64 8 GHz

Edge 8 GHz

LPD64 8 GHz

Pulse, Logic 4 GHz

LPD64 6 GHz

Edge 6 GHz

LPD64 6 GHz

Pulse, Logic 4 GHz

LPD64 4 GHz, 2.5 GHz, 1 GHz:

Edge, Pulse, Logic Product Bandwidth
Maximum triggered acquisition rate, typical

Analog channels: single channel [Analog or Digital 8-bit channel] on screen, measurements and math turned off. >40 wfm/sec

FastAcq Update Rate (analog only, peak detect or envelope mode): >460 K/second with one channel active and >100 K/second with all active.

FastAcq Update Rate (All other acquisition Modes, one analog channel): 18 k/second .

Fast Frame Rate (50-point frames): 664 K/second

AUX Trigger skew between instruments, typical
±100 ps jitter on each instrument with up to 1.5 ns skew; ≤1.5 ns total between instruments.
Edge-type trigger sensitivity, DC coupled, typical
Path Range Specification
50 Ω path, 1 mV/div to 9.98 mV/div 3.0 div from DC to instrument bandwidth
≥ 10 mV/div < 1.0 division from DC to instrument bandwidth
Line 90 V to 264 V line voltage at 50 - 60 Hz line frequency 103.5 V to 126.5 V
AUX Trigger in250 mVPP, DC to 400 MHz
Trigger jitter, typical

≤ 1.5 psRMS for sample mode and edge-type trigger

≤ 2 psRMS for edge-type trigger and FastAcq mode

≤ 40 psRMS for non edge-type trigger modes

≤ 40 psRMS for AUX trigger in, Sample acquisition mode, edge trigger

≤ 40 psRMS for AUX trigger in, FastAcq acquisition mode, edge trigger

Lowest frequency for successful operation of Set Level to 50% function, typical
45 Hz
Pulse-type runt trigger sensitivities, typical
2.0 division at vertical settings ≥5 mV/div.
Pulse-type trigger width and glitch sensitivities, typical
2.0 divisions at vertical settings ≥5 mV/div.
Logic-type, logic qualified trigger, or events-delay sensitivities, DC coupled, typical
2.0 divisions, at vertical settings ≥5 mV/div.
Logic-type triggering, minimum logic or rearm time, typical
Triggering type Pulse width Rearm time Time skew needed for 100% and no triggering
Logic 40 ps + trise40 ps + trise>360 ps / <150 ps
Time qualified logic 80 ps + trise80 ps + trise>360 ps / <150 ps

trise is rise time of the instrument.

For Logic, time between channels refers to the length of time a logic state derived from more than one channel must exist to be recognized. For Events, the time is the minimum time between a main and delayed event that will be recognized if more than one channel is used.
Minimum clock pulse widths for setup/hold time violation trigger, typical
Minimum pulse width, clock active Minimum pulse width, clock inactive
80 ps + trise80 ps + trise

trise is rise time of the instrument.

Setup + Hold must be less than the clock period.

Active pulse width is the width of the clock pulse from its active edge (as defined in the Clock Edge menu item) to its inactive edge.
Inactive pulse width is the width of the pulse from its inactive edge to its active edge.
Setup/hold violation trigger, setup and hold time ranges, typical
Feature Min Max
Setup Time 0 ns 20 s
Hold Time 0 ns 20 s
Setup + Hold Time 80 ps 22 s

Input coupling on clock and data channels must be the same.

For Setup Time, positive numbers mean a data transition before the clock.

For Hold Time, positive numbers mean a data transition after the clock edge.

Setup + Hold Time is the algebraic sum of the Setup Time and the Hold Time programmed by the user.

Pulse type trigger, minimum pulse, rearm time, transition time
Pulse class Minimum pulse width Minimum rearm time
Runt 40 ps + trise 40 ps + trise
Time-Qualified Runt 40 ps + trise 40 ps + trise
Width 40 ps + trise 40 ps + trise
Trigger class Minimum transition time Minimum rearm time
Rise/Fall Time 40 ps + trise 40 ps + trise

For trigger class width, pulse width refers to the width of the pulse being measured. Rearm time refers to the time between pulses.

For trigger class runt, pulse width refers to the width of the pulse being measured. Rearm time refers to the time between pulses.

trise is rise time of the instrument.

Time range for glitch, pulse width, timeout, time-qualified runt, or time-qualified window triggering
40 ps to 20 s.
Time accuracy for pulse width and timeout triggering
Time Range Accuracy
320 ps to 20 s ±(40 ps +Time Base Error * Setting).
B trigger after events, minimum pulse width and maximum event frequency, typical
Minimum pulse width: 40 ps + trise

Maximum event frequency: Instrument bandwidth.

trise is rise time of the instrument.

B trigger, minimum time between arm and trigger, typical

80 ps

For trigger after time, this is the time between the end of the time period and the B trigger event.

For trigger after events, this is the time between the last A trigger event and the first B trigger event.

B trigger after time, time range

40 ps to 20 seconds

Accuracy = ± ( 40ps + (Time-Base-Error * Setting))

B trigger after events, event range
1 to 65,471
Trigger level ranges
Source Range
Any Channel ±5 divs from center of screen
Aux In Trigger ±5 V
Line Fixed at about 50% of line voltage

This specification applies to logic and pulse thresholds.

Trigger level accuracy, DC coupled, typical

For signals having rise and fall times ≥10 ns:

Source Range
Any Input Channel ±0.20 div
Line N/A
Trigger holdoff range
0 ns to 10 seconds

Serial Trigger specifications

Maximum serial trigger bits
128 bits
Optional serial bus interface triggering
Please refer to the Serial Triggering and Analysis 3 Series MDO, 4/5/6 Series MSO Applications Datasheet (part number 61W-61101-x), located on tek.com, for information on available serial triggering options and their triggering capabilities.

Digital volt meter (DVM)

Measurement types

DC, ACRMS+DC, ACRMS , Trigger frequency count

Voltage resolution
4 digits
✓ Voltage accuracy
DC:

±((1.5% * |reading - offset - position|) + (0.5% * |(offset - position)|) + (0.1 * Volts/div))

De-rated at 0.100%/°C of |reading - offset - position| above 30 °C

Signal ± 5 divisions from screen center

AC:

± 3% (40 Hz to 1 kHz) with no harmonic content outside 40`Hz to 1`kHz

AC, typical: ± 2% (20 Hz to 10 kHz)

For AC measurements, the input channel vertical settings must allow the VPP input signal to cover between 4 and 10 divisions and must be fully visible on the screen

Trigger frequency counter

Resolution

8-digits

✓ Accuracy

±(1 count + time base accuracy * input frequency)

The signal must be at least 8 mVpp or 2 div, whichever is greater.

Trigger frequency counter source
Any analog input channel.
✓ Maximum input frequency

10 Hz to maximum bandwidth of the analog channel

The signal must be at least 8 mVpp or 2 div, whichever is greater.

Arbitrary function generator

Function types
Arbitrary, sine, square, pulse, ramp, triangle, DC level, Gaussian, Lorentz, exponential rise/fall, sin(x)/x, random noise, Haversine, Cardiac
Amplitude range
Values are peak-to-peak voltages
Waveform 50 Ω 1 MΩ
Arbitrary 10 mV to 2.5 V 20 mV to 5 V
Sine 10 mV to 2.5 V 20 mV to 5 V
Square 10 mV to 2.5 V 20 mV to 5 V
Pulse 10 mV to 2.5 V 20 mV to 5 V
Ramp 10 mV to 2.5 V 20 mV to 5 V
Triangle 10 mV to 2.5 V 20 mV to 5 V
Gaussian 10 mV to 1.25 V 20 mV to 2.5 V
Lorentz 10 mV to 1.2 V 20 mV to 2.4 V
Exponential Rise 10 mV to 1.25 V 20 mV to 2.5 V
Exponential Fall 10 mV to 1.25 V 20 mV to 2.5 V
Sine(x)/x 10 mV to 1.5 V 20 mV to 3.0 V
Random Noise 10 mV to 2.5 V 20 mV to 5 V
Haversine 10 mV to 1.25 V 20 mV to 2.5 V
Cardiac 10 mV to 2.5 V 20 mV to 5 V
Arbitrary function record length
128 K Samples
Maximum sample rate
250 MS/s
Sine waveform
Frequency range
0.1 Hz to 50 MHz
Frequency setting resolution
0.1 Hz
Frequency accuracy

130 ppm (frequency ≤ 10 kHz), 50 ppm (frequency > 10 kHz)

This is for Sine, Ramp, Square and Pulse waveforms only.

Amplitude range
20 mVpp to 5 Vpp into Hi-Z; 10 mVpp to 2.5 Vpp into 50 Ω
Amplitude flatness, typical

±0.5 dB at 1 kHz

±1.5 dB at 1 kHz for < 20 mVpp amplitudes

Total harmonic distortion, typical

1% for amplitude ≥ 200 mVpp into 50 Ω load

2.5% for amplitude > 50 mV AND < 200 mVpp into 50 Ω load

This is for Sine wave only.

Spurious free dynamic range, typical

40 dB (Vpp ≥ 0.1 V); 30 dB (Vpp ≥ 0.02 V), 50 Ω load

Square and pulse waveform
Frequency range
0.1 Hz to 25 MHz
Frequency setting resolution
0.1 Hz
Duty cycle range

10% - 90% or 10 ns minimum pulse, whichever is larger

Minimum pulse time applies to both on and off time, so maximum duty cycle will reduce at higher frequencies to maintain 10 ns off time

Duty cycle resolution
0.1%
Minimum pulse width, typical
10 ns. This is the minimum time for either on or off duration.
Rise/Fall time, typical
5 ns, 10% - 90%
Pulse width resolution
100 ps
Overshoot, typical
< 6% for signal steps greater than 100 mVpp

This applies to overshoot of the positive-going transition (+overshoot) and of the negative-going (-overshoot) transition

Asymmetry, typical
±1% ±5 ns, at 50% duty cycle
Jitter, typical

< 60 ps TIERMS, ≥ 100 mVpp amplitude, 40%-60% duty cycle

Square and pulse waveforms, 5 GHz measurement BW.

Ramp and triangle waveform
Frequency range
0.1 Hz to 500 kHz
Frequency setting resolution
0.1 Hz
Variable symmetry
0% - 100%
Symmetry resolution
0.1%
DC level range

±2.5 V into Hi-Z

±1.25 V into 50 Ω

Gaussian pulse, Haversine, and Lorentz pulse
Maximum frequency
5 MHz
Exponential rise fall maximum frequency
5 MHz
Sin(x)/x
Maximum frequency
2 MHz
Random noise amplitude range

20 mVpp to 5 Vpp into Hi-Z

10 mVpp to 2.5 Vpp into 50 Ω

For both isolated noise signal and additive noise signal.

✓ Sine and ramp frequency accuracy

130 ppm (frequency ≤10 kHz)

50 ppm (frequency >10 kHz)

✓ Square and pulse frequency accuracy

130 ppm (frequency ≤10 KHz);

50 ppm (frequency >10 KHz)

Signal amplitude resolution

1 mV (Hi-Z)

500 μV (50 Ω)

✓ Signal amplitude accuracy
±[ (1.5% of peak-to-peak amplitude setting) + (1.5% of absolute DC offset setting) + 1 mV ] (frequency = 1 kHz)
DC offset range

±2.5 V into Hi-Z

±1.25 V into 50 Ω

DC offset resolution

1 mV (Hi-Z)

500 μV (50 Ω)

✓ DC offset accuracy

±[ (1.5% of absolute offset voltage setting) + 1 mV ]

Add 3 mV of uncertainty per 10 °C change from 25 °C ambient

Cardiac maximum frequency
500 kHz

Processor system

Host processor
Intel i5-4400E, 2.7 GHz, 64-bit, dual core processor, 8 GB system RAM

Input/Output port specifications

Ethernet interface
An 8-pin RJ-45 connector that supports 10/100/1000 Mb/s
Video signal output

A 29-pin HDMI connector

Recommended resolution: 1920 x 1080 @ 60 Hz. Note that video out may not be hot pluggable. HDMI cable may need to be attached before power up for dual display functions to work depending upon the instrument firmware revision

DVI connector

A 29-pin DVI-I connector; connect to show the oscilloscope display on an external monitor or projector

Maximum supported resolution, Windows: 1920 x 1200 at 60 Hz

Maximum supported resolution, Linux: 1920 x 1080 at 60 Hz

Only a single TMDS link is provided

Analog VGA signaling is not provided

VGA connector

A 15-pin, 3-row, D-sub VGA connector

Recommended resolution: 1920 x 1080 at 60 Hz

DisplayPort connector
A 20-pin DisplayPort connector; connect to show the oscilloscope display on an external monitor or projector

Maximum supported resolution, Windows: 2560 x 1440 @ 60Hz

Maximum supported resolution, Linux: 1920 x 1080 @ 60 Hz

DP++ adapter: Maximum supported resolution: 2560 x1440 @ 60 Hz

Simultaneous displays
Up to 3 displays with a maximum of 1 display per port.
USB interface (Host, Device ports)

Front panel USB Host ports: Two USB 2.0 Hi-Speed ports, one USB 3.0 SuperSpeed port

All instruments, Rear panel USB Host ports: Two USB 2.0 Hi-Speed ports, two USB 3.0 SuperSpeed ports

All instruments, Rear panel USB Device port: One USB 3.0 SuperSpeed Device port providing USBTMC support

Auxiliary output, AUX OUT, Trigger Out, Event, or Reference Clock Out
Selectable output

Acquisition Trigger Out

Reference Clock Out

AFG Trigger Out

Acquisition Trigger Out
User selectable transition from HIGH to LOW, or LOW to HIGH, indicates the trigger occurred. The signal returns to its previous state after approximately 100 ns
Acquisition trigger jitter

< 50ps standard deviation

Reference Clock Out
Reference clock output tracks the acquisition system and can be referenced from either the internal clock reference or the external clock reference
AFG Trigger Out

The output frequency is dependent on the frequency of the AFG signal as shown in the following table:

AFG signal frequency AFT trigger frequency
≤ 4.9 MHz Signal frequency
> 4.9 MHz to 14.7 MHz Signal frequency / 3
> 14.7 MHz to 24.5 MHz Signal frequency / 5
> 24.5 MHz to 34.3 MHz Signal frequency / 7
> 34.3 MHz to 44.1 MHz Signal frequency / 9
> 44.1 MHz to 50 MHz Signal frequency / 11

AUX OUT Output Voltage
Characteristic Limits
Vout (HI) ≥ 2.5 V open circuit; ≥ 1.0 V into a 50 Ω load to ground
Vout (LO) ≤ 0.7 V into a load of ≤ 4 mA; ≤0.25 V into a 50 Ω load to ground
External reference input
Nominal input frequency

10 MHz

Frequency Variation Tolerance
9.99999 MHz to 10.00001 MHz (±1.0 x 10-6)
Sensitivity, typical

Vin 1.5 Vp-p using a 50 Ω termination

Maximum input signal
7 Vpp
Impedance
745 Ohms ±20% in parallel with 18.5 pf ±20%
AUX trigger input
Interface:
SMA
Input Impedance:
50 Ω
Maximum Input Voltage:
5 VRMS
Sensitivity:
Edge-type trigger sensitivity, DC-coupled

Data storage specifications

Nonvolatile memory retention time, typical
No time limit for front panel settings, saved waveforms, setups, product licensing, and calibration constants.
Real-time clock
A programmable clock providing time in years, months, days, hours, minutes, and seconds.
Nonvolatile memory capacity
Instrument S/N

A 2 kbit EEPROM on the main board that stores the instrument serial number, instrument start up count, total uptime and administration passwords.

Companion CvP
A pair of 16 Mbit flash memory devices that stores a portion of the Companion FPGA image data. One device serves as a backup for the other device.
AFG S/N
A 2 kbit EEPROM on the AFG riser card that stores a copy of the instrument serial number which is used to validate the AFG calibration.
Front Panel ID
A 4GB EMMC flash memory that stores calibration data and licensing information.
BIOS
A 128 Mbit flash memory device that stores the firmware image and device configuration for the host processor and chipset sub-processors. This includes the Basic Input Output System (BIOS), Management Engine (ME), Embedded Controller (EC) and Network Interface Controller (NIC). The Ethernet MAC address is stored in this device.
CMOS Memory
The host processor chipset includes an integrated memory device, powered by the real-time clock (RTC) battery, which stores BIOS configuration settings. A customer accessible switch disconnects the RTC battery from the chipset which clears the contents of the integrated CMOS memory device.
Memory SPD
Each SODIMM (memory module) contains a serial presence detect (SPD) memory device implemented using an unspecified memory technology. Each SPD device contains the parameter data specific to its memory module. All SPD devices are treated by the instrument as read only. The size of a given SPD is unspecified. The 4 channel instrument includes 4 SPD devices.
UCD9248
The instrument includes 3 UCD9248 power supply controllers. Each controller contains an unspecified quantity of nonvolatile memory that stores various power supply configuration settings.
PMU
A power management unit (PMU) microcontroller is used to manage instrument power supplies and hardware initialization. The PMU includes 32 KB of nonvolatile memory for storage of its own binary executable and redundant storage of UCD9248 device settings.
Analog Board Controller

A microcontroller is used to manage analog board operation. The PMU includes 64 KB of nonvolatile memory for storage of its own binary executable.

Carrier FPGA

The carrier FPGA stores its own configuration in its own internal 0.33 Mbit nonvolatile memory. The carrier FPGA implements simple "glue logic" for the instrument.

Mass storage device capacity
Linux/Windows (optional):
≥80 GB. Form factor is an 80 mm m.2 card with a SATA-3 interface. Waveforms and setups are stored on a hard disk drive or solid state drive. Provides storage for saved customer data and the Linux operating system. This drive is customer installable. A ~42 GB partition on the device is available for the storage of saved customer data.

Power supply system

Power
Power consumption

400 Watts maximum

Source voltage
100 - 240 V ±10% (50 Hz to 60 Hz)
Source frequency

50 Hz to 60 Hz ±10%, at 100 - 240 V ±10%

400 Hz at 115 V ±10%

Fuse Rating
12.5 A, 250 Vac

Safety characteristics

Safety certification

US NRTL Listed - UL61010-1.

Canadian Certification - CAN/CSA-C22.2 No. 61010.1.

EU Compliance - Low Voltage Directive 2014-35-EU and EN61010-1.

International Compliance - IEC 61010-1.

Pollution degree
Pollution degree 2, indoor, dry location use only

Environmental specifications

Temperature
Operating
+0 °C to +50 °C (32 °F to 122 °F)
Non-operating
-20 °C to +60 °C (-4 °F to 140 °F)
Humidity
Operating

5% to 90% relative humidity (% RH) at up to +40 °C

5% to RH above +40 °C up to +50 °C, noncondensing

Non-operating

5% to 90% relative humidity (% RH) at up to +60 °C, noncondensing

Altitude
Operating
Up to 3,000 meters (9,843 feet)
Non-operating
Up to 12,000 meters (39,370 feet)

Mechanical specifications

Weight
LPD64 29.4 lbs (13.34 kg)
Dimensions

Height: 87.8 mm (3.5 in) from bottom to top cover. With bench conversion kit feet 107.8 mm (4.25 in)

Width: 432.1 mm (17.0 in) from cover edge to cover edge

Depth: 613.4 mm (23.9 in) from back of cover to front bezel. 624.7 mm (24.6 in) from rear IO BNCs to front SMA connectors.

Cooling
The clearance requirement for adequate cooling is 2.0 in (50.8 mm) to the left (intake) and right (exhaust) side (when looking at the front of the instrument) of the instrument.

Performance verification procedures

This chapter contains performance verification procedures for the specifications marked with the ✔ symbol. The following equipment, or a suitable equivalent, is required to complete these procedures.

The performance verification procedures verify the performance of your instrument. They do not adjust your instrument. If your instrument fails any of the performance verification tests, repeat the failing test, verifying that the test equipment and settings are correct. If the instrument continues to fail a test, contact Tektronix Customer Support for assistance.

These procedures cover all LPD64 instruments. Completion of the performance verification procedure does not update the instrument time and date.

Print the test records on the following pages and use them to record the performance test results for your oscilloscope. Disregard checks and test records that do not apply to the specific model you are testing.

The following table lists the required equipment. You might need additional cables and adapters, depending on the actual test equipment you use.

Required equipment Minimum requirements Example
DC voltage source 3 mV to 4 V, ±0.1% accuracy Fluke 9500B Oscilloscope Calibrator with a 9530 Output Module
Leveled sine wave generator 50 kHz to 8 GHz, ±4% amplitude accuracy
Time mark generator 80 ms period, ±1.0 x 10-6 accuracy, rise time <50 ns
Digital multimeter (DMM) 0.1% accuracy or better Tektronix DMM4020
One 50 Ω terminator Impedance 50 Ω; connectors: female SMA input, male SMA output
One 50 Ω SMA cable Male-to-male connectors
Optical mouse USB, PS2 Tektronix part number 119-7054-00

RF vector signal generator

Maximum bandwidth of instrument

Tektronix TSG4100A
Frequency counter parts per billion accuracy Tektronix FCA3000 Timer/Counter/Analyzer

Test records

Instrument information, self test record

ModelSerial # Procedure performed byDate

TestPassedFailed
Self Test

Input Impedance
Performance checksVertical scale Low limitTest resultHigh limit
All models
Channel 1 Input Impedance, 50 Ω10 mV/div48.5 Ω51.5 Ω
100 mV/div48.5 Ω51.5 Ω
Channel 2 Input Impedance, 50 Ω10 mV/div48.5 Ω51.5 Ω
100 mV/div48.5 Ω51.5 Ω
Channel 3 Input Impedance, 50 Ω10 mV/div48.5 Ω51.5 Ω
100 mV/div48.5 Ω51.5 Ω
Channel 4 Input Impedance, 50 Ω10 mV/div48.5 Ω51.5 Ω
100 mV/div48.5 Ω51.5 Ω

DC Balance test record

DC Balance
Performance checks Vertical scale Low limit Test result High limit
Channel 1 DC Balance, 50 Ω,20 MHz BW1 mV/div-0.2 mV 0.2 mV
2 mV/div-0.2 mV 0.2 mV
5 mV/div-0.5 mV 0.5 mV
10 mV/div-1 mV 1 mV
20 mV/div-2 mV 2 mV
49.8 mV/div-4.98 mV 4.98 mV
50 mV/div-5 mV 5 mV
100 mV/div-10 mV 10 mV
200 mV/div-20 mV 20 mV
500 mV/div-50 mV 50 mV
1 V/div-100 mV 100 mV
Channel 1 DC Balance, 50 Ω,250 MHz BW20 mV/div-2 mV 2 mV
Channel 1 DC Balance, 50 Ω, Full BW20 mV/div-2 mV 2 mV
Channel 2 DC Balance, 50 Ω,20 MHz BW1 mV/div-0.2 mV 0.2 mV
2 mV/div-0.2 mV 0.2 mV
5 mV/div-0.5 mV 0.5 mV
10 mV/div-1 mV 1 mV
20 mV/div-2 mV 2 mV
49.8 mV/div-4.98 mV 4.98 mV
50 mV/div-5 mV 5 mV
100 mV/div-10 mV 10 mV
200 mV/div-20 mV 20 mV
500 mV/div-50 mV 50 mV
1 V/div-100 mV 100 mV
Channel 2 DC Balance, 50 Ω,250 MHz BW20 mV/div-2 mV 2 mV
Channel 2 DC Balance, 50 Ω, Full BW20 mV/div-2 mV 2 mV
Channel 3 DC Balance, 50 Ω,20 MHz BW1 mV/div-0.2 mV 0.2 mV
2 mV/div-0.2 mV 0.2 mV
5 mV/div-0.5 mV 0.5 mV
10 mV/div-1 mV 1 mV
20 mV/div-2 mV 2 mV
49.8 mV/div-4.98 mV 4.98 mV
50 mV/div-5 mV 5 mV
100 mV/div-10 mV 10 mV
200 mV/div-20 mV 20 mV
500 mV/div-50 mV 50 mV
1 V/div-100 mV 100 mV
Channel 3 DC Balance, 50 Ω,250 MHz BW20 mV/div-2 mV 2 mV
Channel 3 DC Balance, 50 Ω, Full BW20 mV/div-2 mV 2 mV
Channel 4 DC Balance, 50 Ω,20 MHz BW1 mV/div-0.2 mV 0.2 mV
2 mV/div-0.2 mV 0.2 mV
5 mV/div-0.5 mV 0.5 mV
10 mV/div-1 mV 1 mV
20 mV/div-2 mV 2 mV
49.8 mV/div-4.98 mV 4.98 mV
50 mV/div-5 mV 5 mV
100 mV/div-10 mV 10 mV
200 mV/div-20 mV 20 mV
500 mV/div-50 mV 50 mV
1 V/div-100 mV 100 mV
Channel 4 DC Balance, 50 Ω,250 MHz BW20 mV/div-2 mV 2 mV
Channel 4 DC Balance, 50 Ω, Full BW20 mV/div-2 mV 2 mV

DC Offset Accuracy test record

Offset Accuracy
Performance checks Vertical scale Vertical offset Low limit Test result High limit
Channel 1 DC Offset Accuracy, 20 MHzBW, 50 Ω1 mV/div900 mV895.3 mV 904.7 mV
1 mV/div-900 mV-904.7 mV -895.3 mV
100 mV/div5.0 V4.965 V 5.035 V
100 mV/div-5.0 V-5.035 V -4.965 V
Channel 2 DC Offset Accuracy, 20 MHzBW, 50 Ω1 mV/div900 mV895.3 mV 904.7 mV
1 mV/div-900 mV-904.7 mV -895.3 mV
100 mV/div5.0 V4.965 V 5.035 V
100 mV/div-5.0 V-5.035 V -4.965 V
Channel 3 DC Offset Accuracy, 20 MHz BW, 50 Ω1 mV/div900 mV895.3 mV 904.7 mV
1 mV/div-900 mV-904.7 mV -895.3 mV
100 mV/div5.0 V4.965 V 5.035 V
100 mV/div-5.0 V-5.035 V -4.965 V
Channel 4 DC Offset Accuracy, 20 MHz BW, 50 Ω1 mV/div900 mV895.3 mV 904.7 mV
1 mV/div-900 mV-904.7 mV -895.3 mV
100 mV/div5.0 V4.965 V 5.035 V
100 mV/div-5.0 V-5.035 V -4.965 V
1 Use this value for both the calibrator output and the oscilloscope offset setting.

DC Gain Accuracy test record

DC Gain Accuracy
Performance checks BandwidthVertical scale Low limitTest result High limit
Channel 1 DC Gain Accuracy, 0 V offset, 0 V vertical position, 50 Ω 20 MHz 1 mV/div -4% 4%
2 mV/div -2% 2%
5 mV/div -2% 2%
10 mV/div -2% 2%
20 mV/div -2% 2%
50 mV/div -2% 2%
100 mV/div -2% 2%
200 mV/div -2% 2%
500 mV/div -2% 2%
1 V/div -2% 2%
250 MHz 20 mV/div -2% 2%
FULL 20 mV/div -2% 2%
Channel 2 DC Gain Accuracy, 0 V offset, 0 V vertical position, 50 Ω 20 MHz 1 mV/div -4% 4%
2 mV/div -2% 2%
5 mV/div -2% 2%
10 mV/div -2% 2%
20 mV/div -2% 2%
50 mV/div -2% 2%
100 mV/div -2% 2%
200 mV/div -2% 2%
500 mV/div -2% 2%
1 V/div -2% 2%
250 MHz 20 mV/div -2% 2%
FULL 20 mV/div -2% 2%
Channel 3 DC Gain Accuracy, 0 V offset, 0 V vertical position, 50 Ω 20 MHz 1 mV/div -4% 4%
2 mV/div -2% 2%
5 mV/div -2% 2%
10 mV/div -2% 2%
20 mV/div -2% 2%
50 mV/div -2% 2%
100 mV/div -2% 2%
200 mV/div -2% 2%
500 mV/div -2% 2%
1 V/div -2% 2%
250 MHz 20 mV/div -2% 2%
FULL 20 mV/div -2% 2%
Channel 4 DC Gain Accuracy, 0 V offset, 0 V vertical position, 50 Ω 20 MHz 1 mV/div -4% 4%
2 mV/div -2% 2%
5 mV/div -2% 2%
10 mV/div -2% 2%
20 mV/div -2% 2%
50 mV/div -2% 2%
100 mV/div -2% 2%
200 mV/div -2% 2%
500 mV/div -2% 2%
1 V/div -2% 2%
250 MHz 20 mV/div -2% 2%
FULL 20 mV/div -2% 2%

Analog Bandwidth test record

Analog Bandwidth
Performance checks
Bandwidth at Channel ImpedanceVertical scale Horizontal scale Vin-ppVbw-ppLimitTest result Gain = Vbw-pp/Vin-pp
Channel 1 50 Ω 1 mV/div 1 ns/div ≥ 0.707
2 mV/div 1 ns/div ≥ 0.707
4 mV/div 1 ns/div ≥ 0.707
10 mV/div 1 ns/div ≥ 0.707
25 mV/div 1 ns/div ≥ 0.707
50 mV/div 1 ns/div ≥ 0.707
100 mV/div 1 ns/div ≥ 0.707
Channel 2 50 Ω 1 mV/div 1 ns/div ≥ 0.707
2 mV/div 1 ns/div ≥ 0.707
4 mV/div 1 ns/div ≥ 0.707
10 mV/div 1 ns/div ≥ 0.707
25 mV/div 1 ns/div ≥ 0.707
50 mV/div 1 ns/div ≥ 0.707
100 mV/div 1 ns/div ≥ 0.707
Channel 3 50 Ω 1 mV/div 1 ns/div ≥ 0.707
2 mV/div 1 ns/div ≥ 0.707
4 mV/div 1 ns/div ≥ 0.707
10 mV/div 1 ns/div ≥ 0.707
25 mV/div 1 ns/div ≥ 0.707
50 mV/div 1 ns/div ≥ 0.707
100 mV/div 1 ns/div ≥ 0.707
Channel 4 50 Ω 1 mV/div 1 ns/div ≥ 0.707
2 mV/div 1 ns/div ≥ 0.707
4 mV/div 1 ns/div ≥ 0.707
10 mV/div 1 ns/div ≥ 0.707
25 mV/div 1 ns/div ≥ 0.707
50 mV/div 1 ns/div ≥ 0.707
100 mV/div 1 ns/div ≥ 0.707

Random Noise, sample acquisition mode test record

Random Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div BandwidthTest result (mV) High limit (mV)
Channel 1 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.158
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.160
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
Random Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1Test result (mV) High limit (mV)
Channel 2 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.158
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.160
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
Random Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1Test result (mV) High limit (mV)
Channel 3 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.158
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.160
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
Random Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1Test result (mV) High limit (mV)
Channel 4 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.158
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.160
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
1 Start with the highest bandwidth setting you can select.

Random Noise, High Res mode test record

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 11 mV/div4 GHz 0.138
3 GHz limit 0.117
2.5 GHz limit 0.108
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.013
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2.5 GHz limit 0.110
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.0133
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2.5 GHz limit 0.133
2 GHz limit 0.118
1 GHz limit 0.0896
500 MHz limit 0.068
350 MHz limit 0.0565
250 M GHz limit 0.054
200 MHz limit 0.0444
20 MHz limit 0.0156

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1 Test result (mV)High limit (mV)
Channel 1 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2.5 GHz limit 0.203
2 GHz limit 0.186
1 GHz limit 0.128
500 MHz limit 0.0919
350 MHz limit 0.0773
250 M GHz limit 0.0747
200 MHz limit 0.0658
20 MHz limit 0.0226
20 mV/div 4 GHz 0.486
3 GHz limit 0.398
2.5 GHz limit 0.363
2 GHz limit 0.320
1 GHz limit 0.226
500 MHz limit 0.162
350 MHz limit 0.133
250 M GHz limit 0.120
200 MHz limit 0.106
20 MHz limit 0.0412
50 mV/div 4 GHz 1.15
3 GHz limit 0.960
2.5 GHz limit 0.856
2 GHz limit 0.745
1 GHz limit 0.534
500 MHz limit 0.396
350 MHz limit 0.307
250 M GHz limit 0.280
200 MHz limit 0.247
20 MHz limit 0.105

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 1100 mV/div4 GHz 2.71
3 GHz limit 2.28
2.5 GHz limit 2.03
2 GHz limit 1.81
1 GHz limit 1.33
500 MHz limit 0.941
350 MHz limit 0.792
250 M GHz limit 0.722
200 MHz limit 0.666
20 MHz limit 0.236
1 V/div4 GHz 23.1
3 GHz limit 19.2
2.5 GHz limit 17.1
2 GHz limit 14.9
1 GHz limit 10.8
500 MHz limit 7.92
350 MHz limit 6.14
250 M GHz limit 5.6
200 MHz limit 4.94
20 MHz limit 2.11

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 21 mV/div4 GHz 0.138
3 GHz limit 0.117
2.5 GHz limit 0.108
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.013
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2.5 GHz limit 0.110
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.0133
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2.5 GHz limit 0.133
2 GHz limit 0.118
1 GHz limit 0.0896
500 MHz limit 0.068
350 MHz limit 0.0565
250 M GHz limit 0.054
200 MHz limit 0.0444
20 MHz limit 0.0156

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1 Test result (mV)High limit (mV)
Channel 2 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2.5 GHz limit 0.203
2 GHz limit 0.186
1 GHz limit 0.128
500 MHz limit 0.0919
350 MHz limit 0.0773
250 M GHz limit 0.0747
200 MHz limit 0.0658
20 MHz limit 0.0226
20 mV/div 4 GHz 0.486
3 GHz limit 0.398
2.5 GHz limit 0.363
2 GHz limit 0.320
1 GHz limit 0.226
500 MHz limit 0.162
350 MHz limit 0.133
250 M GHz limit 0.120
200 MHz limit 0.106
20 MHz limit 0.0412
50 mV/div 4 GHz 1.15
3 GHz limit 0.960
2.5 GHz limit 0.856
2 GHz limit 0.745
1 GHz limit 0.534
500 MHz limit 0.396
350 MHz limit 0.307
250 M GHz limit 0.280
200 MHz limit 0.247
20 MHz limit 0.105

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 2100 mV/div4 GHz 2.71
3 GHz limit 2.28
2.5 GHz limit 2.03
2 GHz limit 1.81
1 GHz limit 1.33
500 MHz limit 0.941
350 MHz limit 0.792
250 M GHz limit 0.722
200 MHz limit 0.666
20 MHz limit 0.236
1 V/div4 GHz 23.1
3 GHz limit 19.2
2.5 GHz limit 17.1
2 GHz limit 14.9
1 GHz limit 10.8
500 MHz limit 7.92
350 MHz limit 6.14
250 M GHz limit 5.6
200 MHz limit 4.94
20 MHz limit 2.11

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 31 mV/div4 GHz 0.138
3 GHz limit 0.117
2.5 GHz limit 0.108
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.013
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2.5 GHz limit 0.110
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.0133
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2.5 GHz limit 0.133
2 GHz limit 0.118
1 GHz limit 0.0896
500 MHz limit 0.068
350 MHz limit 0.0565
250 M GHz limit 0.054
200 MHz limit 0.0444
20 MHz limit 0.0156
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1 Test result (mV)High limit (mV)
Channel 3 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2.5 GHz limit 0.203
2 GHz limit 0.186
1 GHz limit 0.128
500 MHz limit 0.0919
350 MHz limit 0.0773
250 M GHz limit 0.0747
200 MHz limit 0.0658
20 MHz limit 0.0226
20 mV/div 4 GHz 0.486
3 GHz limit 0.398
2.5 GHz limit 0.363
2 GHz limit 0.320
1 GHz limit 0.226
500 MHz limit 0.162
350 MHz limit 0.133
250 M GHz limit 0.120
200 MHz limit 0.106
20 MHz limit 0.0412
50 mV/div 4 GHz 1.15
3 GHz limit 0.960
2.5 GHz limit 0.856
2 GHz limit 0.745
1 GHz limit 0.534
500 MHz limit 0.396
350 MHz limit 0.307
250 M GHz limit 0.280
200 MHz limit 0.247
20 MHz limit 0.105
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 3100 mV/div4 GHz 2.71
3 GHz limit 2.28
2.5 GHz limit 2.03
2 GHz limit 1.81
1 GHz limit 1.33
500 MHz limit 0.941
350 MHz limit 0.792
250 M GHz limit 0.722
200 MHz limit 0.666
20 MHz limit 0.236
1 V/div4 GHz 23.1
3 GHz limit 19.2
2.5 GHz limit 17.1
2 GHz limit 14.9
1 GHz limit 10.8
500 MHz limit 7.92
350 MHz limit 6.14
250 M GHz limit 5.6
200 MHz limit 4.94
20 MHz limit 2.11
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 41 mV/div4 GHz 0.138
3 GHz limit 0.117
2.5 GHz limit 0.108
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.013
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2.5 GHz limit 0.110
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.0133
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2.5 GHz limit 0.133
2 GHz limit 0.118
1 GHz limit 0.0896
500 MHz limit 0.068
350 MHz limit 0.0565
250 M GHz limit 0.054
200 MHz limit 0.0444
20 MHz limit 0.0156
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth1 Test result (mV)High limit (mV)
Channel 4 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2.5 GHz limit 0.203
2 GHz limit 0.186
1 GHz limit 0.128
500 MHz limit 0.0919
350 MHz limit 0.0773
250 M GHz limit 0.0747
200 MHz limit 0.0658
20 MHz limit 0.0226
20 mV/div 4 GHz 0.486
3 GHz limit 0.398
2.5 GHz limit 0.363
2 GHz limit 0.320
1 GHz limit 0.226
500 MHz limit 0.162
350 MHz limit 0.133
250 M GHz limit 0.120
200 MHz limit 0.106
20 MHz limit 0.0412
50 mV/div 4 GHz 1.15
3 GHz limit 0.960
2.5 GHz limit 0.856
2 GHz limit 0.745
1 GHz limit 0.534
500 MHz limit 0.396
350 MHz limit 0.307
250 M GHz limit 0.280
200 MHz limit 0.247
20 MHz limit 0.105
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth 1 Test result (mV)High limit (mV)
Channel 4100 mV/div4 GHz 2.71
3 GHz limit 2.28
2.5 GHz limit 2.03
2 GHz limit 1.81
1 GHz limit 1.33
500 MHz limit 0.941
350 MHz limit 0.792
250 M GHz limit 0.722
200 MHz limit 0.666
20 MHz limit 0.236
1 V/div4 GHz 23.1
3 GHz limit 19.2
2.5 GHz limit 17.1
2 GHz limit 14.9
1 GHz limit 10.8
500 MHz limit 7.92
350 MHz limit 6.14
250 M GHz limit 5.6
200 MHz limit 4.94
20 MHz limit 2.11
1 Full = the highest bandwidth setting you can select.

High Offset AC RMS Noise, sample acquisition mode test record

Start with the highest bandwidth setting you can select.

High Offset AC RMS Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div BandwidthTest result (mV) High limit (mV)
Channel 1 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.162
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.164
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
High Offset AC RMS Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div BandwidthTest result (mV) High limit (mV)
Channel 2 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.162
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.164
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
High Offset AC RMS Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div BandwidthTest result (mV) High limit (mV)
Channel 3 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.162
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.164
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7
High Offset AC RMS Noise, sample acquisition mode: All models
Performance checks 50 Ω
ChannelV/div BandwidthTest result (mV) High limit (mV)
Channel 4 1 mV/div 8 GHz 0.223
7 GHz limit 0.199
6 GHz limit 0.179
5 GHz limit 0.162
2 mV/div 8 GHz 0.224
7 GHz limit 0.202
6 GHz limit 0.180
5 GHz limit 0.164
5 mV/div 8 GHz 0.293
7 GHz limit 0.271
6 GHz limit 0.233
5 GHz limit 0.210
10 mV/div 8 GHz 0.482
7 GHz limit 0.440
6 GHz limit 0.388
5 GHz limit 0.338
20 mV/div 8 GHz 0.890
7 GHz limit 0.793
6 GHz limit 0.691
5 GHz limit 0.630
50 mV/div 8 GHz 2.10
7 GHz limit 1.85
6 GHz limit 1.67
5 GHz limit 1.49
100 mV/div 8 GHz 4.88
7 GHz limit 4.4
6 GHz limit 3.83
5 GHz limit 3.42
1 V/div 8 GHz 42.0
7 GHz limit 37.0
6 GHz limit 33.4
5 GHz limit 29.7

High Offset AC RMS Noise, High Res mode test record

Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 11 mV/div4 GHz 0.138
3 GHz limit 0.117
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.025
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.025
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2 GHz limit 0.118
1 GHz limit 0.110
500 MHz limit 0.100
350 MHz limit 0.092
250 M GHz limit 0.090
200 MHz limit 0.080
20 MHz limit 0.075
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 1 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2 GHz limit 0.212
1 GHz limit 0.190
500 MHz limit 0.182
350 MHz limit 0.165
250 M GHz limit 0.145
200 MHz limit 0.120
20 MHz limit 0.115
20 mV/div 4 GHz 0.486
3 GHz limit 0.475
2 GHz limit 0.450
1 GHz limit 0.425
500 MHz limit 0.400
350 MHz limit 0.385
250 M GHz limit 0.325
200 MHz limit 0.320
20 MHz limit 0.310
50 mV/div 4 GHz 1.15
3 GHz limit 0.975
2 GHz limit 0.920
1 GHz limit 0.900
500 MHz limit 0.840
350 MHz limit 0.770
250 M GHz limit 0.675
200 MHz limit 0.660
20 MHz limit 0.560
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 1100 mV/div4 GHz 2.71
3 GHz limit 2.28
2 GHz limit 2.10
1 GHz limit 1.78
500 MHz limit 1.74
350 MHz limit 1.70
250 M GHz limit 1.50
200 MHz limit 1.45
20 MHz limit 1.40
1 V/div4 GHz 23.1
3 GHz limit 21.4
2 GHz limit 21.0
1 GHz limit 19.2
500 MHz limit 16.8
350 MHz limit 16.1
250 M GHz limit 15.8
200 MHz limit 15.2
20 MHz limit 13.0
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 21 mV/div4 GHz 0.138
3 GHz limit 0.117
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.025
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.025
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2 GHz limit 0.118
1 GHz limit 0.110
500 MHz limit 0.100
350 MHz limit 0.092
250 M GHz limit 0.090
200 MHz limit 0.080
20 MHz limit 0.075
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 2 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2 GHz limit 0.212
1 GHz limit 0.190
500 MHz limit 0.182
350 MHz limit 0.165
250 M GHz limit 0.145
200 MHz limit 0.120
20 MHz limit 0.115
20 mV/div 4 GHz 0.486
3 GHz limit 0.475
2 GHz limit 0.450
1 GHz limit 0.425
500 MHz limit 0.400
350 MHz limit 0.385
250 M GHz limit 0.325
200 MHz limit 0.320
20 MHz limit 0.310
50 mV/div 4 GHz 1.15
3 GHz limit 0.975
2 GHz limit 0.920
1 GHz limit 0.900
500 MHz limit 0.840
350 MHz limit 0.770
250 M GHz limit 0.675
200 MHz limit 0.660
20 MHz limit 0.560
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 2100 mV/div4 GHz 2.71
3 GHz limit 2.28
2 GHz limit 2.10
1 GHz limit 1.78
500 MHz limit 1.74
350 MHz limit 1.70
250 M GHz limit 1.50
200 MHz limit 1.45
20 MHz limit 1.40
1 V/div4 GHz 23.1
3 GHz limit 21.4
2 GHz limit 21.0
1 GHz limit 19.2
500 MHz limit 16.8
350 MHz limit 16.1
250 M GHz limit 15.8
200 MHz limit 15.2
20 MHz limit 13.0
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 31 mV/div4 GHz 0.138
3 GHz limit 0.117
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.025
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.025
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2 GHz limit 0.118
1 GHz limit 0.110
500 MHz limit 0.100
350 MHz limit 0.092
250 M GHz limit 0.090
200 MHz limit 0.080
20 MHz limit 0.075
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 3 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2 GHz limit 0.212
1 GHz limit 0.190
500 MHz limit 0.182
350 MHz limit 0.165
250 M GHz limit 0.145
200 MHz limit 0.120
20 MHz limit 0.115
20 mV/div 4 GHz 0.486
3 GHz limit 0.475
2 GHz limit 0.450
1 GHz limit 0.425
500 MHz limit 0.400
350 MHz limit 0.385
250 M GHz limit 0.325
200 MHz limit 0.320
20 MHz limit 0.310
50 mV/div 4 GHz 1.15
3 GHz limit 0.975
2 GHz limit 0.920
1 GHz limit 0.900
500 MHz limit 0.840
350 MHz limit 0.770
250 M GHz limit 0.675
200 MHz limit 0.660
20 MHz limit 0.560
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 3100 mV/div4 GHz 2.71
3 GHz limit 2.28
2 GHz limit 2.10
1 GHz limit 1.78
500 MHz limit 1.74
350 MHz limit 1.70
250 M GHz limit 1.50
200 MHz limit 1.45
20 MHz limit 1.40
1 V/div4 GHz 23.1
3 GHz limit 21.4
2 GHz limit 21.0
1 GHz limit 19.2
500 MHz limit 16.8
350 MHz limit 16.1
250 M GHz limit 15.8
200 MHz limit 15.2
20 MHz limit 13.0
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 41 mV/div4 GHz 0.138
3 GHz limit 0.117
2 GHz limit 0.0963
1 GHz limit 0.0773
500 MHz limit 0.056
350 MHz limit 0.0477
250 M GHz limit 0.0461
200 MHz limit 0.0379
20 MHz limit 0.025
2 mV/div4 GHz 0.139
3 GHz limit 0.119
2 GHz limit 0.0976
1 GHz limit 0.0724
500 MHz limit 0.562
350 MHz limit 0.0473
250 M GHz limit 0.0467
200 MHz limit 0.038
20 MHz limit 0.025
5 mV/div4 GHz 0.175
3 GHz limit 0.149
2 GHz limit 0.118
1 GHz limit 0.110
500 MHz limit 0.100
350 MHz limit 0.092
250 M GHz limit 0.090
200 MHz limit 0.080
20 MHz limit 0.075
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 4 10 mV/div 4 GHz 0.271
3 GHz limit 0.226
2 GHz limit 0.212
1 GHz limit 0.190
500 MHz limit 0.182
350 MHz limit 0.165
250 M GHz limit 0.145
200 MHz limit 0.120
20 MHz limit 0.115
20 mV/div 4 GHz 0.486
3 GHz limit 0.475
2 GHz limit 0.450
1 GHz limit 0.425
500 MHz limit 0.400
350 MHz limit 0.385
250 M GHz limit 0.325
200 MHz limit 0.320
20 MHz limit 0.310
50 mV/div 4 GHz 1.15
3 GHz limit 0.975
2 GHz limit 0.920
1 GHz limit 0.900
500 MHz limit 0.840
350 MHz limit 0.770
250 M GHz limit 0.675
200 MHz limit 0.660
20 MHz limit 0.560
Random Noise, High Res mode: All models
Performance checks 50 Ω
ChannelV/div Bandwidth Test result (mV)High limit (mV)
Channel 4100 mV/div4 GHz 2.71
3 GHz limit 2.28
2 GHz limit 2.10
1 GHz limit 1.78
500 MHz limit 1.74
350 MHz limit 1.70
250 M GHz limit 1.50
200 MHz limit 1.45
20 MHz limit 1.40
1 V/div4 GHz 23.1
3 GHz limit 21.4
2 GHz limit 21.0
1 GHz limit 19.2
500 MHz limit 16.8
350 MHz limit 16.1
250 M GHz limit 15.8
200 MHz limit 15.2
20 MHz limit 13.0

Performance tests

This section contains a collection of manual procedures for checking that the instrument performs as warranted. They check all the characteristics that are designated as checked in Specifications. (The characteristics that are checked appear with a ✔ in Specifications).

Prerequisites

The tests in this section comprise an extensive, valid confirmation of performance and functionality when the following requirements are met:

  • The instrument must be in its normal operating configuration (no covers removed).

  • You must have performed and passed the procedures under Self Test. (See Self test.)

  • A signal-path compensation must have been done within the recommended calibration interval and at a temperature within ±5 ºC (±9 ºF) of the present operating temperature. (If the temperature was within the limits just stated at the time you did the prerequisite Self Test, consider this prerequisite met). A signal-path compensation must have been done at an ambient humidity within 25% of the current ambient humidity and after having been at that humidity for at least 4 hours.

  • The instrument must have been last adjusted at an ambient temperature between +18 ºC and +28 ºC (+64 ºF and +82 ºF), must have been operating for a warm-up period of at least 20 minutes, and must be operating at an ambient temperature as listed in the specifications. The warm-up requirement is usually met in the course of meeting the Self Test prerequisites listed above.

  • The instrument must be powered from a source maintaining voltage and frequency within the limits described in the Specifications section.
  • The instrument must be in an environment with temperature, altitude, humidity, and vibration within the operating limits described in the Specifications section.

Self test

This procedure verifies that the instrument passes the internal diagnostics and performs signal path compensation. No test equipment or hookups are required.

Equipment required Prerequisites
NonePower on the instrument and allow a 20 minute warm-up period before performing this procedure.
  1. Run the System Diagnostics (may take a few minutes):

    1. Disconnect all probes and/or cables from the oscilloscope inputs.

    2. Tap Utility > Self Test. This displays the Self Test configuration menu.

    3. Tap the Run Self Test button.

    4. The internal diagnostics perform an exhaustive verification of proper instrument function. This verification may take several minutes. When the verification is finished, the status of each self test is shown in the menu.

    5. Verify that the status of all tests is .

    6. Tap anywhere outside the menu to exit the menu.
  2. Run the signal-path compensation routine (may take 5 to 15 minutes per channel):

    1. Tap Utility > Calibration. This displays the Calibration configuration menu.

    2. Tap the Run SPC button to start the routine.

    3. Signal-path compensation may take 5 to 15 minutes to run per channel.

    4. Verify that the SPC Status is Passed.

  3. Return to regular service: Tap anywhere outside the menu to exit the Calibration menu.

The self test procedures are completed. If any of the above tests failed, run the tests again. If there are still failures, contact Tektronix Customer Support.

Note:You cannot run the remaining performance tests until the self tests pass and the SPC has successfully run.

Check input impedance

This test checks the input impedance on all channels.

  1. Connect the output of the digitizer calibrator (for example, Fluke 9500) to the digitizer channel 1 input, as shown in the following illustration.
    WARNING:Be sure to set the generator to Off or 0 volts before connecting, disconnecting, and/or moving the test hookup during the performance of this procedure. The generator is capable of providing dangerous voltages.
    Note:Impedance measuring equipment that produces a voltage across the channel that exceeds the measurement range of the instrument may report erroneous impedance results. A measurement voltage exceeds the measurement range of the instrument when the resulting trace is not visible on the graticule.
  2. Test 50 Ω input impedance as follows:
    1. Set the calibrator impedance to measure 50 Ω impedance.
    2. Double-tap the Ch 1 badge and set Termination to 50 Ω.
  3. Repeat the procedures for all remaining channels as follows:
    1. Turn the calibrator output Off.
    2. Move the calibrator connection to the next channel to test.
    3. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    4. Tap the channel button on the Settings bar of the next channel to test.
    5. Starting from step 2, repeat the procedures until all channels have been tested.

Check DC balance

This test checks the DC balance. You do not need to connect any test equipment (other than the 50 Ω terminator) to the oscilloscope to perform this check.

  1. Attach a 50 Ω terminator to the oscilloscope channel 1 input.
  2. Tap File > Default Setup.
  3. Double-tap the Horizontal badge on the Settings bar and set the Horizontal Scale to 1 ms/div.
  4. Tap the channel 1 button on the oscilloscope Settings bar to display a channel badge.
  5. Double tap the Ch 1 badge to open its menu.
  6. Set the Vertical Scale to 1 mV/div.
  7. Set the channel 1 Termination to 50 Ω.
  8. Tap the Bandwidth Limit field and select 20 MHz.
  9. Tap outside the menu to close it.
  10. Double-tap the Acquisition badge and set the Acquisition Mode to Average.
  11. Set the Number of Waveforms to 16.
  12. Tap outside the menu to close it.
  13. Double-tap the Trigger badge and set the Source to AC line.
  14. Tap outside the menu to close it.
  15. Add a Mean amplitude measurement for channel 1 to the Results bar:
    1. Tap the Add New... Measure button to open the Add Measurements menu.
    2. Set the Source to Ch 1.
    3. In the Amplitude Measurements panel, double-tap the Mean button to add the Mean measurement badge to the Results bar.
  16. Tap outside the menu to close it.
  17. Double-tap the Mean results badge.
  18. Tap Show Statistics in Badge.
  19. Tap FILTER/LIMIT RESULTS to open the panel.
  20. Tap Limit Measurement Population to toggle it to On.
  21. Tap outside the menu to close it.
  22. Enter the mean value as the test result in the test record.
  23. Repeat steps 6 through 22 for each vertical scale setting in the test record.
  24. Repeat steps 3 through 23 for each bandwidth setting in the test record table.
  25. Repeat the procedure for all remaining channels as follows:
    1. Move the 50 Ω terminator to the next channel input to be tested.
    2. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    3. Tap the channel button on the Settings bar of the next channel to test.
    4. Starting from step 6, repeat the procedures until all channels have been tested. To change the source for the Mean measurement for each channel test:
      1. Double-tap the Mean measurement badge.
      2. Tap the Configure panel.
      3. Tap the Source 1 field and select the next channel to test.
  26. Tap outside the menu area to close the configuration menu.

Check DC gain accuracy

This test checks the DC gain accuracy.

  1. Connect the digitizer to a calibrated DC voltage source. If you are using the Fluke 9500 calibrator, connect the calibrator head to the digitizer channel to test.



    WARNING:Set the generator output to Off or 0 volts before connecting, disconnecting, and/or moving the test hookup during the performance of this procedure. The generator is capable of providing dangerous voltages.
  2. Tap File > Default Setup.
  3. Double-tap the Acquisition badge and set Acquisition Mode to Average.
  4. Set the Number of Waveforms to 16.
  5. Tap outside the menu to close the menu.
  6. Double-tap the Trigger badge and set the trigger Source to AC line.
  7. Tap outside the menu to close it.
  8. Add the Mean measurement to the Results bar:
    1. Tap the Add New... Measure button to open the Add Measurements menu.
    2. Set the Source to Ch 1.
    3. In the Amplitude Measurements panel, double-tap the Mean button to add the Mean measurement badge to the Results bar.
  9. Tap outside the menu to close it.
  10. Double-tap the Mean results badge.
  11. Tap Show Statistics in Badge.
  12. Tap FILTER/LIMIT RESULTS to open the panel.
  13. Tap Limit Measurement Population to toggle it to On.
  14. Tap outside the menu to close it.
  15. Tap the channel button of the channel to test, to add the channel badge to the Settings bar.
  16. Double tap the channel to test badge to open its menu and set the channel settings:
    1. Set Vertical Scale to 1 mV/div.
    2. Set Termination to 50 Ω.
    3. Tap Bandwidth Limit and set to 20 MHz.
    4. Tap outside the menu to close it.
  17. Record the negative-measured and positive-measured mean readings in the Gain expected worksheet as follows:
    1. On the calibrator, set the DC Voltage Source to the Vnegative value as listed in the 1`mV row of the worksheet.
    2. Double-tap the Acquisition badge and tap Clear to reset the measurement statistics.
    3. Enter the Mean reading in the worksheet as Vnegative-measured.
    4. On the calibrator, set the DC Voltage Source to Vpositive value as listed in the 1`mV row of the worksheet.
    5. Double-tap the Acquisition badge (if not open) and tap Clear.
    6. Enter the Mean reading in the worksheet as Vpositive-measured.
    Table 1. Gain expected worksheet
    Digitizer Vertical Scale Setting VdiffExpected Vnegative Vpositive Vnegative-measured Vpositive-measured Vdiff Test Result (Gain Accuracy)
    1 mV/div 7 mV -3.5 mV +3.5 mV
    2 mV/div 14 mV -7 mV +7 mV
    5 mV/div 35 mV -17.5 mV +17.5 mV
    10 mV/div 70 mV -35 mV +35 mV
    20 mV/div 140 mV -70 mV +70 mV
    50 mV/div 350 mV -175 mV +175 mV
    100 mV/div 700 mV -350 mV +350 mV
    200 mV/div 1400 mV -700 mV +700 mV
    500 mV/div 3500 mV -1750 mV +1750 mV
    1.0 V/div 7000 mV -3500 mV +3500 mV
    20 mV/div at 250 MHz 140 mV -70 mV +70 mV
    20 mV/div at Full bandwidth 140 mV -70 mV +70 mV
  18. Calculate Gain Accuracy as follows:
    1. Calculate V diff as follows:

      V diff = | V negative-measured - V positive-measured |

    2. Enter V diff in the worksheet.
    3. Calculate Gain Accuracy as follows:

      Gain Accuracy = ((V diff - V diffExpected )/V diffExpected ) × 100%

    4. Enter the Gain Accuracy value in the worksheet and in the test record.
  19. Repeat steps 16 through 18 for all vertical scale settings in the work sheet and the test record.
  20. Repeat the procedure for all remaining channels:
    1. Set the calibrator to 0 volts and 50 Ω output impedance.
    2. Move the calibrator output to the next channel input to be tested.
    3. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    4. Double-tap the Mean measurement badge.
    5. Tap the Configure panel.
    6. Tap the Source 1 field and select the next channel to test.
    7. Starting from step16, set the values from the test record for the channel under test, and repeat the above steps until all channels have been tested.

  21. Touch outside a menu to close the menu.

Check DC offset accuracy

This test checks the offset accuracy at 50 Ω and 1 MΩ input impedances.

  1. Connect the digitizer to a calibrated DC voltage source. If you are using the Fluke 9500B calibrator as the DC voltage source, connect the calibrator head to the digitizer channel 1.
    WARNING:Set the generator output to Off or 0 volts before connecting, disconnecting, or moving the test hookup during the performance of this procedure. The generator is capable of providing dangerous voltages.
  2. Tap File > Default Setup.
  3. Double-tap the Acquisition badge and set Acquisition Mode to Average.
  4. Set the Number of Waveforms to 16.
  5. Tap outside the menu to close the menu.
  6. Double-tap the Trigger badge and set the trigger Source to AC line.
  7. Add the Mean measurement to the Results bar:
    1. Tap the Add New... Measure button to open the Add Measurements menu.
    2. Set the Source to Ch 1.
    3. In the Amplitude Measurements panel, double-tap the Mean button to add the Mean measurement badge to the Results bar.
  8. Tap outside the menu to close it.
  9. Double-tap the Mean results badge.
  10. Tap Show Statistics in Badge.
  11. Tap FILTER/LIMIT RESULTS to open the panel.
  12. Tap Limit Measurement Population to toggle it to On.
  13. Tap outside the menu to close it.
  14. Tap the channel button on the Settings bar to add the channel under test to the Settings bar.
  15. Double-tap the channel under test badge to open its configuration menu and change the vertical settings:
    1. Set Vertical Scale to 1 mV/div.
    2. Set Offset to 900 mV.
    3. Set Position to 0 by tapping Set to 0.
    4. Set Termination to 50 Ω.
    5. Tap Bandwidth Limit and set to 20 MHz.
    6. Tap outside the menu to close it.
  16. Set the calibrator output to +900 mV, as shown in the test record, and turn the calibrator output On.
  17. Enter the Mean measurement value in the test record.
  18. Double-tap the channel under test badge to open its configuration menu and change the Offset to -900 mV.
  19. Set the calibrator output to -900 mV, as shown in the test record.
  20. Enter the Mean measurement value in the test record.
  21. Repeat step 15 through 20, changing the channel vertical settings and the calibrator output as listed in the test record for the channel under test.
  22. Repeat the procedure for all remaining channels as follows:
    1. Double-tap the Mean measurement badge.
    2. Tap the Configure panel.
    3. Tap the Source 1 field and select the next channel to test.
    4. Set the calibrator to 0 volts and 50 Ω output impedance.
    5. Move the calibrator output to the next channel input to test.
    6. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    7. Tap the channel button on the digitizer Settings bar of the next channel to test.
    8. Starting from step , repeat the procedure until all channels have been tested.

Check analog bandwidth

This test checks the bandwidth at 50 Ω for each channel.

  1. Connect the output of the calibrated leveled sine wave generator to the digitizer channel 1 input as shown in the following illustration.
    WARNING:Set the generator to off or 0 volts before connecting, disconnecting, and/or moving the test hookup during the performance of this procedure. The generator is capable of providing dangerous voltages.
  2. Tap File > Default Setup to reset the instrument and add the channel 1 badge and signal to the display.
  3. Add the peak-to-peak measurement as follows:
    1. Tap the Add New. Measure button.
    2. Set the Source to the channel under test.
    3. In the Amplitude Measurements panel, double-tap the Peak-to-Peak measurement button to add the measurement badge to the Results bar.
    4. Tap outside the menu to close it.
    5. Double-tap the Peak-to-Peak results badge.
    6. Tap Show Statistics in Badge.
    7. Tap FILTER/LIMIT RESULTS to open the panel.
    8. Tap Limit Measurement Population to toggle it to On.
    9. Tap outside the menu to close it.
  4. Set the channel under test settings:
    1. Double-tap the badge of the channel under test to open its configuration menu.
    2. Set Vertical Scale to 1 mV/div.
    3. Set Termination to 50 Ω.
    4. Tap outside the menu to close it.
  5. Adjust the leveled sine wave signal source to display a waveform of 8 vertical divisions at the selected vertical scale with a set frequency of 10 MHz. For example, at 5 mV/div, use a ≥40 mVp-p signal; at 2 mV/div, use a ≥16 mVp-p signal.
    Note:At some V/div settings, the generator may not provide 8 vertical divisions of signal. Set the generator output to obtain as many vertical divisions of signal as possible.
  6. Double-tap the Horizontal badge in the Settings bar.
  7. Set the Horizontal Scale to 1 ms/division.
  8. Tap outside the menu to close it.
  9. Record the Peak-to-Peak measurement in the V in-pp entry of the test record.
  10. Double-tap the Horizontal badge in the Settings bar.
  11. Set the Horizontal Scale to .
  12. Adjust the signal source to the maximum bandwidth frequency for the bandwidth and model being tested.
  13. Record the peak-to-peak measurement as follows:
    1. Record the Peak-to-Peak measurement at the new frequency in the V bw-pp entry of the test record.
  14. Use the values of V bw-pp and V in-pp recorded in the test record, and the following equation, to calculate the Gain at bandwidth:

    Gain = Vbw-pp / Vin-pp.

    To pass the performance measurement test, Gain should be ≥ 0.707. Enter Gain in the test record.

  15. Repeat steps 4 through 14 for all combinations of Vertical Scale settings listed in the test record.

  16. Repeat the test for all remaining channels as follows:
    1. Set the calibrator to 0 volts and 50 Ω output impedance.
    2. Move the calibrator output to the next channel input to be tested.
    3. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    4. Tap the channel button on the digitizer Settings bar of the next channel to test.
    5. Double-tap the Peak-to-Peak measurement badge.
    6. Tap the Configure panel.
    7. Tap the Source 1 field and select the next channel to test.
    8. Starting from step 4, repeat the procedure until all channels have been tested.

Check random noise, Sample acquisition mode (8 and 6 GHz options)

This test checks random noise at 50 Ω for each channel in Sample acquisition mode. You do not need to connect any test equipment to the digitizer for this test.

  1. Disconnect everything from the digitizer inputs.
  2. Tap File > Default Setup.
  3. Add the AC RMS measurement:
    1. Tap the Add New... Measure button.
    2. Set the Source to the channel being tested.
    3. In the Amplitude Measurements panel, double-tap the AC RMS measurement button to add the measurement badge to the Results bar.
    4. Tap outside the menu to close it.
    5. Double-tap the AC RMS measurement badge and tap Show Statistics in Badge to display statistics in the measurement badge.

    6. Tap the Filter / Limit Results panel.
    7. Turn on Limit Measurement Population.
    8. Set the limit to 100.
    9. Tap outside the menu to close it.
  4. Set up the Horizontal mode:
    1. Double-tap the Horizontal setting badge.
    2. Set Horizontal Mode to Manual.
    3. Set the Sample Rate to 25 GS/s.
    4. Set the Record Length to 2 Mpts.
    5. Tap outside the menu to close it.
  5. Double-tap the Channel badge of the channel being tested.
  6. Set the Vertical Scale value to 1 mV.
  7. Check 50 Ω termination as follows:
    1. In the Channel badge, set Termination to 50 Ω.
    2. Tap the Bandwidth Limit field and select the highest frequency listed.
    3. Set the channel vertical Position value to 340 mdivs.
    4. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    5. Set the channel vertical Position value to 360 mdivs.
    6. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    7. Average the two values and record the result in the 1 mV/div row of the 50 Ω column of the Test Result record.
  8. Repeat step 7 for all frequencies above 4 GHz
  9. Repeat the 50 Ω test at all V/div settings for the current channel:

    1. In the Channel badge, set the Vertical Scale setting to the next value in the test record (2`mV, 5`mV, and so on, up to 1`V/div).

    2. Repeat steps 7 through 8.

  10. Repeat all tests for the remaining input channels:
    1. Double-tap the AC RMS measurement badge.
    2. Tap the Configure panel.
    3. Tap the Source 1 field and select the next channel to test.
    4. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    5. Tap the channel button on the digitizer Settings bar of the next channel to test.
    6. Double-tap the channel badge for the channel being tested.
    7. Starting at step 6, repeat these procedures for each input channel.

Check random noise, High Res mode

This test checks random noise at 50 Ω for each channel in High Res acquisition mode. You do not need to connect any test equipment to the digitizer for this test.

  1. Disconnect everything from the digitizer inputs.
  2. Tap File > Default Setup.
  3. Double-tap the Acquisition badge and set Acquisition Mode to High Res.
  4. Add the AC RMS measurement:
    1. Tap the Add New... Measure button to open the Add Measurements menu.
    2. Set the Source to the channel being tested.
    3. In the Amplitude Measurements panel, double-tap the AC RMS button to add the measurement badge to the Results bar.
    4. Tap outside the menu to close it.
    5. Double-tap the AC RMS measurement badge and tap Show Statistics in Badge to display statistics in the measurement badge.
    6. Tap the Filter/Limit Results panel.
    7. Turn on Limit Measurement Population.
    8. Set the limit to 100.
    9. Tap outside the menu to close it.
  5. Set up the Horizontal mode:
    1. Double-tap the Horizontal setting badge.
    2. Set Horizontal Mode to Manual.
    3. Set the Sample rate to 12.5 GS/s.
    4. Set the Record Length to 2 Mpts.
    5. Tap outside the menu to close it.
  6. Check 50 Ω termination as follows:
    1. In the Channel badge, set Termination to 50 Ω.
    2. Tap the Bandwidth Limit field and select 4`GHz or the highest frequency listed.
    3. Set the channel Position value to 340 mdivs.
    4. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    5. Set the channel Position value to -340 mdivs.
    6. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    7. Average the two values and record the result in the 1 mV/div row of the 50 Ω column of the random noise, High Res mode Test Result record.
  7. Repeat step 6 for all frequencies below 4`GHz.
  8. Repeat 50 Ω tests at all V/div settings for the current channel:
    1. In the Channel badge, set the Vertical Scale setting to the next value in the test record (2`mV, 5`mV, and so on, up to 1`V/div).

    2. Repeat steps 6 through 7.
  9. Repeat all tests for the remaining input channels:
    1. Double-tap the AC RMS measurement badge.
    2. Tap the Configure panel.
    3. Tap the Source 1 field and select the next channel to test.
    4. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    5. Tap the channel button on the digitizer Settings bar of the next channel to test.
    6. Double-tap the channel badge for the channel being tested.
    7. Starting at step 6, repeat these procedures for each input channel.

Check high offset AC RMS noise, Sample acquisition mode (8 and 6 GHz options)

This test checks high offset AC RMS noise at 50 Ω for each channel in sample acquisition mode. You do not need to connect any test equipment to the digitizer for this test.

  1. Disconnect everything from the digitizer inputs.
  2. Tap File > Default Setup.
  3. Add the AC RMS measurement:
    1. Tap the Add New... Measure button.
    2. Set the Source to the channel being tested.
    3. In the Amplitude Measurements panel, double-tap the AC RMS measurement button to add the measurement badge to the Results bar.
    4. Tap outside the menu to close it.
    5. Double-tap the AC RMS measurement badge and tap Show Statistics in Badge to display statistics in the measurement badge.
    6. Tap the Filter / Limit Results panel.
    7. Turn on Limit Measurement Population.
    8. Set the limit to 100.
    9. Tap outside the menu to close it.
  4. Set up the Horizontal mode:
    1. Double-tap the Horizontal setting badge.
    2. Set Horizontal Mode to Manual.
    3. Set the Sample Rate to 25 GS/s.
    4. Set the Record Length to 2 Mpts.
    5. Tap outside the menu to close it.
  5. Double-tap the Channel badge of the channel being tested.
  6. Set the Vertical Scale value to 1 mV.
  7. Check 50 Ω termination as follows:
    1. In the Channel badge, set Termination to 50 Ω.
    2. Tap the Bandwidth Limit field and select the highest frequency listed.
    3. Set the channel vertical Position value to 4 div.
    4. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    5. Record the value in the 1 mV/div row of the 50 Ω column of the High Offset AC RMS Noise, sample acquisition mode test record.
  8. Repeat step 7 for all frequencies above 4 GHz
  9. Repeat the 50 Ω test at all V/div settings for the current channel:
    1. In the Channel badge, set the Vertical Scale setting to the next value in the test record (2 mV/div through 1 V/div).
    2. Repeat steps 7 through 8.

  10. Repeat all tests for the remaining input channels:
    1. Double-tap the AC RMS measurement badge.
    2. Tap the Configure panel.
    3. Tap the Source 1 field and select the next channel to test.
    4. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    5. Tap the channel button on the digitizer Settings bar of the next channel to test.
    6. Double-tap the channel badge for the channel being tested.
    7. Starting at step 6, repeat these procedures for each input channel.

Check high offset AC RMS noise, High Res mode

This test checks high offset AC RMS noise at 50 Ω for each channel in High Res acquisition mode. You do not need to connect any test equipment to the digitizer for this test.

  1. Disconnect everything from the digitizer inputs.
  2. Tap File > Default Setup.
  3. Double-tap the Acquisition badge and set Acquisition Mode to High Res.
  4. Add the AC RMS measurement:
    1. Tap the Add New... Measure button to open the Add Measurements menu.
    2. Set the Source to the channel being tested.
    3. In the Amplitude Measurements panel, double-tap the AC RMS button to add the measurement badge to the Results bar.
    4. Tap outside the menu to close it.
    5. Double-tap the AC RMS measurement badge and tap Show Statistics in Badge to display statistics in the measurement badge.
    6. Tap the Filter/Limit Results panel.
    7. Turn on Limit Measurement Population.
    8. Set the limit to 100.
    9. Tap outside the menu to close it.
  5. Set up the Horizontal mode:
    1. Double-tap the Horizontal setting badge.
    2. Set Horizontal Mode to Manual.
    3. Set the Sample rate to 12.5 GS/s.
    4. Set the Record Length to 2 Mpts.
    5. Tap outside the menu to close it.
  6. Check 50 Ω termination as follows:
    1. In the Channel badge, set Termination to 50 Ω.
    2. Tap the Bandwidth Limit field and select 4`GHz or the highest frequency listed.
    3. Set the channel Position value to 4 div.
    4. Once the measurement count (N) in the measurement badge reaches 100, record the AC RMS Mean value (the µ readout).
    5. Record the value in the 1 mV/div row of the 50 Ω column of the High Offset AC RMS Noise, High Res mode test record.
  7. Repeat step 6 for all frequencies below 4 GHz.
  8. Repeat 50 Ω tests at all V/div settings for the current channel:
    1. In the Channel badge, set the Vertical Scale setting to the next value in the test record (2 div/mV through 1 V/div).
    2. Repeat steps 6 through 7.
  9. Repeat all tests for the remaining input channels:
    1. Double-tap the AC RMS measurement badge.
    2. Tap the Configure panel.
    3. Tap the Source 1 field and select the next channel to test.
    4. Double-tap the channel badge of the channel that you have finished testing and set Display to Off.
    5. Tap the channel button on the digitizer Settings bar of the next channel to test.
    6. Double-tap the channel badge for the channel being tested.
    7. Starting at step 6, repeat these procedures for each input channel.

Check long term samples rate and delay time accuracy

This test checks the sample rate and delay time accuracy (time base).

  1. Connect a 50 Ω cable from the Aux Out connector to the frequency counter input as shown in the following figure.
  2. Tap File > Default Setup.
  3. Tap Utility > I/O.
  4. Tap AUX OUT to open its configuration menu.
  5. Tap Reference Clock to send the clock to the Aux Out connector.
  6. Check the reading on the frequency counter. Enter the value in the Test record.

Check AUX Out output voltage levels

This test checks the output voltage levels from the AUX Out connector.

  1. Use a 50 Ω cable to connect the AUX Out signal from the rear of the instrument to the channel 1 input of the same instrument, as shown in the following illustration.

  2. Tap File > Default Setup. This resets the instrument and adds the channel 1 badge and signal to the display.
  3. Double-tap the badge of the channel 1 badge to open its configuration menu.
  4. Set the Vertical Scale to 1 V/div.
  5. Tap outside the menu to close it.
  6. Double-tap the Horizontal badge in the Settings bar.
  7. Set the Horizontal Scale to 400 ns/div.
  8. Tap outside the menu to close it.
  9. Record the Maximum and Minimum measurements at 50 Ω termination as follows:
    1. Double-tap the Ch 1 badge to open its configuration menu.
    2. Set Termination to 50 Ω.
    3. Tap outside the menu to close it.
    4. Enter the Maximum and Minimum measurement readings in the 50 Ω row of the test record.

Check DVM voltage accuracy (DC)

This test checks the DC voltage accuracy of the Digital Volt Meter (DVM) option. The DVM option is available for free when you register the instrument at tek.com.

Procedure

  1. Connect the digitizer to a DC voltage source to run this test. If using the Fluke 9500 calibrator as the DC voltage source, connect the calibrator head to the digitizer channel to test.
    WARNING:Set the generator output to Off or 0 volts before connecting, disconnecting, or moving the test hookup during the performance of this procedure. The generator is capable of providing dangerous voltages.
  2. Set the calibrator impedance to 50 Ω.
  3. Tap File > Default Setup. This resets the instrument and adds the channel 1 badge and signal to the display.
  4. Set the channel settings:
    1. Double tap the badge of the channel under test to open its menu.
    2. Check that Position is set to 0 divs. If not, set the position to 0 divisions.
    3. Set the Bandwidth Limit to 20 MHz.
  5. Set the calibrator impedance to 50 Ω.
  6. Double-tap the Horizontal badge and set Horizontal Scale to 1 ms/div.
  7. Tap outside the menu to close it.
  8. Double-tap the Acquisition badge and set the Acquisition Mode to Average.
  9. Verify or set the Number of Waveforms to 16.
  10. Tap outside the menu to close it.
  11. Double-tap the Trigger badge and set the Source to AC Line.
  12. Tap outside the menu to close it.
  13. Tap the DVM button to add the DVM badge to the Results bar.
  14. In the DVM menu, set Source to the channel to be tested.
  15. Set Mode to DC.
  16. Tap outside the menu to close it.
  17. Set the calibrator to the input voltage shown in the test record (for example, –5 V for a 1V/div setting).
  18. In the channel under test menu, set the Offset value to that shown in the test record (for example, –5 V for –5 V input and 1`V/div setting).
  19. Set the Vertical Scale field to match the value in the test record (for example, 1 V/div).
  20. Enter the measured value on the DVM badge into the DVM Voltage Accuracy Tests record.
  21. Repeat the procedure (steps 17, 18, 19 and 20) for each volts/division setting shown in the test record.
  22. Repeat all steps, starting with step 4, for each digitizer channel to check. To set the next channel to test:
    1. Double tap the badge of the channel under test to open its menu.
    2. Set Display to Off.
    3. Tap the channel button in the Settings bar of the next channel to test to add that channel badge and signal to the display.

Check trigger frequency accuracy and maximum input frequency

This test checks trigger frequency counter accuracy. The trigger frequency counter is part of the free DVM and trigger frequency option that is available when you register the instrument at tek.com.

Procedure

  1. Tap File > Default Setup to reset the instrument and add the channel 1 badge and signal to the display.
  2. Connect the 10 MHz Reference out from the time mark generator to the Ref In connector on the back of the digitizer.
  3. Connect the output of the time mark generator to the digitizer channel input being tested using a 50 Ω cable.
    Set the time mark generator to a 50 Ω source and a fast rising edge waveform (≥ 3 mV/ns).
  4. Set the time mark generator frequency to the first value shown in the test record, starting at 100 Hz.
  5. Set the mark amplitude to 1 V pp, which makes a 2 divisions high waveform.
  6. Double-tap the channel badge being tested (starting with channel 1) and set Termination to 50 Ω.
  7. Set the channel Vertical Scale to 500 mV/div.
  8. Tap outside the menu to close it.
  9. Double-tap the Acquisition badge and set the Timebase Reference Source to .
  10. Tap outside the menu to close it.
  11. Double-tap the Horizontal badge and use the Horizontal Scale controls to display at least 2 cycles of the waveform.
  12. Tap outside the menu to close it.
  13. Double-tap the Trigger badge to open its menu.
    1. Set the Source field to the input channel being tested.
    2. Tap the Set to 50% button to obtain a stable display.
    3. Tap the Mode & Holdoff panel to open the Mode & Holdoff configuration menu.
    4. In the Mode & Hold Off menu, set the Trigger Frequency Counter to On. The trigger frequency readout is at the bottom of the Trigger badge.
    5. Tap outside the menu to close it.
  14. Double-tap the channel badge being tested (starting with channel 1) and use the Position controls to vertically center the time mark in the waveform graticule.
  15. Enter the value of the trigger frequency (F readout in the Trigger badge) in the test record for that frequency.
  16. Repeat this procedure for each frequency setting shown in the record. Make sure to adjust the Horizontal scale after each calibrator frequency change to show at least two cycles of the waveform on the screen.
  17. Repeat all these steps to test each digitizer channel.

Check AFG sine and ramp frequency accuracy

This test verifies the frequency accuracy of the arbitrary function generator. All output frequencies are derived from a single internally generated frequency. Only one frequency point of channel 1 is required to be checked.

  1. Connect a 50 Ω cable from the AFG Out connector to the frequency counter input as shown in the following figure.
    Figure 1. Frequency/period test
  2. Tap File > Default Setup to set the instrument to the factory default settings.
  3. Tap the AFG button to open the AFG menu.
  4. Set the arbitrary function generator output as follows:
    Select menu Setting
    Output On
    Waveform Type Sine
    Frequency 1.000000 MHz
    Amplitude 1.00 VPP
  5. Turn on the frequency counter:
    1. Double-tap the Trigger badge to open its menu.

    2. Set the Source field to the input channel being tested.
    3. Tap the Set to 50% button to obtain a stable display.
    4. Tap the Mode & Holdoff panel to open the Mode & Holdoff configuration menu
    5. In the Mode & Hold Off menu, set the Trigger Frequency Counter to On. The trigger frequency readout is at the bottom of the Trigger badge.
    6. Tap outside the menu to close it.
  6. Check that the reading of the frequency counter is between 0.999950 MHz and 1.000050 MHz. Enter the value in the Test record.
  7. Set the arbitrary function generator output as follows:
    Select menu Setting
    Waveform Type Ramp
    Frequency 500 kHz
  8. Check that reading of the frequency counter is between 499.975 kHz and 500.025 kHz. Enter the value in the Test record.

Check AFG square and pulse frequency accuracy

This test verifies the frequency accuracy of the arbitrary function generator. All output frequencies are derived from a single internally generated frequency. Only one frequency point of channel 1 is required to be checked.

  1. Connect the arbitrary function generator to the frequency counter as shown in the following figure.
    Figure 1. Frequency/period test
  2. Tap File > Default Setup to set the instrument to the factory default settings.
  3. Tap the AFG button to open the AFG menu.
  4. Set the arbitrary function generator as follows:
    Select menu Setting
    Waveform Type Square
    Frequency 1.000000 MHz
    Amplitude 1.00 VPP
    Output On
  5. Turn on the frequency counter:
    1. Double-tap the Trigger badge to open its menu.

    2. Set the Source field to the input channel being tested.
    3. Tap the Set to 50% button to obtain a stable display.
    4. Tap the Mode & Holdoff panel to open the Mode & Holdoff configuration menu
    5. In the Mode & Hold Off menu, set the Trigger Frequency Counter to On. The trigger frequency readout is at the bottom of the Trigger badge.
    6. Tap outside the menu to close it.
  6. Check that the frequency counter readout is between 0.999950 MHz and 1.00005 MHz. Enter the value in the Test record.
  7. Set up the arbitrary function generator as follows:
    Select menu Setting
    Waveform Type Pulse
  8. Check that reading of the frequency counter is between 0.999950 MHz and 1.000050 MHz. Enter the value in the Test record.

Check AFG signal amplitude accuracy

This test verifies the amplitude accuracy of the arbitrary function generator. All output amplitudes are derived from a combination of attenuators and 3 dB variable gain. Some amplitude points are checked. This test uses a 50 Ω terminator. It is necessary to know the accuracy of the 50 Ω terminator in advance of this amplitude test. This accuracy is used as a calibration factor.

  1. Connect the 50 Ω terminator to the DMM as shown in the following figure and measure the resistance value.
    Figure 1. 50 Ω terminator accuracy


  2. Calculate the 50 Ω calibration factor (CF) from the reading value and record as follows:
    Table 1. CF (Calibration Factor) = 1.414 × ((50 / Measurement Ω) + 1)
    Measurement (reading of the DMM) Calculated CF

    Examples:

    For a measurement of 50.50 Ω, CF = 1.414 ( 50 / 50.50 + 1) = 2.814.

    For a measurement of 49.62 Ω, CF = 1.414 ( 50 / 49.62 + 1) = 2.839.

  3. Connect the arbitrary function generator output to the DMM as shown in the following figure. Be sure to connect the 50 Ω terminator to the AFG Out connector.
    Figure 2. Amplitude test
  4. Tap the AFG button and set up the arbitrary function generator output as follows:
    Select menu Setting
    Waveform Type Sine
    Frequency 1.000000 kHz
    Amplitude 30 mVPP
    Load Impedance 50 Ω
    Output On
  5. Measure the AC RMS voltage readout on the DMM.

  6. Multiply the DMM voltage by the calculated CF to get the corrected peak to peak voltage. Enter the resulting value in the Measurement field in the following table.
  7. Change the AFG output amplitude to the next value in the table.
  8. Repeat steps 5 through 7 for each amplitude value. Check that the peak to peak voltages are within the limits in the table below. Enter the values in the test record.

    Waveform Type Frequency Amplitude Measurement Range
    Sine 1.000 kHz 30.0 mVPP 28.55 mVPP - 31.45`mVPP
    Sine 1.000 kHz 300.0 mVPP 294.5 mVPP - 305.5`mVPP
    Sine 1.000 kHz 800.0 mVPP 787.0 mVPP - 813.0`mVPP
    Sine 1.000 kHz 1.500 VPP 1.4765 VPP - 1.5235`VPP
    Sine 1.000 kHz 2.000 VPP 1.969 VPP - 2.031`VPP
    Sine 1.000 kHz 2.500 VPP 2.4615 VPP - 2.5385`VPP

Check AFG DC offset accuracy

This test verifies the DC offset accuracy of the arbitrary function generator. This test uses a 50 Ω terminator. It is necessary to know the accuracy of the 50 Ω terminator in advance of this test. This accuracy is used as a calibration factor.

  1. Connect the 50 Ω terminator to the DMM as shown in the following figure and measure the resistance value.
    Figure 1. 50 Ω terminator accuracy


  2. Calculate the 50 Ω calibration factor (CF) from the reading value and record as follows:
    Table 1. CF (Calibration Factor) = 0.5 × (( 50 / Measurement Ω) + 1)
    Measurement (reading of the DMM) Calculated CF

    Examples:

    For a measurement of 50.50 Ω, CF = 0.5 ( 50 / 50.50 + 1) = 0.9951.

    For a measurement of 49.62 Ω, CF = 0.5 ( 50 / 49.62 + 1) = 1.0038.

  3. Connect the arbitrary function generator output to the DMM as shown in the following figure. Be sure to connect the 50 Ω terminator to the arbitrary function generator AFG Output connector.
    Figure 2. DC offset tests
  4. Tap the AFG button and set up the arbitrary function generator as follows:
    Select menu Setting
    Waveform Type DC
    Offset + 1.25 V
    Output On

  5. Measure the voltage readout on the DMM.
  6. Multiply the DMM voltage by the calculated CF to get the corrected offset voltage. Enter the resulting value in the Measurement field in the following table.
    Function Offset Measurement Range

    DC

    + 1.25 Vdc Vdc 1.23025 Vdc to 1.26975 Vdc

    DC

    0.000 Vdc Vdc - 0.001 Vdc to + 0.001 Vdc

    DC

    - 1.25 Vdc Vdc -1.26975 Vdc to -1.23025 Vdc
  7. Change the AFG output amplitude to the next value in the table, measure the voltage readout on the DMM, multiply the DMM readout by the calculated CF to get the corrected offset voltage, and enter the resulting value in the Measurement field in the table.
  8. Verify that the corrected offset measurements are within the range.

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