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Keithley 4200A-SCS 반도체 특성 분석기

소재, 프로세스 및 반도체 장치를 특성화할 수 있는 완전 통합형 솔루션입니다.

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마지막 업데이트: Thursday, April 20, 2023
Datasheet
4200A-SCS Parameter Analyzer Datasheet

1KW-60780-6 | Date: Tuesday, June 04 2024
Videos, Webinars and Demos
4200A-SCS Parameter Analyzer Product Overview Video

This short video provides an overview of the Keithley 4200A-SCS, a powerful and customizable parameter analyzer for applications ranging from research labs to production environments.

| Date: Tuesday, January 19 2021
Technical Document
Using the 4200A-SCS Parameter Analyzer Built-in FFT Functions

The 4200A-SCS Parameter Analyzer with Clarius+ V1.9 software includes FFT analysis functions that enable the user to automatically make frequency-based calculations on time domain measurements without having to download the data and perform analysis in a separate tool, enabling important test results much faster. This application note explains these new functions along with some typical use cases for FFT parameter extractions including current spectral density measurements using both an SMU and the PMU, resistor thermal noise measurements, and AC impedance calculations of an RC circuit.

1KW-73767-0 | Date: Tuesday, December 15 2020
Datasheet
Model 4200-SCS Parameter Analyzer Technical Data

Date: Tuesday, May 30 2017
Technical Document
Automating High and Low Frequency C-V Measurements and Interface Trap Density (DIT) Calculations of MOS Capacitors Using the 4200A-SCS Parameter Analyzer

This application note discusses how to use the 4200A-SCS Parameter Analyzer to measure and to automatically switch between high and low frequency C-V measurements on MOS capacitors. Basic information on MOS capacitors and common parameter extractions is also discussed.

1KW-73765-0 | Date: Monday, December 07 2020
Manual
Model 4200A-SCS Parameter Analyzer Quick Start Guide

This QSG provides a brief introduction to the Keithley Instruments 4200A-SCS Parameter Analyzer, to include unpacking and initial connection information.

Manual
주 사용자 | P/N 4200A-903-01C | Date: Monday, August 09 2021
Technical Document
Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer

Introduction The continuing push for more devices on each chip and faster clock speeds is driving the demand for shrinking geometries, new materials, and novel technologies. All of these factors have a tremendous impact on the lifetime and …

1KW-61526-0 | Date: Monday, January 28 2019
Technical Document
Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer

This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.

1KW-61388-0 | Date: Wednesday, April 25 2018
Technical Document
Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer

This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).

1KW-60634-0 | Date: Wednesday, September 04 2019