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텍트로닉스 제품 지원 센터
'텍크놀로지(Tek-nology)'를 개발하는 일은 행복하지만, 동시에 매우 바쁘다는 걸 알고 있습니다. 이에. 텍트로닉스는 현재 출시되는 모든 제품과 단종된 여러 제품에 대한 설명서와 데이터 시트, 소프트웨어를 쉽게 다운로드할 수 있도록 제품 지원 센터를 만들었습니다. 사용 중인 제품명을 입력해 주시기만 하면 텍스로닉스가 보유하고 있는 모든 정보를 알려 드리겠습니다.
선택한 제품 모델은 현재 구입할 수 있으며, 다음 지원 정보도 제공됩니다.
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데이터 시트 참고자료 번호: 릴리즈 날짜 Model 237-ALG-2 Triaxial Cable
The Keithley Instruments Model 237-ALG-2 is a 6.6 ft (2 m) triaxial cable that is terminated with a three-slot male triaxial connector on one end and alligator clips on the other end.PA-298E Model 4288-2 Dual-Unit Rack-Mount Kit
The Model 4288-2 Dual Fixed Rack Mounting Kit includes all of the hardware necessary for side-by-side rack mounting of two instruments, including Series 2000, 2182A, Series 2300, Series 2500, 2700, 2701, 6220, 6221, 6485, 6487, 6514, or 6517B.PA-290D Model 6220 DC Current Source and Model 6221 AC and DC Current Source
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매뉴얼 매뉴얼 유형 부품 번호: 릴리즈 날짜 Keithley Instruments Safety Precautions
Safety Precautions PA사용자 071341102 Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
사용자 622X-901-01C Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
주 사용자 622X-900-01C
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기술 문서 문서 유형 릴리즈 날짜 Hall Effect Measurements in Materials Characterization
백서 Supporting the Materials Research of the Future
Advances in materials science are driving the future of many industries where the electrical properties of materials can reveal previously unknown materials characteristics. This flyer highlights the Keithley instrumentation that is vital to helping …팩트 시트(Fact Sheet) Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.포스터 Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …제품 자료 SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
브로슈어 Applications Guide - Techniques for Multi-Channel Testing and Data Acquisition
팩트 시트(Fact Sheet) E-Handbook to Understanding Electrical Test and Measurement
Introduction Welcome to Keithley's Guide to Understanding Electrical Test and Measurement. For over 60 years, Keithley testand measurement instruments have provided measurements ranging from the most basic to very complex. In all …팩트 시트(Fact Sheet) New Materials and Devices E-Guide
브로슈어 Making Precision Low Voltage and Low Resistance Measurements E-Handbook
팩트 시트(Fact Sheet) Optimizing Low-Current Measurements and Instruments
Characterizing devices at low current levels requires knowledge, skill, and the right test equipment. Even with all three, achieving accuracy at low current levels can be a challenge because the level of the current is often at or below the noise …백서 Advances in Electrical Measurements for Nanotechnology
Rev 3.15.13제품 자료 Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13팩트 시트(Fact Sheet) High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
브로슈어 Low Current/ High Resistance Measurement Selector Guide
Low Current/ High Resistance Measurement Selector Guide - 2013 Catalog제품 선택 가이드 Low Voltage/ Low Resistance Measurements
제품 선택 가이드 MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION
MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION REV C사양 Hall Effect Measurements Essential for Characterizing High Carrier Mobility
The Hall effect can be observed when the combination of a magnetic field through a sample and a current along the length of the sample create an electrical current perpendicular to both the magnetic field and the current, which in turn …기술 자료 Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
브로슈어 Guide to Measuring New Materials and Devices
제품 자료 Pulse Testing for Nanoscale Devices
기술 자료 New dG Measurement Methods Reveal Nanodevice Characteristics Faster, at Lower Cost
기술 자료 AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
AC versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices Sensitive Measurement Needs Researchers today must measure mate-rial and device characteristics that involve very small currents and voltages. …기술 자료 The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …기술 자료 #2615 Determining Resistivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
애플리케이션 노트 Characterizing Nanoscale Devices with Differential Conductive Measurements
As modern electronics continue to shrink, researchers increasingly look to nanotechnology for breakthroughs in device size and power consumption. In these nanoscale devices, electrical characteristics are affected by quantum behavior …기술 자료 New Instruments Can Lock Out Lock-ins
백서 Low-Voltage Measurement Techniques
Introduction Electronics are continuing to shrink as consumers demand faster, more feature-rich products in ever-smaller form factors. Because of their small sizes, these electronic components usually have limited power handling …기술 자료 Electrical Measurements on Nanoscale Materials
This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …기술 자료 #2611 Low-Level Pulsed Electrical Characterization with the Model 6221/2182A Combination
애플리케이션 노트 An Improved Method for Differential Conductance Measurements
Introduction As modern electronics continue to shrink, researchers are increasingly looking to nano technology as the basis for the next breakthrough in device size and power consumption. Indeed, as semiconductor structures …백서 Models 6220 Current Source Specifications Rev. B
Model 6220 Programmable Current Source Specifications Rev. B사양 Precision, Low Current Sources for Device Testing and Characterization
High accuracy, low noise sourcing combined with exceptional ease of use Keithley's new Model 6220 DC Current Source and Model 6221 AC and DC Current Source deliver the high resolution, low noise, low current sourcing you need …브로슈어 Unraveling Fuel Cell Electrical Measurements
기술 자료 Problem: Reading Drift in Low Resistance Measurements
기술 자료 Problem: Noisy Readings in Low Resistance Measurements
기술 자료 Problem: Noisy Readings in High Resistance Measurements
기술 자료 Problem: Errors in Low Resistance Measurements
기술 자료 Problem: Error in Low Voltage, Low Current Measurements
기술 자료 Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
백서
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소프트웨어 문서 유형 부품 번호: 릴리즈 날짜 6220/6221 FIRMWARE RELEASE E02
Model 6220/6221 E02 Firmware Release Use with Keithley Flash Wizard to upgrade a 6220/6221 instrument. DO NOT install revision E firmware on instruments with revision A or D firmware.펌웨어 6221-FRP-E02 Keithley I/O Layer version C10 (Windows 11, 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 and 11 Operating Systems and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL …애플리케이션 KIOL-850C10 6220/6221 Firmware Revision D04
Model 6220/6221 D04 Firmware Release.DO NOT install revision D firmware on instruments with revision A firmware.펌웨어 6221-801D04 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …애플리케이션 KIOL-850C07 6220/6221 Firmware Revision D03
6220/6221 D03 Firmware Installation Package (READ RELEASE NOTES FIRST)펌웨어 6221-801D03 6220/6221 IVI Driver for Visual Basic (VB), VC/C++, Labview (LV) and LabWindows CVI, Rev. B01.1 (6.4Mb) - Requires Installation of Keithley I/O Layer (KIOL-850)
6220/1 IVI Driver Rev. B01.1드라이버 622X-855B011 Install v2.7 of the Free Example Software for the Models 6220/6221. (UNSUPPORTED)
Install v2.7 of the Free Example Software for the Models 6220/6221.애플리케이션 6220-EXMPL-2.7 6220/6221 Firmware Revision A05
6220/6221 A05 Firmware Installation Package펌웨어 6221-801A05 622x Native LabView 2009 Driver version 1.0.0 - Project Style
6220 & 6221 Native LabView 2009 Driver version 1.0.0 - project style.드라이버 622X-LV-1.0.0 6220/6221 Firmware revision A04
6220/6221 Firmware revision A04펌웨어 6221-801A04
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FAQ FAQ ID How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221 How to configure the Model 6220/6221 and 2182A for Delta Mode?
The Keithley Models 6220 and 6221 Current Sources are designed to work with the Model 2182A Nanovoltmeter to measure very low resistances. A good method of doing this is called the Delta Method as described in the Keithley Low Level Measurements …783018
