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Ethernet Transmitter Test Application Software

TekExpress 10GBASE-T and NBASE-T Datasheet

TekExpress 10GBASE-T and NBASE-T Datasheet

The Ethernet Transmitter Test Application automates 10GBASE-T, NBASE-T, and IEEE802.3bz (2.5G/5G) physical medium attachment (PMA) physical-layer (PHY) electrical testing to provide a fast and accurate way of testing your Ethernet designs.

Features and benefits

  • Comprehensive automated solution for 2.5GBASE-T, 5GBASE-T and 10GBASE-T PHY testing
  • One-button selection of multiple tests and four-channel support
  • Detailed test reports with margin and statistical information aid analysis
  • User-defined mode enables flexible parameter control for characterization and margin analysis
  • Efficient test execution on oscilloscopes with instrument remote control
  • Single instrument analysis of time- and frequency-domain measurements
  • Signal acquisition and analysis support for differential probes or direct SMA cabling

Product description

Based on the TekExpress test automation framework, the Ethernet Transmitter Test Application performs all of the PMA electrical measurements as specified by the 802.3an standard, the 802.3bz standard, and the NBASE-T specification. This allows you to quickly and efficiently test Ethernet devices running at 2.5G, 5G, and 10G data rates.

To accurately make these measurements, the Tektronix TF-XGBT test fixture is also needed. The test fixture allows you to reliable and easily access the device under test (DUT) using either differential probes or matched SMA cables.

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Power spectral density measurement.

Test selection and instrument setup

Test selection is easy and straight-forward through the intuitive TekExpress workflow. Simply check the measurements you want to perform.

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For each measurement selected, the Ethernet Transmitter application will then automatically set up and configure the oscilloscope saving time and ensuring repeatable, reliable results.

As each test is performed, the application will also show you with detailed diagrams how to properly make the needed connections.

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Connection diagram

Reports

A summary report with Pass/Fail status for each test is created after the tests are complete. This report includes test configuration details, waveform plots, and margin analysis to provide more insight into your design.

TekExpress10GBASE T 30May2023
Pass/Fail report

Margin testing

You can also make changes to test limits and other test parameters in order to do margin analysis to see how well your device is performing.

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Droop configuration parameters

Differential single-ended acquisition support

The application allows signal acquisition and analysis with either matched-pair SMA cables or differential probes.

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Differential and single-ended support.

Return loss

The Ethernet Transmitter Test Application simplifies Return Loss testing and eliminates the need for a Vector Network Analyzer by using a patented oscilloscope-based measurement along with a Tektronix AWG. Calibration data for Open, Load, and Short can be stored in a file and recalled.

TekExpress10GBASE T 30May2023
Return loss

Complete programming interface

The programmatic interface seamlessly integrates the Ethernet Transmitter Test application with a high-level automation layer such as Visual Basic, MicrosoftNet, C#, C++, Python, or a Web application. This lets you control the state of the TekExpress application running on a local or a remote computer.

Programming examples are found in the application examples folder.

Prerecorded waveform

Prerecorded Waveform support will provide customers an option to use prerecorded waveforms when an oscilloscope is not available. This feature allows waveforms to be shared across multiple locations and removes end-user dependency from using scopes all the time.

TekExpress10GBASE T 30May2023
Prerecorded waveform

Specifications

10GBASE-T Measurements

The following tests are performed per the IEEE802.3-2012 standard. The device under test (DUT) must be able to provide the test mode signals as indicated in IEEE802.3-2012 Subclause 55.5.2.

Measurement Standard reference and Test mode
Maximum Output Droop IEEE802.3-2012 Subclause 55.5.3.1
Transmitter Timing Jitter - Master IEEE802.3-2012 Subclause 55.5.3.3
Transmit Clock Frequency IEEE802.3-2012 Subclause 55.5.3.5
Transmitter Timing Jitter - Slave IEEE802.3-2012 Subclause 55.5.3.3
Transmitter Linearity IEEE802.3-2012 Subclause 55.5.3.2
Transmitter Power Spectral Density (PSD) and Power IEEE802.3-2012 Subclause 55.5.3.4
Return Loss IEEE802.3-2012 Subclause 55.8.2.1
2.5GBASE-T and 5GBASE-T Measurements (requires NBASET option)

The following tests are performed per IEEE802.3bz/D3.3 draft standard. The device under test (DUT) must be able to provide the test mode signals as indicated in IEEE802.3bz/D3.3 Subclause 126.5.2.

Measurement Test mode
Maximum Output Droop IEEE80.bz/D3.3 Subclause 126.5.3.1
Transmitter Timing Jitter - Master IEEE80.bz/D3.3 Subclause 126.5.3.3
Transmit Clock Frequency IEEE80.bz/D3.3 Subclause 126.5.3.5
Transmitter Timing Jitter - Slave IEEE80.bz/D3.3 Subclause 126.5.3.3
Transmitter Nonlinear Distortion IEEE80.bz/D3.3 Subclause 126.5.3.2
Transmitter Power Spectral Density (PSD) and Power IEEE80.bz/D3.3 Subclause 126.5.3.4
Return Loss IEEE80.bz/D3.3 Subclause 126.8.2.1
NBASE-T Measurements (requires NBASET option)

The following tests are performed per the NBASE-T Physical Layer Specification. The device under test (DUT) must be able to provide the test mode signals as indicated in NBASE-T Physical Layer Specification version 1.1 Subclause 2.9.

Measurement Test mode
Maximum Output Droop Subclause 55.5.3.1, Test Mode 6
Transmitter Timing Jitter - Master Subclause 55.5.3.3, Test Mode 2
Transmit Clock Frequency Subclause 55.5.3.5, Test Mode 2
Transmitter Timing Jitter - Slave Subclause 55.5.3.3, Test Mode 1 and Mode 3
Transmitter Nonlinear Distortion Subclause 55.5.3.2, Test Mode 4, Tones 1-5
Transmitter Power Spectral Density (PSD) and Power Subclause 55.5.3.4, Test Mode 5
Return Loss Subclause 55.8.2.1, Test Mode 5

Ordering information

10GBASE-T
New instrument orders
Product Option Description
DPO/MSO70000 XGBT2 TekExpress Automated 10GBASE-T Solution
DPO7354C XGBT2 TekExpress Automated 10GBASE-T Solution
For users with existing DPO/DSA/MS070000C/D/DX/SX Series Oscilloscope or DPO7354C Oscilloscope
Product Option Description
DPO-UP XGBT2 TekExpress Automated 10GBASE-T Solution Upgrade
DPOFL-XGBT2 -

TekExpress Automated 10BASE-T Solution - Floating License

DPOFT-XGBT2 -

TekExpress Automated 10BASE-T Solution - Floating Trial

NBASE-T and IEEE802.3bz
New instrument orders
Product Option Description
DPO/MSO70000 NBASET TekExpress Automated NBASE-T and IEEE802.3bz Solution
DPO7354C NBASET TekExpress Automated NBASE-T and IEEE802.3bz Solution
DPO7254C NBASET TekExpress Automated NBASE-T and IEEE802.3bz Solution
For users with existing DPO/DSA/MSO70000C/D/DX/SX Series Oscilloscope or DPO7254C/DPO7354C Oscilloscope
Product Option Description
DPO-UP NBASET TekExpress Automated NBASE-T and IEEE802.3bz Solution Upgrade
DPOFL-XGBT2 -

TekExpress Automated NBASE-T and IEEE802.3bz Solution - Floating License

DPOFT-XGBT2 -

TekExpress Automated NBASE-T and IEEE802.3bz Solution - Floating Trial

Supported probes

Oscilloscopes For Droop, PSD, Linearity, Clock Frequency, Jitter-Master, and Jitter-Slave measurements For Return Loss measurement
DPO7254C/DPO7354C P6300 - Minimum of one and maximum of four required P6300 - Minimum of two required
TDP3500 - Minimum of one and maximum of four required TDP3500 - Minimum of two required
SMA Cables - Minimum of two required NA
DPO/DSA/MSO70000C/D/DX/SX Series P6300 - Minimum of one and maximum of four required P6300 - Minimum of two required
P7330, P7340A, P7350, P7360A, P7380A, and P7313 - Minimum of one and maximum of four required P7330, P7340A, P7350, P7360A, P7380A, and P7313 - Minimum of two required
TriMode Probes (P7504, P7506, P7508, P7513A, P7516, and P7520) - Minimum of one and maximum of four required TriMode Probes (P7504, P7506, P7508, P7513A, P7516, and P7520) - Minimum of two required
P7350SMA, P7380SMA, and P7313SMA - Minimum of one and maximum of four required NA
SMA Cables - Minimum of two required NA

Oscilloscope compatibility

10GBASE-T Recommended bandwidth
DPO7354C 3.5 GHz
DPO/DSA/MSO70000C/D/DX/SX Series ≥ 4 GHz

NBASE-T and IEEE802.3bz (2.5G and 5G)Recommended bandwidth
DPO7000C ≥ 2.5 GHz
DPO/DSA/MSO70000C/D/DX/SX Series ≥ 4 GHz

AWG compatibility (for Return Loss Measurements)

An AWG7122C is required to perform return loss measurements at all data rates.

IEEE 2.5GBASE-T Transmitter Nonlinear Distortion Test (Section 126.5.3.2)

When performing this test, the IEEE specification requires a 45 MHz sine wave to be injected. This is only required for 2.5GBASE-T. It is not required for 5GBASE-T. Supported signal sources are:

  • AWG5202 with option 250, 2HV and 2DC is recommended for NBaseT (2.5G/5G/10G) compliance testing.

The recommended power splitter is: PSPL5331.

TF-XGbt 10GBASE-T, NBASE-T, and IEEE802.3bz Transmitter Electrical test fixture

The TF-XGbt test fixture is required to perform all measurements and is designed to meet the test fixture requirements in each of the applicable specifications/standards.

TF-XGbt contains Quantity Description
Test fixture main board 1 Main test fixture consists of 3 sections, namely TC1, TC2, and TC3
Test fixture main board 1Test Fixture TC1: For Droop, Transmitter Timing Jitter - Master, Transmit Clock Frequency, Transmitter Linearity, Transmitter Power Spectral Density (PSD), and Power Level Compliance test measurements

Note: Includes SMA Male-to-Female Adapter × 8 and 50 Ω SMA Terminator × 8 mounted on the SMA connectors

Test Fixture TC2: Transmitter Timing Jitter – Slave compliance test measurement

Note: Includes SMA Male-to-Female Adapter × 2 mounted on the SMA connectors

Test Fixture TC3: Return Loss compliance test measurement

Note: Includes SMA Male-to-Female Adapter × 2 mounted on the SMA connectors

Test fixture calibration board 1 Test Fixture TC3A: For Return Loss calibration
RJ45 patch cord 2 0.08 meter, shielded RJ45 cable to connect the test fixture to the Return Loss calibration board and device under test
TekExpress10GBASE T 30May2023
TF-XGbt test fixture