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2450

Learn More Datasheet Manual
Products
SMU SourceMeter® série 2650 haute puissance de Keithley

Semi-conducteur de puissance GaN, SiC Test de panneaux solaires Études d'électromigration Caractérisation de la température de jonction des semiconducteurs

Compare models. Request a quote.
Dernière mise à jour : Wednesday, September 20, 2023
Products
Test Script Builder Keithley

Créez, modifiez, déboguez et gérez les scripts de test TSP pour les instruments compatibles TSP.

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Dernière mise à jour : Tuesday, October 29, 2024
Products
Traceur de courbe IV: mesurez les caractéristiques électriques avec précision

Recréez l'expérience utilisateur habituellement offerte par un traceur de courbe pour composants à deux terminaisons et tracez des caractéristiques en courant et en tension.

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Dernière mise à jour : Friday, May 24, 2024
Datasheet
2461 SourceMeter SMU Instrument

The Model 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips.

1KW-60288-2 | Date: Wednesday, August 09 2023
Technical Document
Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument

Source Measure Unit (SMU) instruments or SourceMeter® instruments can simplify making low resistance measurements with high current stimulus. A SourceMeter instrument is capable of sourcing and measuring both current and voltage.

1KT-60883-0 | Date: Friday, September 16 2016
Datasheet
Series 2400 SourceMeter SMU Instruments

Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as …

1KW-2798-4 | Date: Monday, October 07 2024
Videos, Webinars and Demos
Keithley 2651A High Current SourceMeter SMU Instrument Overview

| Date: Thursday, September 17 2015
Datasheet
2470 Graphical SourceMeter SMU Instrument Datasheet

1KW-61523-0 | Date: Wednesday, August 09 2023
Technical Document
Re-Inventing High Power Semiconductor Device Characterization

This selection guide provides the information you need to select the best hardware and software for your power device characterization requirements.

1KW-29154-0 (Keithley Number 3216) | Date: Wednesday, March 20 2013
Datasheet
ACS Wafer Level Reliability Edition Datasheet

Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …

1KW-56418-3 | Date: Monday, December 04 2023

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