SDH/PDH and Jitter/Wander Test Set

Characteristics

SDH Generator Output

Electrical Output -

Data Rates:

STM-0: 51.84 MBps

STM-1: 155.52 MBps

Data Formats:

STM-0E: B3ZS

STM-1E: CMI

Signal Level at Transmit Output:

STM-0E: ±1.0 V_pk ±10% into 75 Ohm

STM-0E: (-6 dB)

STM-0E output: attenuated with 6 dB cable loss (-12.7 dB square-root f characteristic cable)

STM-1E: ±0.5 V_pk ±10% into 75 Ohm

STM-1E(-6 dB): STM-0E output attenuated with 6 dB cable loss (-12.7 dB square-root f characteristic cable)

Pulse Shape at Transmit Output:

Meets ITU-T G.703 Pulse Masks.

Return Loss: >15 dB

Connectors:

Unbalanced BNC, 75 Ohm to ground.

Opt. 11: 1.6/5.6, 75 Ohm to ground.

Optical Output -

Data Rates:

STM-0: 51.84 MBps

STM-1: 155.52 MBps

STM-4: 622.08 MBps

Optical Module Options:

Opt. 01: Electrical only, STM-0/1E

Opt. 03: 1310 nm, IR, STM-0/1

Opt. 04: 1310 nm, IR, STM-0/1/4

Opt. 05: 1550 nm, LR, STM-0/1/4

Opt. 06: 1310/1550 nm, STM-0/1/4

Signal Level and Wavelength:

1310 nm: -10 dBm, typical (Opt. 03, 04, 06)

1550 nm: 0 dBm, typical, (Opt. 05, 06)

Pulse Shape:

Meets ITU-T G.957 Eye Pattern Masks.

Wavelength:

1308 nm, typical (Opt. 03, 04, 06)

1550 nm, typical (Opt. 05, 06)

Spectral Width:

1310 nm: <4 nm (Opt. 03, 04, 06)

1550 nm: <1 nm (Opt. 05, 06)

Laser Classification:

EN60825-1 (Class 1), 21CFR1000 (Class I)

Connectors:

User-selectable when ordering –

Opt. 31: FC-PC

Opt. 32: ST

Opt. 33: SC

Opt. 34: DIN

Other connector types - consult factory

SDH Signal Structure

Payload -

Payload Channel (AU):

Concatenated VC4-4c signal in STM-4

One active AU-3 in STM-0

One active AU-4 in STM-1

One active AU-4 in STM-4

(other 3 channels unequipped)

Unequipped Payload -

C2 byte is set to 00.

Bulk fill set to 00.

SDH Internal Pattern Generator

Patterns -

Bulk Fill in a selected AU channel.

(AU-3 or AU-4)

PRBS: 2⁹-1, 2¹⁵-1, 2²⁰-1, 2²³-1; All 1s, All 0s, 8-bit programmable word.

PRBS patterns can be inverted.

 

RSOH Orderwire - E1

RSOH User Byte - F1

MSOH Orderwire - E2

POH User Byte - F2

DCC Bytes - D1-D3

DCC Bytes - D4-D12

 

PRBS: 2¹⁵-1; 2²⁰-1; 2²³-1

PRBS patterns can be inverted.

Error Types and Insert Rates -

Single or Continuous.

 

RS BIP B1

STM-0: 1.0e-3 to 1.0e-10

STM-1: 1.0e-4 to 1.0e-10

STM-4: 1.0e-5 to 1.0e-10

MS BIP B2

STM-0: 1.0e-3 to 1.0e-10

STM-1/4: 1.0e-4 to 1.0e-10

Path BIP B3

STM-0: 1.0e-3 to 1.0e-10

STM-1/4: 1.0e-4 to 1.0e-10

HP-REI G1

STM-0: 1.0e-3 to 1.0e-10

STM-1/4: 1.0e-4 to 1.0e-10

Payload (Pattern Bit Error)

1.0e-3 to 1.0e-10

Defects -

LOS, LOF, LSS (Pattern Loss).

RS-TIM, MS-AIS, MS-RDI, AU-LOP, AU-AIS, HP-RDI, HP-TIM, HP-PLM, HP-UNEQ, LP-RDI, LP-RFI, LP-TIM, LP-UNEQ, LP-PLM, TU-AIS.

SDH Transmitter Clock

Internal Clock Accuracy - ±4.6 ppm, for instrument calibrated within 36 months

External Clock Reference -

Rates:

2.048 MBps ±50 ppm

2.048 MHz ±50 ppm

1.544 MBps ±50 ppm

Input:

Unbalanced, 75 Ohm, BNC connector

G.703 signal format

Recovered Clock:

Loop timing

Clock is recovered from received signal

Transmit Line Frequency-Offset Rate -

±100 ppm of nominal line rate

Resolution: 0.1 ppm

SDH Receiver Input

Electrical Input -

Data Rates:

STM-0: 51.84 MBps ±100 ppm

STM-1: 155.52 MBps ±100 ppm

Data Formats:

STM-0E: B3ZS

STM-1E: CMI

Signal Sensitivity/Equalization:

STM-0E: 0.5 V_pk min to 1.2 V_pk max

STM-0E -6 dB*¹: 0.25 V_pk min to 0.6 V_pk max

STM-0E -12dB*²: 0.125 V_pk min to 0.35 V_pk max

STM-0E Monitor: 20 dB of flat loss below -6 dB

STM-1E: 0.35 V_pk min to 0.6 V_pk max

STM-1E -6 dB*³: 0.35 V_pk min to 0.6 V_pk max

STM-1E -12 dB*⁴: 0.07 V_pk min to 0.3 V_pk max

STM-1E Monitor: 26 dB of flat loss below STM-1E level

*¹ -6 dB cable loss at 25 MHz (-12.7 dB square-root f characteristic cable)

*² -12 dB cable loss at 25 MHz (-12.7 dB square-root f characteristic cable)

*³ -6 dB cable loss at 78 MHz (-12.7 dB square-root f characteristic cable)

*⁴ -12 dB cable loss at 78 MHz (-12.7 dB square-root f characteristic cable)

Signal Level Display:

Readout for: Electrical signal level in mV

Return Loss: >15 dB

Connectors:

Unbalanced BNC, 75 Ohm to ground

Opt. 12 - 1.6/5.6, 75 Ohm to ground

Optical Input -

Data Rates:

STM-0: 51.84 MBps (±100 ppm)

STM-1: 155.52 MBps (±100 ppm)

STM-4: 622.08 MBps (±100 ppm)

Maximum Input Power:

-7 dBm: Opt. 05 and 06 include a 10 dB attenuator for use at 1550 nm

Operating Wavelength:

1310 nm and 1550 nm: 1100 nm to 1570 nm operating range

Signal Sensitivity: -28 dBm for BER <10^-10

Optical Power Meter Accuracy:

±2 dBm, typical: For input power in a range of -30 dBm to -6 dBm. Resolution 0.1 dBm.

Connectors:

User-selectable when ordering –

Opt. 31: FC-PC

Opt. 32: ST

Opt. 33: SC

Opt. 34: DIN

Other connector types - consult factory

Through Mode:

Monitors a selected channel while passing the signal through unchanged, both electrical and optical.

Section Overhead

Access -

Set overhead bytes to any value from binary 00000000 to 11111111: A1, A2, J0, E1, F1, D1 to D3, D4 to D12, K1, K2, S1, M1, E2.

View all Section Overhead bytes.

Clear text decode of S1 message byte provided per G.707.

Add/Drop -

Orderwire Access to E1 or E2 byte from RJ11 jack.

Insert data from the Overhead Add/Drop connector into the Section DCC, Line DCC, E1, E2, or F1 user byte.

Drops data from the Section DCC, Line DCC, E1, E2, or F1 user byte out to the Overhead Add/Drop connector.

PRBS evaluation is provided internally for bytes E1, E2, F1, F2, D1 to D3, D4, to D12.

K1 and K2 (APS) -

Set the APS Bytes, K1 and K2, to any code defined in ITU-G.783 Annex A and G.841.

Selectable by clear text for all Span and Ring messages.

Path Overhead

Access -

Set Path Overhead bytes to any value from binary 00000000 to 11111111: C2, G1 (bits 5 to 7 only), F2, H4 (bits 1 to 6 only), F3, K3, N1.

View all Path Overhead bytes.

Clear text decode of C2 signal label per ITU-G.707.

Path Label Mismatch (PLM) and Unequipped (UNEQ) detection.

Add/Drop -

Insert data from the Overhead Add/Drop connector into the F2 user byte.

PRBS can be used through F2 internally.

Trace Bytes J1, J0 -

J1 HP-Trace: VC4 Overhead - User-defined 15-byte with CRC, or 64-byte formats per ITU-T G.707.

J0 RS-Trace: User-defined 15-byte with CRC per ITU-T G.707.

Pointer Movement

Single - Single pointer justification.

Burst - Bursts of two to eight pointer justifications spaced four frames apart. All adjustments within a given burst are in the same direction. Subsequent bursts are in alternating directions.

Continuous - Pointer justifications occur continuously at a predetermined rate in an incrementing, decrementing, or alternating direction. Rate between movements: 2 ms to 10 s, with a resolution of 1 ms.

Set to Value - Set to a new location with or without the NDF being set. Range is 0 to 1023 (783 to 1023 are illegal locations).

Pointer Test Sequences

AU and TU Pointer sequences available:

G.783(a) Single Alternating

G.783(b) Regular + Double

G.783(c) Regular + Missing

G.783(d) Double Alternating

G.783(e) Single

G.783(f) Burst

G.783(g1) Periodic 87-3

G.783(g2) Periodic 87-3 With Add

G.783(g3) Periodic 87-3 With Cancel

G.783(h1) Periodic

G.783(h2) Periodic with Add

G.783(h3) Periodic with Cancel

Phase Transient Pointer Adjustment Burst.

Pointer Direction - Positive or Negative.

Initialization Period -

On or Off.

30-second burst of 1 pointer per second in the same direction as the selected test, per ITU-T G.783.

Cooldown Period -

On or Off.

This will last at least 60 seconds, for an integral number of complete sequences, per ITU-T G.783.

Combined Jitter -

Simultaneous PDH mapping frequency offset with ITU-T G.783 Pointer Sequences generation.

To enable the measurement of combined mapping and Pointer Jitter.

SDH Measurements

SDH Anomalies - Error Count, Error Rate, and Errored Seconds for: B1, B2, B3, TU Path BIP, Payload, MS-REI, HP-REI, LP-REI.

Network Defects (Seconds) - LOS, LSS (Pattern Loss), CTS Loss of AC Power.

SDH Defects (Seconds) - RS-TIM, MS-AIS, MS-RDI, AU-AIS, AU-LOP, HP-RDI, HP-TIM, HP-UNEQ, HP-PLM, LP-RDI, LP-RFI, LP-TIM, LP-UNEQ, LP-PLM, TU-AIS.

AU Pointer Measurements - NDF Sec., Illegal Sec., +Ve Just. Count, -Ve Just. Count, Illegal Count, NDF Count, Pointer Value.

G.826 Error Analysis -

RS B1, MS B2, Path B3, AU-LOP, AU-AIS, HP-REI, HP-TIM, HP-PLM, HP-UNEQ, LP-REI, LP-TIM, LP-UNEQ, TU-LOP, TU-AIS Seconds and ratio.

Errored Blocks, ES, %ES, SES, %SES, UAS, %UAS, CSES Periods, Background Block Errors, %Background Block Error, Path UAS, %Path UAS.

G.826 Performance Analysis -

Performance analysis performed as per user settable allocation percentage for SDH and PDH.

Regeneration Section, Multiplex Section, high- and low-order path layers are individually evaluated.

Analysis Results: Pass or Fail.

G.821 Analysis -

Pattern Bit Seconds and % of total time.

Error-Count, ES, DM, SES, UAS, EFS.

M.2101.1 Error Analysis -

B1, B2, B3, RS-TIM, MS-REI, MS-RDI, MS-AIS, AU-AIS, AU-LOP, HP-REI, HP-TIM, HP-UNEQ, HP-PLM, HP-RDI, LP-REI, LP-TIM, LP-UNEQ, LP-PLM, LP-RDI, LOS, OOF, TU-LOM, TU-AIS, TU-LOP, TU-BIP.

Errored Blocks, ES, %ES, SES, %SES, CSES, UAS, %UAS, Background Block Errors, %Background Block Error, Path UAS, %Path UAS.

M.2101.1 Performance Analysis -

Test Types:

BIS (Bring Into Service).

PAR (Performance After Repair).

MAINT (Maintenance).

Custom (User Controls Performance Limits).

Automated Test types allow Performance Analysis for Regeneration Section, Multiplex Section, high- and low-order path layers based upon user-settable allocation percentage.

Custom test type allows the user to select the performance objective limits.

Analysis Results:

Acceptable, Provisional/Degraded, or Unacceptable.

SDH Standards Compliance

SDH Framing - G. 707

SDH Multiplexing - G.707

SDH Optical Interfaces - G.957

SDH Electrical Interfaces - G.703

SDH Jitter Tolerance - G.825, G.958, O.172

SDH Pointer Sequences - G.783

SDH Error Analysis - G.826, G.821

SDH Performance Analysis - M.2101.1

SDH Test Patterns - O.181, O.150, O.151

SDH Availability Performance - G.827

CTS850 PDH/DS3 (45 MBps) Tributary Specifications

(Opt. 38 provides PDH Tributaries, Opt. 55 Provides 4DS3 - 45 MBps Mapping/Demapping function.)

2 MBps, 8 MBps, 34 MBps, 140 MBps, and 45 MBps Generator

The data format can be built upon the pattern generator framed or unframed output at the PDH line/mapping rate or upon multiple layers of user-configurable sub-multiplexing. A specific hierarchy of tributaries can be selected and filled with a background pattern.

Electrical Output -

Data Rates:

2 MBps (2.048 MBps)

8 MBps (8.448 MBps)

34 MBps (34.368 MBps)

45 MBps (44.736 MBps)

140 MBps (139.264 MBps)

Formats:

2 MBps, 8 MBps, 34 MBps: HDB3, AMI

45 MBps: HDB3, B3ZS

140 MBps: CMI

Signal Level:

2 MBps: 3 V_pk ±0.3 V into 120 Ohm balanced

2 MBps: 2.37 V_pk ±0.237 V into 75 Ohm

8 MBps: 2.37 V_pk ±0.237 V into 75 Ohm

34 MBps: 1 V_pk ±0.1 V into 75 Ohm

45 MBps:

DS3 High: 0.9 ±0.2 V peak into 75 Ohm

DSX3: 0.36 V to 0.85 V peak into 75 Ohm

140 MBps: 1 V_pk-pk ±0.1 V into 75 Ohm

Pulse Shape:

Meets ITU-T G.703 Pulse Masks

Connectors:

2 MBps: 3-Pin Siemens 120 Ohm

2 MBps, 8 MBps, 34 MBps, 45 MBps, 140 MBps: BNC 75 Ohm

PDH Output -

2 MBps:

Internal Pattern Generator

Configured from N × 64 Kbps

Drop from SDH TU12

Drop from demuxed 8 MBps and above

From 2 MBps input (through mode)

8 MBps:

Internal Pattern Generator

Muxed up from 2 MBps

From 8 MBps input (through mode)

34 MBps:

Internal Pattern Generator

Muxed up from 8 MBps

Drop from SDH TU3

Drop from demuxed 140 MBps

From 34 MBps input (through mode)

45 MBps:

Internal Pattern Generator

Drop from SDH TU3

From 45 MBps input (through mode)

140 MBps:

Internal Pattern Generator

Muxed up from 34 MBps

Drop from SDH VC4

From 140 MBps input (through mode)

2 MBps, 8 MBps, 34 MBps, 45 MBps, and 140 MBps Internal Pattern Generator

Framing -

2 MBps:

Unframed

N × 64 Kbps (with starting TS and range)

FAS (31 channel)

FAS + CRC4 (31 channel)

FAS + MFAS (30 channel)

FAS + CRC4 + MFAS (30 channel)

(G.704, G.737, G.732)

8 MBps:

Unframed

FAS (G.742)

34 MBps:

Unframed

FAS (G.751)

45 MBps:

Unframed

M13 (bulk filled)

C-Bit Parity (bulk filled)

140 MBps:

Unframed

FAS (G.751)

(for PDH Testing Line/Mapped)

Active Channel Patterns in selected measurement channels

N × 64 Kbps:

PRBS 2⁹-1 per O.153

PRBS 2¹¹-1 per O.152

PRBS 2¹⁵-1 per O.151

PRBS 2²⁰-1 per O.153

PRBS 2²³-1 per O.151

All the above may be inverted

All 1s

All 0s

TS Idle

1020 Hz audio tone

2, 8, 34, 45, and 140 MBps:

PRBS 2⁹-1 per O.153

PRBS 2¹¹-1 per O.152

PRBS 2¹⁵-1 per O.151

PRBS 2²⁰-1 per O.153

PRBS 2²³-1 per O.151

All the above may be inverted

All 1s

All 0s

Alternating 1/0

1 in 8

8, 16, and 24 bit

User-Selectable Pattern

Fill Patterns in background nonmeasurement channels

N × 64 Kbps 2 MBps:

TS Idle (55 H)

PRBS 2¹⁵-1

All 1s

All 0s

Alternating 1/0

8, 34, and 140 MBps:

PRBS 2¹⁵-1 per O.151

PRBS 2²⁰-1 per O.153

PRBS 2²³-1 per O.151

All of above may be inverted

All 1s

All 0s

Alternating 1/0

Errors - Single, Continuous, Burst (all are mutually exclusive and effective on active channels only)

Error Type -

CRC (2 MBps only):

Min. rate 1.0e-8, max rate 1.0e-4

Parity Bit Error (45 MBps Only):

P-Bit (M13, C-Bit)

CP-Bit (C-Bit)

REI (FEBE) (C-Bit)

Frame Burst (available on any ONE enabled multiplexed level)

(2, 8, 34, 45, and 140 MBps):

N < M < 1000

M = frame count

N = consecutive FAS Error count

Pattern Bit -

Alarm Insertion -

2 MBps:

AIS

RDI - NFAS bit 3 = 1

8 MBps:

AIS

RDI - FAS bit 11 = 1

34 MBps:

AIS

RDI - FAS bit 11 = 1

45 MBps:

AIS (set 1010...for information)

RDI (X-Bit = 0)

IDLE (set 1100...for information)

140 MBps:

AIS

RDI - FAS bit 13 = 1

TU12/TU3/VC4 Mapping

Mapping Signal Source for TU12, TU3, and VC4

Mapping mode -

Floating Asynchronous

TU12 Active Map Channel Selection -

Allows selection of any one of 63 TU channels or all TU-12s simultaneously

Remaining 62 TU channels are background

TU3 Active Map Channel Selection -

Allows selection of any one of 3 TU channels or all TU-3s simultaneously

Remaining 2 TU channels are background

140 MBps Active Map Channel Selection -

Into selected STM-1 VC4

TU Background Channels -

TU12 Background Channel Content:

When internal 2 MBps or 34 MBps generator is used:

PRBS: 2¹⁵-1 or Idle pattern (11010101)

When external source is used:

PRBS: 2¹⁵-1

TU Background Channel Framing:

Always unframed unless All TUs

TU3 Background Channel Content:

When internal 34 MBps generator is used:

VC3 is a bulk-filled pattern, Valid Pointer, and BIP

Bulk fill data is 01, 02, and 03 for TU3 #1, #2, and #3

TU Error Types (Single or Continuous) -

TU12 BIP-2

TU3 BIP-8

LP-REI

TU Defects -

TU AIS

LP-RDI

TU Loss of Pointer

LP-UNEQ

TU Loss of Multiframe

LP-PLM

LP-RFI

LP-TIM

Transmitter Clock

Transmit Line Frequency Offset -

Frequency offset rate:

2 MBps: ±100 ppm - nominal line rate

8 MBps: ±100 ppm - nominal line rate

34 MBps: ±100 ppm - nominal line rate

45 MBps: ±100 ppm - nominal line rate

140 MBps: ±100 ppm of nominal line rate

Resolution: 0.1 ppm

2 MBps, 8 MBps, 34 MBps, 45 MBps, and 140 MBps Receiver

Electrical Input -

Data Rates:

2 MBps (2.048 MBps), ±150 ppm

8 MBps (8.448 MBps), ±150 ppm

34 MBps (34.368 MBps), ±150 ppm

45 MBps (44.736 MBps), ±150 ppm

140 MBps (139.264 MBps), ±150 ppm

Formats -

2 MBps: HDB3, AMI

8 MBps: HDB3, AMI

34 MBps: HDB3, AMI

45 MBps: HDB3, B3ZS

140 MBps: CMI

Impedance -

2 MBps: 120 Ohm balanced

2 MBps Bridged: 1 kilohm balanced

2 MBps, 8 MBps, 34 MBps, 45 MBps, 140 MBps: 75 Ohm unbalanced

PDH Receive Signal Level -

ITU-T G.703 nominal pulse and signal level

Normal: Auto equalization of square-root f cable loss to ITU-T G.703 limits*¹

2 MBps Bridged: Auto equalization of square-root f cable loss to ITU-T G.703 limits*²

Protected Monitor Point -20 dB: -15 to -23 dB flat loss

Protected Monitor Point -30 dB: -23 to -31 dB flat loss

*¹ 2 MBps and 8 MBps square-root f cable loss = 6 dB max

*¹ 34 MBps and 140 MBps square-root f cable loss = 12 dB max

*² 2 MBps Bridged only specified for 120 Ohm-balanced cable

Connectors -

2 MBps: 3-Pin Siemens 120 Ohm

2 MBps, 8 MBps, 34 MBps, 45 MBps, and 140 MBps: BNC 75 Ohm

2 MBps, 8 MBps, 34 MBps, 45 MBps, 140 MBps Internal Pattern Receiver

Pattern Receiver Source -

N/M × 64 Kbps and 2 MBps:

2 MBps External

SDH TU12 Drop

Demuxed 8 MBps and above

8 MBps:

8 MBps External

Demuxed 34 MBps

34 MBps:

34 MBps External

SDH TU3 Drop

Demuxed 140 MBps

45 MBps:

45 MBps External

SDH TU3 Drop

140 MBps:

140 MBps External

SDH VC4 Drop

Framing -

N/M × 64 Kbps and 2 MBps:

Unframed

FAS (31 channel)

FAS + CRC4 (31 channel)

FAS + MFAS (30 channel)

FAS + CRC4 + MFAS (30 channel)

(G.704, G.737, G.732)

8 MBps:

Unframed

FAS (G.742)

34 MBps:

Unframed

FAS (G.751)

45 MBps:

Unframed

M13 (bulk filled)

C-Bit parity (bulk filled)

140 MBps:

Unframed

FAS (G.751)

CAS (Signaling in TS 16) -

Bits displayed: a, b, c, d

VFchan.: 1 to 30

Value displayed: 1 or 0

TU12/TU3/VC4 Demapping

Demapping TU12, TU3, and VC4 Signal Drop to:

Demapping mode -

Floating Asynchronous

TU12 Active Demap:

Channel Selection - Allows selection of any one of 63 TU channels

TU3 Active Demap (either 34 MBit/s or 45 MBit/s):

Channel Selection - Allows selection of any one of 3 TU channels

140 MBps Active Demap Channel from selected STM-1 VC4

TU Path Overhead

TU12 Path Overhead Access -

Set Path Overhead bytes to any value from binary 00000000 to 11111111:

N2 and K4

V5 control (----xxx-) (bits 5-7 only)

View all TU Path Overhead bytes

TU3 Path Overhead Access

Set Path Overhead bytes to any value from binary 00000000 to 11111111: (set G1 bits 5 to 7 only)

C2, F3, K3, N1 (H4 bits 1 to 6 only)

View all TU Path Overhead bytes

Path Label Mismatch (C2) and Unequipped Detection

TU3 Path Trace Byte J1 -

Send user-defined 15-bytes and CRC sequence or set to all "space" characters

View Path Trace J1

TU12 Path Trace Byte J2 -

Send user-defined 15-byte and CRC sequence or set to 00000000 (Null)

View Path Trace J2

TU Pointer Measurement

TU Pointer Interaction.

TU12, TU3, or AU4, but not at same time.

Single - Single pointer justification (increment or decrement).

Burst - Bursts of two to eight pointer justifications spaced four multiframes apart. All adjustments within a given burst are in the same direction. Subsequent bursts are in alternating directions.

Continuous - Pointer justifications occur continuously at a predetermined rate in an incrementing, decrementing, or alternating direction. Rate between movements: 48 ms to 10 s, with a resolution of 1 ms.

Set to Value -

Set to a new location with or without the NDF being set.

TU12 Range is from 0 to 1023 (140 to 1023 are illegal locations).

TU3 Range is from 0 to 1023 (783 to 1023 are illegal locations).

TU Pointer sequences available:

G.783(a) Single Alternating

G.783(b) Regular + Double

G.783(c) Regular + Missing

G.783(d) Double Alternating

G.783(e) Single

G.783(f) Burst

G.783(g1) Periodic 87-3

G.783(g2) Periodic 87-3 With Add

G.783(g3) Periodic 87-3 With Cancel

G.783(h1) Periodic

G.783(h2) Periodic with Add

G.783(h3) Periodic with Cancel

Phase Transient Pointer Adjustment Burst:

TU-3 Periodic 85-5

TU-3 Periodic 85-5 With Add

TU-3 Periodic 85-5 With Cancel

TU-12 Periodic 35-1

TU-12 Periodic 35-1 With Add

TU-12 Periodic 35-1 With Cancel

Pointer Direction - Positive or Negative.

Initialization Period -

On or Off.

30-second burst of 1 pointer per second in the same direction as the selected test, per ITU-T G.783.

Cooldown Period

On or Off.

This will last at least 60 seconds, for an integral number of complete sequences, per ITU-T G.783.

PDH and TU Measurements

PDH Error Count, Error Rate, and Error Seconds for -

FAS

CRC-4 (2 MBps only)

Pattern Bit

Code violation

DS3 Frame Bit Error, DS3 Parity (P-Bit), DS3 Parity (CP-Bit), DS3 REI(FEBE)

TU Error Count, Error Rate, and Error Seconds for -

TU12 BIP-2

TU3 BIP-8

LP-REI

PDH Defect Seconds for -

AIS

RDI

Loss of Sync Sequence (LSS)

Loss of Frame (FAS)

Loss of Signal

Loss of Power

DS3 AIS, DS3 RDI, DS3 IDLE

TU Defect Seconds for -

TU AIS

LP-RDI

LP-TIM

LP-RFI

LP-UNEQ

LP-PLM

TU-LOP

TU-LOM

TU Pointer Measurements

G.826 Analysis for TUs -

TU12 BIP-2, TU3 BIP-8, REI

Seconds and ratio

Errored Blocks, ES, %ES, SES, %SES, UAS, %UAS, CSES Periods, Background Block Errors, %Background Block Errors, Path UAS, %Path UAS, Verdict Analysis

TU3 BIP-8 and HP-REI -

Seconds and ratio

Errored Blocks, ES, %ES, SES, %SES, UAS, %UAS, CSES Periods, Background Block Errors, %Background Block Error, Path UAS, %Path UAS, Verdict Analysis

G.821 Analysis for PDH -

PDH Frame and CRC-4 Errors, Seconds and Ratio

Errored Blocks, ES, %ES, SES, %SES, UAS, %UAS, CSES period, BBE, %BBE, Path UAS, %Path UAS, Verdict Analysis

Payload (Pattern Bit Errors) -

Seconds and % of total time

Error-Count, ES, SES, UAS, EFS, DM

M.2100 Analysis for PDH -

In-Service Seconds and % of total time: ES, SES, UAS, EFS, Path UAS

Out-of-Service Seconds and % of total time: ES, SES, UAS, EFS, Path UAS

G.826 Analysis of PDH -

(Near End and Far End)

In service for selected rate*¹:

ES, %ES, SES, %SES, UAS, %UAS, CSES, Errored Blocks, Background Block Errors, %Background Block Error, Path UAS, %Path UAS

For remote-selected rate*¹:

ES, %ES, SES, %SES, UAS, %UAS, PUAS, %PUAS

*¹ (within channel(s) under test at all enabled MUX levels)

Verdict Analysis

PDH Standards Compliance

PDH Mapping/Demapping - G.707

PDH Line Interfaces - G.703

PDH Jitter Tolerance - G.823, G.824, O.172

PDH Error Analysis - G.821, G.826, M.2100

PDH Availability Performance - G.827

PRBS Test Patterns - O.151, O.152, O.153

Monitor Mode Levels - G.772

PDH Framing - G.704, G.737, G.732, G.742, G.751

CTS850 Opt. 14 Jitter and Wander Specifications

Jitter/Wander Generation

Meets or exceeds the requirements of ITU-T G.823, G.825, O.171. Exceeds requirements of ITU-T O.172.

Jittered Line Output - Sinusoidal modulation of transmit clock frequency, applicable to any SDH or PDH data rate, except 8 MBps (E2).

Jitter Frequency Range - 12 µHz up to 5.00 MHz.

Modulation Range - Modulation is selectable up to the following limits, which depend on the rate:

Jitter Amplitude Range - Up to 300 UI.

Wander Amplitude Range - Up to 100,000 UI.

*¹ When equipped with bulk fill payload.

Amplitude Accuracy -

±5% ±0.06 UI, at 622 MBps Line Output.

±5% ±0.04 UI, at 622 MBps Clock Output and 45 MBps Line Output.

±5% ±0.03 UI, for all other rates, Line or Clock Output.

Amplitude Resolution - 0.01 UI.

Frequency Accuracy - ±1%, below 1.00 kHz; ±5 ppm, above 1.00 kHz.

Frequency Resolution - Three decimal places.

Jittered Clock Output - Operates in addition to the jittered line output.

Output Level, typical -

0.8 V_pk-pk output (for all rates) is AC-coupled and terminated with unbalanced 75 Ohm.

2 MHz G.703 output is compliant with G.703 2048 kHz synchronization interface specifications.

Nominal Clock Rates - 2 MHz, 34 MHz, 140 MHz, 52 MHz, 155 MHz, 622 MHz, or 45 MHz. Can be set independently of transmit-line rate.

Connector - Rear-panel, unbalanced 75 Ohm BNC.

Jitter and Wander Analysis for SDH/PDH

Jitter Measurement

Peak-to-peak or RMS jitter measurement of the Clock or Line input. Meets or exceeds the requirements of ITU-T G.783, G.823, G.824, G.825, G.958, O.171. Exceeds requirements of new ITU-T O.172.

Jitter Measurements - Peak-to-peak Jitter (UI), Positive Peak Jitter (UI), Negative Peak Jitter (UI), Jitter Hit Seconds, Jitter Unlocked Seconds, RMS (UI).

Jitter Measurement Accuracy (Line Wideband) -

5% A ±0.035 UI (except 622 MBps).

5% A ±0.07 UI (622 MBps only).

Frequency Response - For f, HPI > 0 dB/decade, down to 0.1 Hz.

Timing Quality (Video Related Measurements) -

Pointer Event Seconds, Current Frequency Drift Rate (ppm/s), Maximum Frequency Drift Rate (ppm/s).

Current Frequency, Maximum Frequency, Minimum Frequency.

Normal and Extended Jitter Measurement Resolution and Range -

Normal Resolution: 0.005 UI. Resolution is 0.1 UI for Fullband (0.1 Hz Highpass). Resolution for RMS is 0.001 UI_RMS.

Extended Resolution: 0.01 UI, except fullband 0.1 Hz, 0.1 UI.

Input Phase Tolerance - Input phase tolerance exceeds 300 UI_pk-pk, to accommodate worst-case tributary pointer jitter, exceeding requirements of new O.172.

ITU-T Conformance Tests -

Built-in conformance tests automatically execute jitter/wander tests according to the relevant standards for equipment and network interfaces.

Output Jitter: ITU-T G.823, G.824, G.825.

Input Jitter Tolerance: ITU-T G.823 (Standard and National), G.824, G.825, G.958 (Type A/ B).

Jitter Transfer Function: ITU-T G.735, G.751, G.752, G.958 (Type A/B).

Pointer Jitter : ITU-T G.783.

Range - See graph.

Where values are specified by rate in the table below:

Fixed Error (Intrinsic) Noise with Clock, Typical

For extended range, fixed error shall be less than or equal to 0.1 UI plus the value listed above.

For RMS measurements, fixed error shall be less than or equal to 0.01 UI_RMS at all rates.

Fixed Error (Intrinsic) Noise with PRBS Data Signal, Typical

For extended range, fixed error shall be less than or equal to 0.1 UI plus the value listed above.

For RMS measurements, fixed error shall be less than or equal to 0.01 UI_RMS at all rates.

Jitter Measurement Accuracy - Jitter measurement accuracy is a function of the modulation frequency and the highpass filter chosen. Measured jitter frequency response is expressed by the equation below, where f_LC is the lower cutoff frequency and f_UC is the high-frequency cutoff (defined in table following). Passband is from f_LC to f_UC. Uncertainty = ±5% A ±fixed error, where A is the actual jitter at the input.

Input Phase Tolerance - Input phase tolerance exceeds 300 UI_pk-pk, to accommodate worst-case tributary pointer jitter, exceeding requirements of new O.172.

Jitter Measurement Function Frequency Response -

Measurement function meets the requirements of new ITU-T O.172 (supports ITU-T G.783, G.823, G. 824, G.825, G.958, etc.).

Lower cutoff (highpass) is first order (-20 dB/decade). For E1, E3, and E4, this response is 20 dB/decade down to less than 0.1 Hz in wideband mode. Upper cutoff (lowpass) is third order (-60 dB/decade).

Cutoff frequencies are ±10% except E1 (2 MBps) is +100%/-10%.

Frequency Cutoff Values

Jitter Clock Input - Input to measure jitter on a clock signal.

Nominal Clock Rates: Any supported SDH or PDH rate, except 8 Mbps (E2). Rate is independent of the receive line rate.

Frequency Tolerance: Nominal rate ±100 ppm.

Input Amplitude: 0.4 V_pk-pk minimum, 1.5 V_pk-pk maximum amplitude.

Connector: Rear-panel, unbalanced 75 Ohm BNC.

Jitter Output - Demodulated jitter from the receiver. The output is filtered by any measurement filters selected.

Connector: Rear-panel 50 Ohm BNC.

Sensitivity, typical:

Normal measurement range: 100 mV/UI.

Extended measurement range: 2.65 mV/UI.

Output Level, typical: ±1 V, centered at 0 V ±100 mV.

Accuracy: ±10%, in addition to measurement inaccuracy.

Lock Time -

<10 seconds wideband or highband or fullband (10 Hz) highpass filter.

<30 seconds fullband, 1.0 Hz highpass filter.

<60 seconds fullband, 0.1 Hz highpass filter.

Wander Measurements

Supports ITU-T G.813, G.812, ETS300 462-n and O.171. Exceeds requirements of O.172.

Peak-to-Peak Wander, TIE (Time-Interval Error)/MTIE, TDEV, Current Frequency, Maximum Frequency, Minimum Frequency.

TIE Accuracy - 0.5%

MTIE Algorithm - 0.5%

TDEV Accuracy - 0.5%

TIE Range - ≥2.1 * 1017 ns

Jitter Frequency Range - 12 µHz up to 5.00 MHz

Peak-to-Peak and TIE Measurement

Sample Rate: 50 Hz

Anti-alias filter: 10 Hz ±10% first order roll-off, according to O.172

Resolution: 0.3 ns or better

MTIE Measurement

Sample Rate: 50 Hz

Anti-alias filter: 10 Hz ±10% first order roll-off, according to O.172

Resolution: 0.3 ns or better

TDEV Measurement

Sample Rate: 50 Hz

Anti-alias filter: 10 Hz ±10% first order roll-off, according to O.172

Resolution: 0.3 ns or better

ITU-T Conformance tests -

Built-in conformance tests automatically execute jitter/wander tests according to the relevant standards for equipment and network interfaces.

Input Wander Tolerance: ITU-T G.823 (Standard and National), G.824, G.825, G.958 (Type A/B).

Timing Quality (Video Related Measurements) -

Current Frequency, Maximum Frequency, Minimum Frequency, Frequency Drift Rate

ITU-T JITTER/WANDER STANDARD CONFORMANCE TESTS

Built-in conformance tests automatically execute jitter/wander tests according to the relevant standards for equipment and network interfaces.

Conformance tests use the selected data or clock input/output signals and then automatically choose the correct test signal format, adjust parameters as needed, and display the test results in graphical and/or text format.

Default test parameters are provided and are selectable/adjustable by the user.

Test Results

Results may be stored to floppy disc or printed to printer and/or floppy disc (BMP format).

Graphical results have interactive cursors for value readout, plus tabular reporting of results.

Standard specification limits are displayed for pass/fail determination.

Output Jitter

Range: 0 to 300 UI_pk-pk; refer to Jitter Measurement specification.

Test: Measures wideband and highband jitter over default measurement interval of 60 sec (selectable 1 sec to 99 days).

Results: Output jitter (UI_pk-pk) with specification limits.

Input Jitter/Wander Tolerance

Range: 0 to 2x tolerance mask specification; refer to Jitter/Wander Generation specification.

Test: Measures tolerance to jitter/wander at a number of frequencies (selectable 6 to 48) over a range of frequency (selectable from 12 MHz to 5 MHz); onset of errors or 1 dB power penalty technique.

Results: Input jitter/wander tolerance graph with specification limit mask or tabular report.

Jitter Transfer Function

Range: +3 to -50 dB, resolution 0.01 dB

Accuracy (typical): ±0.05 dB

Noise floor (typical): <-60 dB rel. 1 UI

Test: Measures jitter transfer function at a number of frequencies (selectable 6 to 48) over a range of frequency (selectable from 12 MHz to 5 MHz); systematic errors are reduced by an automatic calibration cycle and intrinsic noise is reduced using correlation analysis (which provides superior performance than conventional narrowband filter techniques)

Results: Jitter transfer function graph with specification limit mask or tabular report

Pointer Jitter

ITU-T conformance: G.783

Range: 0 to 300 UI_pk-pk; refer to Jitter Measurement specification

Pointer test sequence: refer to Pointer Sequence Generation specification

Test: Measures wideband and highband PDH jitter while pointer sequence executes; includes initialization, cool-down phases, and an integral number of test sequences, as defined in ITU-T G.783; automatically synchronizes measurement interval with pointer anomalies

Results: Wideband and highband pointer jitter (UI_pk-pk) with specification limits

Real-Time Wander Analyst Software for CTS850

Real-Time Wander Analyst software works in conjunction with the Tektronix CTS850 or SJ300E test sets. The software provides full wander TIE, MTIE, and TDEV analysis according to the most recent ITU-T, ETSI, ANSI, and Bellcore standards. The Windows-compatible PC software uploads TIE wander measurement data from the test set at a sampling rate of 50 Hz (in accordance with ITU-T and ETSI requirements), stores the data at a rate of 50, 1 or 0.1 Hz (selectable) and simultaneously calculates MTIE and TDEV using efficient algorithms.

In addition to the ITU-T and European ETSI specifications, real-time Wander Analyst also includes a full suite of North American SONET and ANSI specification limits. The software provides a hi/lo envelope TIE plot to show transients, full zoom control using cursors, and calculates frequency offset and drift rate in accordance with ANSI-approved methodology. Results can be easily transferred to other Windows applications for report documentation.

• TIE, MTIE, and TDEV wander analysis
• Calculation and display of frequency offset and drift rate from TIE data
• SDH and SONET compatible
• Windows 95/98/NT compatible
• Comprehensive support for new, revised, and draft ITU-T, ETSI, ANSI, and Bellcore wander specifications
• Automatic mask testing for easy conformance test documentation
• Interactive use for design verification and performance assessment
• Flexible TIE data acquisition and storage control
• Efficient algorithms for speedy calculation of MTIE and TDEV

SDH/SONET Compliance Test

MTIE and/or TDEV SDH/SONET test specification masks according to:

Primary Reference Clock -

PRC, ITU-T G.811, and ETS 300 462-6

PRS, GR-2830 CORE

Wander generation, Wander output, Phase transient

Slave Clocks -

SSU, ITU-T G.812 Type I, ETS 300 462-4

Clock, ITU-T G.812 Type II, Type III

Clock, ITU-T G.812 Type IV

Clock, ITU-T G.812 Type V, Type VI

Clock, GR-1244-CORE

Wander generation; Wander tolerance; Noise transfer; Transient response

SDH/SONET Equipment Clock -

SEC ITU-T G.813 Opt. 1, ETS 300 462-5

SEC ITU-T G.813 Opt. 2

SMC, GR-253-CORE

Wander generation; Wander tolerance; Noise transfer; Transient response

SDH/PDH and Sync Network Interface -

SDH and PDH Sync Network, ETS 300 462-3

PRC; SSU; SEC equipment and PDH distribution output

SDH and PDH Transport Network, ETSI DEN/TM 3067

2, 34, and 140 MBps output wander

SONET and Sync Network Interface -

SONET Sync Network, ANSI T1.101

SONET Network, ANSI T1.105.03

SONET Network, ANSI T1.105.09

DS3 Metallic Interface, T1.404

HDSL Network -

HDSL Network, ETS 152

Output wander

Real-Time Wander Analyst Software

Test Set Requirements - CTS850 Opt. 14 must be installed, System Software Version 2.18 or higher

Recommended PC Requirements -

Processor: Pentium - Class 90 MHz or faster

Operating system: Windows 95/98/NT

Memory: 16 MB minimum

Hard disk: 2.5 MB + Data Storage

TIE Data Acquisition and Storage -

Using RS-232 or GPIB interfaces

50 Hz rate: 1.4 MB/hour

1 Hz rate: 28.8 Kb/hour

0.1 Hz rate: 2.88 Kb/hour

Measurement duration: 10 to 109 seconds

Software Processing Functions -

MTIE and TDEV calculation: done during TIE data acquisition or postacquisition

TIE display: sample or hi/lo envelope

Frequency offset and drift rate: in accordance with ANSI T1.101 over a fixed or sliding window with user-definable bandwidth

Remove frequency offset (for measurement of RTIE and MRTIE parameters)

Graph scaling: automatic or manual, with zoom, cursors

Documentation: print, clipboard copy

LEDs

SDH Status Indicators -

LOS, LOF, OOF, LOP, MS-AIS, MS-RDI, AU-AIS, HP-RDI, Signal Present, Pattern Lock, LSS, Error, Pointer Adj

SDH Histograms -

Error Count (General), B1, B2, B3, MS-REI, HP-REI, Pattern Bit, Pointer Jitter

Defects: On/Off

LOS, OOF, LOF, AU-LOP, MS-AIS, HP-RDI, AU-AIS

Pattern Loss, Loss of Power

Pointers: AU Pointer Value, Pointer Justification

Measurement Utilities -

Measurement Control

Manual Start/Stop

Timed: 1 s to 99 days with 1 s resolution

Continuous

Histogram Display Resolution

High: 1 sec (displays 2 hours with 1 sec resolution)

Normal: 1 min, 5 min, 15 min, 1 hour (displays 5 days with 1 min resolution)

Low: 15 min, 60 min, 4 hrs, 12 hrs (displays 75 days with 15 min resolution)

Result Logging -

All measurements are recorded with start, stop time, and date

The current and previous results are stored in memory both totalized and graphical

Both graphical and totalized results can be stored on a disk

PDH and TU Status Indicators -

TU-AIS

PDH AIS

LP-RDI

PDH RAI

Histograms for PDH and TU -

Error Count (General)

E1 Defects

TU-BIP, LP-REI

Pattern Bit, Pointer Jitter

PDH and TU Defects -

On/Off

LOS, LOF, PDH-AIS, PDH-RAI, TU-LOP, TU-AIS, LP-RDI, TU-LOM, Pattern Loss, Loss of Power

TU Pointers - TU Pointer Value, Pointer Justification

Utilities

TroubleScan - Scans all measurement results for key violations

AutoScan -

AutoScan to incoming signal (rate, mapping, framing, and pattern)

Identifies incoming signal and presents graphical display of AU and TU structure

Identifies TU signal status and PDH mux structure by showing TU number, equipped versus unequipped, alarms, and pattern

Stored Setups -

5 front-panel setups in memory

200 front-panel setups per disk

Pass/Fail Tests -

Predefined Pass/Fail Tests can be created, stored, and executed

Pass/Fail tests are stored on disk

200 Pass/Fail test setups per disk

Add/Drop Interface for -

Data Communication Channels and User Channels.

A DB-37 female connector provides the interface to an external protocol analyzer. Clock and data signals are differential TTL, conform to V.11 specifications and are also compatible with single-ended TTL signals.

Add/Drop: D1-D3, D4-D12, F1, F2, E1, E2

Connector: 37-Pin DIN (DTE and DCE)

RJ11-style handset jack for access to E1/E2 bytes

Triggering -

Pulse at start of each SDH frame, (Tx and Rx)

Connector: 37-Pin DIN

Error Output - B1, B2, B3 bit error selectable

Disk Drive -

3.5 inch, 1.44 MB, DOS compatible

Measurement Results

Stored Setups and Pass/Fail Tests

Printer -

Printer support: Epson, HP Thinkjet, ASCII text

Serial Printer Port: V.24

Print to disk: BMP format, Interleaf format, Encapsulated PostScript, ASCII text

Computer Interface -

IEEE-488.2 interface

RS-232-C interface (DB9)

Help Mode - Online task-oriented help

Display -

7-inch diagonal CRT, green phosphor

Resolution: 640 × 480 pixels

VGA output: 15-Pin connector

Environmental Specifications

Temperature -

Operating: 0 °C to +40 °C

Nonoperating: -40 °C to +70 °C

Altitude -

Operating: 4,572 m (15,000 ft.)

Nonoperating: 12,192 m (40,000 ft.)

Humidity -

Operating:

To 95%, relative humidity at or below +40 °C for 2 hours or less

To 90%, relative humidity at or below 30 °C, continuous

Transportation Handling - Qualifies under National Safe Transit Association 1s Preshipment Test; 1A-B-1

Physical Characteristics

Power Requirements

Certifications and Compliances

EC Declaration of Conformity - EMC.

Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility. Compliance was demonstrated to the following specifications as listed in the Official Journal of the European Communities:

 

EN 55011:

Class A Radiated and Conducted Emissions.

Australia and New Zealand Declaration of Conformance for EMC:

Meets Intent of Australian EMC Framework. Compliance demonstrated to standard AS/NZS 2064.1/2.

EN 50082-1 Immunity:

IEC 801-2, Electrostatic Discharge Immunity.

IEC 801-3, RF Electromagnetic Field Immunity.

IEC 801-4, Electrical Fast Transient/Burst Immunity.

IEC 801-5, Power Line Surge Immunity.

FCC Compliance:

Emissions comply with FCC Code of Federal Regulations 47, Part 15, Subpart B, Class A Limits.

European Union Compliance:

Low-Voltage Directive 73/23/EEC, Amended by 93/68/EEC. EN 61010-1, Safety requirements for Electrical equipment for measurement, control, and laboratory use.

Additional Compliance -

ANSI/ISA S82.02.01: Safety standard for Electrical and Electronic Test, Measuring, Controlling, and Related Equipment.

IEC1010-1: Safety Requirements for Electrical Equipment for Measurement, Control, and Laboratory Use.

Approvals -

U.S. Nationally Recognized Testing Laboratory Listing.

UL3111-1: Standard for Electrical and Electronic Measuring and Test Equipment.

Canadian Certification -

CAN/CSA-22.2 No. 1010.1: Safety requirements for Electrical and Electronic Measuring and testing Equipment.

Safety -

UL3111-1, CSA1010.1, EN61010-1, IEC61010-1.

Operating temperature: +5 to +40 °C.

Max. Operating altitude: 2000 m.

Relative Humidity (maximum operating) 80% for temperatures up to 31 °C, decreasing linearly to 50% at 40 °C.

Equipment Type: Test and measuring.

Safety Class: Class I, as defined in IEC 1010-1, Annex H) - grounded product.

Overvoltage Category: CAT II, (as defined in IEC1010-1, Annex J).

Pollution Degree: Pollution Degree 2, (as defined in IEC 1010-1). Note: rated for indoor use only.

Laser - EN60825 (class 1), 21 CFR 1000 (class I).