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You're Invited! Booth #1507
Join us at IEEE Applied Power Electronics Conference, March 16-20, at the Georgia World Congress Center. Visit our booth #1507 to experience the latest power testing solutions, as you connect with our experts.
Schedule a personal meeting to discuss your specific application. We look forward to seeing you there.
Explore Solutions
- Ensure Accurate, Repeatable Double Pulse Testing for SiC and GaN Designs
- Flexible Turnkey Double Pulse Testing Systems
- Optimize SiC Device and Gate Drive with Side-by-Side Benchmarking
- Simplify Battery Testing with a Turnkey Solution
- Versatile High-power Bidirectional Triples
- Space-saving Scalable High-Power Testing
- Expand 3-Phase Analysis with Automated Inverter and Drive Measurements
Explore Our Showcased Solutions
You’ll find three Tektronix powered double pulse testing solutions at APEC this year, including oscilloscope double pulse testing analysis software and a turnkey double pulse test system offered by our partners, PE Systems at Booth #1507. In addition, our valued customer, Wolfspeed, will be demonstrating how to optimize SiC designs with side-by-side benchmarking at their Booth #1811.
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Ensure Accurate, Repeatable Double Pulse Testing for SiC and GaN Designs
- Meet JEDEC and IEC standards with integrated oscilloscope software
- Make high-bandwidth gate and drain current measurements with our new isolated shunt probe
- Make isolated high-side gate voltage measurements
- Measure switching losses accurately with our patented deskew algorithm
- Measure Dynamic RDS(on) without external clamping
- Automatically generate gate driver double pulse signal
Flexible Turnkey Double Pulse Testing Systems
- Modules, discrete silicon, SiC and GaN – one tester for all devices
- Fast setup times via test code
- Test voltage up to 2 kV and current up to 3.6 kA
- Compatible with existing infrastructure
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Optimize SiC Device and Gate Drive with Side-by-Side Benchmarking
- Identify gate drive levels to remain in device safe operating area
- See how Wolfspeed’s Gen 4 technology minimizes switching loss
- Quantify switching losses with integrated JEDEC compliant analysis
- Make high-bandwidth Vds, Vgs, and Ids measurements
Simplify Battery Testing with a Turnkey Solution
- Simplify battery testing with a turnkey solution, featuring integrated software and an intuitive touchscreen
- Achieve unmatched power density with up to 300 kW in a 42U rack, 2,400 A per rack, all in just 6.5 sq ft of space.
- Minimize down-time with a modular design and easily swappable units
- Easily reconfigure or scale testing, ensuring flexibility to meet evolving battery technology needs
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Versatile High-power Bidirectional Triples
- Maximize performance with three isolated DC channels, each up to 10 kW, supporting up to 920 V or up to 340 A
- Consolidate multiple testing setups into one, reducing cost, equipment needs and test time
- Program and get your data faster with greater than 1 ms response time
- Deliver full power across a wide operating range with autoranging, which automatically adjusts voltage or current to handle diverse combinations with a single unit
- Boost efficiency with 96% energy recovery through DC load functionality
Space-saving Scalable High-Power Testing
- Get the highest bidirectional power density on the market – 60 kW in 6U
- Save space with 360 kW of power from only 6.5 sq ft of floor space
- Scale up to 3.84 MW of bidirectional power with 11 combined racks
- Deliver maximum power across wider voltage and current ranges with autoranging
- Cut costs with >96% energy recovery efficiency
- Configure high-performance systems with fewer devices
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Expand 3-Phase Analysis with Automated Inverter and Drive Measurements
- Perform detailed electrical and mechanical measurements for analysis of 3-phase inverters and motor drives
- Get quick reliable test setups with stable triggering and phasor diagrams
- Go beyond volts and amps with efficiency, harmonics, DQ0, torque and speed measurements
- Document dynamic behavior with measurement trend plots
- Stream waveform data simultaneously from multiple instruments and analyze together with multi-scope support in TekScope PC
Come Hear Tek Experts
Date | Presentation | Time | Location |
March 18, 2025 | Improving Power System Performance and Power Integrity using Time Domain Reflectometry (TDR) | 8:30 – 8:55 AM ET | Level Four, A404/A405 |
March 18, 2025 | Smart Motors: Harnessing Sensor Data and AI for Predictive Maintenance | 8:55 AM – 9.20 AM ET | Level Four, A404/A405 |
Don’t forget to schedule a personal meeting to discuss your specific application. We look forward to seeing you there.