Clarius LPDDR4 Tx Compliance and Debug Solution

LPDDR4 has become the engine driving the ever-evolving world of mobile technology. Its ability to deliver high bandwidth for data-intensive applications while maintaining low power consumption makes it the ideal choice for powering smartphones, tablets, laptops, and other portable electronics. However, ensuring flawless performance and reliable operation on these advanced mobile devices requires robust testing and validation tools.

The Tektronix Clarius compliance LPDDR4 application empowers engineers to navigate the complexities of LPDDR4 memory testing with confidence. This comprehensive solution streamlines workflows, automates complex test procedures, and verifies JEDEC compliance-all without requiring specialized LPDDR4 expertise. The Clarius compliance LPDDR4 application empowers you to bring high-performance, reliable LPDDR4 products to market faster, delivering the seamless user experience that today's mobile innovations demand.

The Clarius platform, a next-generation compliance test automation software, simplifies LPDDR4 testing through several key features:

• High asset utilization and faster test times-disaggregated architecture to offload analysis from the oscilloscope.
• Easy workflow integration: leverage REST APIs and SDK for faster automation.
• Unified user-interface for all technology standards across transmitter and receiver test validation.
• Integrated data management for results, reports, and waveforms in the UI, along with a dashboard view.

Key features

• Supports 109 measurements of LPDDR4 System Transmitter Tests as per LPDDR4 JEDEC specification:
  • 18 Clock differential measurements
  • 15 Clock single ended measurements
  • 26 Write burst differential measurements
  • 19 Write burst single ended measurement
  • 19 Read burst differential measurements
  • 12 Address command measurements
• The user-defined acquisition mode enables users to conduct application measurements by adjusting the oscilloscope settings, such as sample rate, record length, bandwidth, and other parameters, according to their preferences and requirements mode for all scenarios.
• Retain Vertical Scale setting supported during acquisition for all scenarios.
• Custom limit support for all tests.
• Supports all the data rate as per JEDEC.
• Custom Data Rate support up to 15000 MT/s.
• De-embedding support for all measurements.
• Supports multi-run feature for all measurements.
• Time to Test : The user can perform multiple JEDEC measurements on multiple edges, multiple Read or Write bursts with a single acquisition.
• Enables to capture long extensive record lengths, identify Read and Write bursts automatically and perform multiple measurements on entire record length and perform statistical analysis.
• Zoom to the worst-case region of the waveform for measurements.
• Easy to use measurement configuration allows the adjustment of test parameters for tests by group to save time over configuring each measurement individually.
• Test report to reflect all the statistics of the measurement
• The user can customize the signal selection in the 'Source and Signal' panel, allowing flexible test bench workflows.
• Multiple Burst Detection Methods are supported: Read and Write, Write only, and Read only.
• Support for tDQ2DQ measurement with multiple DQs.
• Support for simultaneous differential and single-ended Write Burst measurements for up to 32 DQs.
• Support for simultaneous Address Command measurements for up to 8 CAs.
• Auto and manual support for calculating Vcent-DQ and Vcent-CA.

Applications

Tektronix provides the most comprehensive solutions to serve the needs of engineers designing DDR silicon for server, computer, graphics systems, mobile, and embedded systems, as well as those validating the physical layer compliance of the DDR Memory Compliance Test Specification.

The LPDDR4 applications are compatible with Tektronix DPO/MSO70000 series oscilloscopes that are designed to meet the challenges of the next-generation memory standards. These oscilloscopes provide the industry’s leading vertical noise performance with the highest number of effective bits (ENOB) and flattest frequency response for oscilloscopes in their class.