Veranstaltungen

Presenteremo il nuovo approccio denominato "SpectrumVu" di Tektronix, di come questo si basi sulla flessibilità offerta dalla tecnologia proprietaria Flexchannel di Tektronix e di come le nuove macchine siano in grado di supportare in modo rapidissimo l'analisi multicanale.

Tektronix presenta alcune novità in ambito sonde che possono essere estremamente interessanti sia per chi si occupa di power integrity sia per chi si occupa di signal integrity su linee seriali ad alta velocità.

Oscilloscopes are designed to faithfully measure various signal parameters, but they are only one part of the measurement system. In the means of getting the signal accurately from the device under test (DUT) to the oscilloscope input, the use of a suitable probe is essential. Even though the probe selection is the last consideration, that we usually take for granted, it vitally affects the fidelity of the entire measurement system. The result can be wrong or misleading measurements. Solely connecting a probe to a single test point can affect the behaviour of your PCB design, so that an oscilloscope would only see the distorted version of the actual signal. Thus ensuring a minimum impact on the probed circuit is imperative. In essence, the probe is the first link in the measurement chain and the fidelity relies as much on the probing as the oscilloscope.

Precision DC parameters are crucial for you? A SMU is perfect choice.
Need to overcome special transitional conditions? Some models have a 1 MSa digitizing ADC for fast signal sampling (use it as an oscilloscope).
Multiple SMU channels can be utilized as a Parametric Semiconductor Test System for characterization, verification and optimization of electrical components.
Need to implement automated test scenarios in easy way? Design a complex measurement flow with data analysis using embedded Test Script Language.

Do you really need a spectrum analyzer for your frequency response analysis? Couldn’t you just use the oscilloscope that you use every day?
In this webinar you will learn basics about Frequency Response Analysis and which solutions you have in order to do it. We will focus on the oscilloscopebased solution.

This on-demand webinar will provide an overview of the methods for solving some of the new test and measurement receiver challenges for PCIE® 4.0 at 16.0 GT/s and PCIE 5.0 at 32.0 GT/s.

In this live event, our application expert you will have an overview of how to use Unique Triggers to debug the complex EW / Radar system, Pulse Measurements and Stress testing of Rx.