Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer

This application note describes how to use the 4200A-SCS Parameter Analyzer to perform a wide range of measurements, including DC and pulsed current-voltage (I‑V), capacitance-voltage (C‑V), capacitance-frequency (C-f), drive level capacitance profiling (DLCP), four-probe resistivity, and Hall voltage (VH) measurements on photovoltaic cells.