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TekExpress PCI Express Transmitter Compliance and Validation Software Application Help

Application Help for DPS-DPO-DSA-MSO70000-C, D, DX, and SX Oscilloscopes

This document provides the operating instructions for the TekExpress PCI Express Transmitter Compliance and Validation Software Application, for DPS/DPO/DSA/MSO70000C, D, DX, SX Series Oscilloscopes.


Это руководство относится к следующему:

DPO77002SX, DPS77004SX, DPS75904SX, DPS75004SX, DPO75002SX, DPO73304SX, DPO72304SX, DPO71604SX, DPO71304SX, DPO73304DX, MSO73304DX, DPO72504DX, MSO72504DX, DPO72304DX, MSO72304DX, DPO73304D, DSA73304D, DPO72504D, DSA72504D, DPO72004C, DSA72004C, MSO72004C, DPO71604C, DSA71604C, MSO71604C, DPO71254C, DSA71254C, MSO71254C, DPO70804C, DSA70804C, MSO70804C, DPO70604C, DSA70604C, MSO70604C, DPO75902SX, DPO72004SX

  • Тип руководства: User (Предварительные установки > Пользователь)
  • Номер по каталогу: 077176202
  • Дата выпуска:

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TekExpress PCI Express Transmitter Compliance and Validation Software Application Help
SCPI COMMANDS

Welcome

The TekExpress® PCI Express Automated Test Solution Software application (referred to as TekExpress PCIe or PCIe in the rest of the document) provides an automated, simple, and efficient way to test PCI Express interfaces and devices consistent to the requirements of the PCI Express specifications.

TekExpress PCIe key features and benefits
  • New features from current release:
    • Support for Gen6 PWJ measurements using PAMJET tool.
    • Integration of Automated Scope noise characterization and compensation for Gen6.
    • Integration of CTLE optimization for Gen6 jitter measurements.
    • Support for Mini-Circuits RF Switch for Gen1-5 testing.
    • Improvement in Gen6 Preset Test feature.
    • Updated Gen6 Preset tests limits as per latest spec.
    • Support for Intel Clock Jitter Tool (CJT) for Ref Clock testing.
    • Support for Sigtest Phoenix v5.1.04 for Gen5 CEM Signal and preset tests.
  • Existing Features:
    • PCIe CEM TX Testing
      • Supports Add-In-Card and System Board device types
      • Supports Gen1, Gen2, Gen3, Gen4, and Gen5 versions
      • Supports Signal Quality Test for all generations
      • Supports Preset Test for Gen3, Gen4, and Gen5 generations
      • Supports Pulse Width Jitter Test for Gen4 and Gen5 Add-In-Card device type
    • PCIe Base TX testing
      • Supports both PCIe Gen5 Base Tx Common Clock & SRIS architecture
      • Supports Gen3, Gen4, and Gen5 versions
      • Supports Jitter & Voltage Signal Quality Test and Preset Test for all generations
    • U.2 (SFF-8639) TX Testing
      • Supports Gen3 Host and Module device types
    • M.2 TX Testing
      • Supports Gen3 M.2 Add-In-Card and Host device types
    • PCIe Ref Clock TX Testing
      • Supports Gen3, Gen4, and Gen5 versions of CXL Base, CEM Card and CEM Host type device testing.
    • PCIe CXL Testing
      • Supports Gen1 to Gen5 Ref Clock Jitter and Signal Integrity measurements
    • Tektronix ATI (200GS/s) channel support for CEM, Base Spec, U.2, M.2 and Ref clock testing for all generations (Not applicable for CEM System Board Gen1-4 and U.2 Host Gen3)
    • Supports channel embed and de-embed filter files
    • Supports de-embedding on each ATI channel using separate filter files
    • Supports Intel CJT, Skyworks Clock Jitter tool or DPOJet for ref clock analysis
    • Supports traditional break-out channel de-embedding & SigTest CTLE (for uncorrelated jitter measurements only)
    • Automated De-skew and attenuation for ATI Channels
    • Supports single and multiple acquisition for CEM Gen4 and Gen5
    • Trigger type support for Gen3, Gen4, and Gen5 (Auto/Width/Edge)
    • Automated toggling of the DUT to switch presets for CEM, U.2, and M.2 device types using AWG/AFG/GRL PHY Test Controller/NI USB 6501 DUT Controller.
    • Simple push button, enabling the users to manually toggle PCIe presets from AWG/AFG
    • Support for Gen4 and Gen5 dataclock pattern custom toggle index in non standard devices.
    • RF Switch support to test the x12 and x16 lanes using Keithley and Gigatronics switches respectively
    • Fully automated General, Jitter, Composite Eye, Transition Eye, and Non Transition Eye measurements
    • Provides individual or group test selection by using a tree-structure menu
    • Supports preset test selection for all device types
    • Integrated Intel Sigtest for fully automated waveform analysis
      • Supports parallel execution of measurements using multiple instances of SigTest to accelerate the test analysis speed
      • Deploys recommended versions of SigTests for analysis
        • Sigtest Phoenix v5.1.03: PCIe Gen5 CEM Spec
        • Sigtest v4.0.52: PCIe Gen4 CEM Spec, Gen4 and Gen5 Base Spec
        • Sigtest v4.0.42: PCIe Gen3 Base spec
        • Sigtest v3.2.0.3: PCIe Gen3 CEM Spec
      • Option to browse and select different Sigtest versions and templates for debug
      • Support Sigtest run in silent mode (Not applicable for Sigtest v3.2.0.3)
    • Built-in reporting features:
      • Provides a Pass/Fail summary table
      • Provides generation specific pass/fail status summary table
      • Provides margin details on each test
      • Provides a consolidated report for all tests
      • Supports .pdf, .mht and .csv formats
    • Provides Tektronix Method of Implementation (MOI) for PCIe testing Run-time setup instructions with image pop-ups and reference illustrations for each test execution
    • Provides both an automation solution (for compliance) and DPOJET (for debug)
    • TekExpress setup files in-line with PCI-SIG Compliance Workshop
    • Supports SCPI commands to remotely communicate with the TekExpress application
    • 33 GHz Oscilloscope supports CEM Gen5 TX testing using Tekconnect channels.
    • Supports Eye Diagram plots for Base Spec through DPOJET
    • Support for PCIe Gen6 Base Spec TX signal quality test using PAMJet and DPOJet analysis tools.
    • Support for PCIe Gen6 Base Spec TX preset test.
    • Support for Base Spec Gen6 signal validation using PAMJet tool.
    • Improved UI look and feel.

Getting help and support

Product documents

Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program or operate the application, and do other tasks.

Table 1. TekExpress Application documents
To learn aboutUse this document
How to use the application

How to remotely control the instrument

TekExpress PCI Express Help

PDF version of this document can be downloaded from http://www.tek.com/downloads

Compiled HTML (CHM) version is integrated with the application. Press F1 key from the keyboard to start the help.

Tektronix Part Number: 077-xxxx-xx

Conventions

This application help uses the following conventions:

  • The term "Application," and "Software" refers to the TekExpress PCI Express application.
  • The term “DUT” is an abbreviation for Device Under Test.
  • The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse or using the touch screen.
  • A Note identifies important information.
Table 1. Icons used in the help
IconDescription
This icon identifies important information
This icon identifies conditions or practices that could result in loss of data.
This icon identifies additional information that will help you use the application more efficiently.

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See Contacting Tektronix at the front of this document for contact information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

General information

  • All instrument model numbers
  • Hardware options, if any
  • Modules used
  • Your name, company, mailing address, phone number, FAX number
  • Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application specific information

  • Software version number
  • Description of the problem such that technical support can duplicate the problem
  • If possible, save the setup files for all the instruments used and the application
  • If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file

Getting started

Hardware requirements

Minimum system requirements

The following table shows the minimum system requirements needed for an oscilloscope to run TekExpress PCI Express.

Table 1. System requirements

Component

Requirement

Oscilloscope See Instruments and accessories required
Processor Same as the oscilloscope
Operating system Microsoft Windows 10 (64-bit only) Required Windows 10 user account settings
Memory Same as the oscilloscope
Hard disk Same as the oscilloscope
Display Same as the oscilloscope
Firmware Tekscope for MSO/DSA/DPO70000C, D, DX, SX
Software
  • DPOJET, Jitter and Eye Diagram Analysis Tool2
  • PAMJet Analysis Tool 2
  • Microsoft .NET 4.0 Framework
  • Microsoft Internet Explorer 8.0 SP1 or later
  • PyVisa version 1.0.0
  • IronPython version 2.7.3
  • Microsoft Photo Editor 3.0 or equivalent software for viewing image files
  • Adobe Reader 7.0 or equivalent software for viewing portable document format (PDF) files
1 If TekExpress is running on an instrument having a video resolution lower than 800x600 (for example, a sampling oscilloscope), it is recommended that you connect a secondary monitor, which must be enabled before starting the application.
2 For software version, refer to Readme TekExpress PCI Express.txt file at C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express
3 The TekExpress PCIe Installer does not install PAMJet application. User needs to install the right PAMJet software and ensure that the option key is enabled.

Instruments and accessories required

The following table lists the instruments and accessories required for TekExpress PCI Express application.

Table 1. Instruments and accessories required for PCI Express application
Instrument/Accessory Model number
Oscilloscope

MSO70604 ,  DPO/MSO70604C (Gen1 testing only)

MSO708041,  DPO/MSO70804C (Gen1 and Gen2 testing)

MSO712541,  DPO/MSO71254C (Gen1, Gen2, and Gen3 testing only)

MSO716041,  DPO/MSO71604C (Gen1, Gen2, and Gen3 testing)

MSO720041,  DPO/MSO72004C (Gen1, Gen2, and Gen3 testing)

DPO/MSO72304DX (Gen1, Gen2, and Gen3 testing)

DPO/DSA72504D ( Gen1, Gen2, Gen3, and Gen4 testing)

DPO/DSA73304D (all generation testing)

DPO/MSO72304DX (Gen1, Gen2, and Gen3 testing)

DPO/MSO72504DX (all generation testing)

DPO/MSO73304DX (Gen1, Gen2, Gen3, and Gen4 testing)

DPO71304SX (Gen1, Gen2, and Gen3 testing)

DPO71604SX (Gen1, Gen2, and Gen3 testing)

DPO72304SX (Gen1, Gen2, and Gen3 testing)

DPO73304SX All Generation Testing

DPO75002SX [Standalone or 2 Stack] All Generation Testing

DPO75902SX [Standalone or 2 Stack] All Generation Testing

DPO77002SX [Standalone or 2 Stack] All Generation Testing

Arbitrary Function Generator (AFG) (for automatic test pattern toggling) Tektronix AFG3252, AFG3252C, AFG31252
Arbitrary Waveform Generator (AWG) (for automatic test pattern toggling)
  • Tektronix AWG5002B/C, AWG5012B/C, AWG5014B/C
  • Tektronix AWG7082B/C, AWG7122B/C
  • Tektronix AWG70001A, AWG70002A

RF Switch

  • Keithley System S46T RF Microwave Switch Systems for x12 PCIe
  • Gigatronics RF Switch 26GHz (8902-L-48TS26) for x16 PCIe
  • MiniCircuit ZTM6SP4T40 for x12 PCIe
  • MiniCircuit ZTM28SP6T40 for x16 PCIe
GRL PCIE34 Controller for automatic test pattern toggling and DUT power cycle

Part number : GRL-PCIE34-P1

Contact GRL at http://[email protected] for support and http://[email protected] to request for a quote.

NIUSB-6501 for automatic toggling of Gen4 DUTs

Part Number: 779205-01

Discuss product recommendations, quote products, and place an order.
Other devices
  • SMP-SMA cables
  • TCA-SMA connectors
  • Matched pair cables

Differential probes

P7513, P7513A, P7516, P7520A, P7625, P7630, P7633, P7713, P7716, P7720 with respective tips

PCI Express
Speed Minimum oscilloscope bandwidth

TCA-SMA

(Max 18 GHz)

TCA-292D

(Max 33 GHz)

P7500

(Max 20 GHz)

P7700

(Max 20 GHz)

P7600

(Max 33 GHz)

2.5 GT/s 6 GHz
5.0 GT/s 12.5 GHz
8.0 GT/s 13 GHz
16.0 GT/s 25 GHz
32.0 GT/s 50 GHz
100 MHz RefClk 5 GHz
1 Requires Microsoft Windows 10 (64-bit) operating system. Contact your local Tektronix Customer Service representative for upgrade information.
2 The listed AFG/AWG instruments support both differential inputs (requires 2 channels) and 100 MHz burst mode.
3 Use GPIB cable or USB-to-GPIB or USB cable to connect the oscilloscope to switch.
4 The GPIB address of the RF Switch and toggle instrument (AWG/AFG) must be different.
5 DUT power cycle is supported for Add-In-Card DUT type only

Software requirements

Downloading and installing the software

Complete the following steps to download and install the latest TekExpress PCI Express application.

  1. Go to www.tek.com.
  2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as Software and enter the application name in the MODEL OR KEYWORD field and click SEARCH.

  3. Select the latest version of software and follow the instructions to download the software. Copy the executable file into the oscilloscope.
  4. Double-click the executable and follow the on-screen instructions.

    The software is installed at C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express.

  5. Select Application/Analyze > TekExpress PCI Express from the Oscilloscope menu, to open the application.

Activate the license

Activate the license using the Option Installation wizard in the TekScope application:

  1. In the TekScope application menu bar, click Utilities > Option Installation. The TekScope Option Installation wizard opens.
  2. Push the F1 key on the oscilloscope keyboard to open the Option Installation help topic.
  3. Follow the directions in the help topic to activate the license.

View software version and license key details

To view version information of the application, click Options > About TekExpress.

Setting up the test environment

Windows 10 user account settings

Windows 10 instruments need to have the User Account Control Settings set to Never Notify. To set User Account Control Settings:

  1. Go to Control Panel > User Accounts > Change User Account Control settings.

  2. Set the sliding control to Always notify as shown in the image, and click OK.



See also

Instruments and accessories required

Install the software

Use the following steps to install PCI Express software on any compatible instrument running Microsoft Windows 10 (64-bit). See Minimum System Requirements for details.

  1. Close all applications (including the TekScope application).
  2. Go to the www.tek.com Web site and search for TekExpress PCI Express to locate the installation file. Download the file TekExpress_PCIe_Deployment_Package.exe.
  3. Copy or download the PCIe installer file to the oscilloscope.
  4. Double-click the installer .exe file to extract the installation files and start the InstallShield Wizard. Follow the on-screen instructions. The software installs in the following location:

    C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express

  5. The installer updates the TekScope Analyze menu to include the installed options.

See also

Minimum system requirements

Instruments and accessories required

Set application file permissions

Before you run tests for the first time, do the following:

  1. Understand where your test files are stored on the instrument.
    After you install and start TekExpress PCIe, it creates the following folders on the oscilloscope:
    • \My Documents\My TekExpress\PCI Express
    • \My Documents\My TekExpress\PCI Express\Untitled Session

    Every time you start TekExpress PCIe, an Untitled Session folder is created in the PCIe folder. The Untitled Session folder is automatically deleted when you exit the PCIe application. To preserve your test session files, save the test setup before exiting the TekExpress application.

    CAUTION:

    Do not modify any of the session files or folders because this may result in loss of data or corrupted session files. Each session has multiple files associated with it. When you save a session, a .TekX file, and a folder named for the session that contains associated files, is created on the oscilloscope X: drive.

  2. Map the shared My TekExpress folder as X: (X drive) on the instruments used in test setups running Microsoft Windows Operating System.

    The My TekExpress folder has the share name format <domain><user ID>My TekExpress. Or, if the instrument is not connected to a domain, the share name format is <instrument name><user ID>My TekExpress. This shared folder is used to save the waveform files and is used during other file transfer operations.

    Note:If the X: drive is mapped to any other shared folder, the application will display a warning message asking you to disconnect the X: drive manually.
  3. Make sure that the My TekExpress folder (Drive X:) has read and write access:
    1. Right-click the folder and select Properties.
    2. Select the General tab and then click Advanced.
    3. In the Advanced Attributes dialog box, make sure that the option Encrypt contents to secure data is NOT selected (not checked).

  4. See the prerun checklist before you run a test.

See also

Configuration: Set measurement limits for tests

Application directories

File name extensions

About setting up tests

Set up tests using the tabs in the Setup panel. Settings in the DUT tab use a top-down, left-to-right logic flow, so that any parameter that affects or acts as a filter for other parameters appears either to the top of or to the left of the affected parameters.

Tests are saved when you save a test setup. To avoid overwriting test results, remember to assign a unique name to the test either before running it or immediately after.

See also

Test setup overview

Before you click start

About running tests

Equipment connection setup

Click the Setup > Test Selection > Schematic button to open a PDF file that shows the compliance test setup diagrams (instrument, DUT, and cabling) for supported testing configurations.

See also

Minimum system requirements

About setting up tests

Equipment connection setup through switch system

Figure 1. Add-In card connection setup through switch system


Switch: DUT Lane to Signal connection mapping

TX LANE 0 P

S1 (relay) > Signal 1

TX LANE 0 N

S3 > Signal 1

TX LANE 1 P

S1 > Signal 2

TX LANE 1 N

S3 > Signal 2

TX LANE 2 P

S1 > Signal 3

TX LANE 2 N

S3 > Signal 3

TX LANE 3 P

S1 > Signal 4

TX LANE 3 N

S3 > Signal 4

TX LANE 4 P

S1 > Signal 5

TX LANE 4 N

S3 > Signal 5

TX LANE 5 P

S1 > Signal 6

TX LANE 5 N

S3 > Signal 6

TX LANE 6 P

S1 > Signal 7

TX LANE 6 N

S3 > Signal 7

TX LANE 7 P

S1 > Signal 8

TX LANE 7 N

S3 > Signal 8

TX LANE 8 P

S4 > Signal 1

TX LANE 8 N

S6 > Signal 1

TX LANE 9 P

S4 > Signal 2

TX LANE 9 N

S6 > Signal 2

TX LANE 10 P

S4 > Signal 3

TX LANE 10 N

S6 > Signal 3

TX LANE 11 P

S4 > Signal 4

TX LANE 11 N

S6 > Signal 4

TX LANE 12 P

S4 > Signal 5

TX LANE 12 N

S6 > Signal 5

TX LANE 13 P

S4 > Signal 6

TX LANE 13 N

S6 > Signal 6

TX LANE 14 P

S4 > Signal 7

TX LANE 14 N

S6 > Signal 7

TX LANE 15 P

S4 > Signal 8

TX LANE 15 N

S6 > Signal 8
Figure 2. System board (normal) connection setup through switch system


Switch: DUT Lane to Signal connection mapping

TX LANE 0 P

S1 (relay) > Signal 1

TX LANE 0 N

S3 > Signal 1

TX LANE 1 P

S1 > Signal 2

TX LANE 1 N

S3 > Signal 2

TX LANE 2 P

S1 > Signal 3

TX LANE 2 N

S3 > Signal 3

TX LANE 3 P

S1 > Signal 4

TX LANE 3 N

S3 > Signal 4

TX LANE 4 P

S1 > Signal 5

TX LANE 4 N

S3 > Signal 5

TX LANE 5 P

S1 > Signal 6

TX LANE 5 N

S3 > Signal 6

TX LANE 6 P

S1 > Signal 7

TX LANE 6 N

S3 > Signal 7

TX LANE 7 P

S1 > Signal 8

TX LANE 7 N

S3 > Signal 8
Figure 3. System board (cascade) connection setup through switch system


Switch: DUT Lane to Signal connection mapping

TX LANE 0 P

S1 (relay) > Signal 1

TX LANE 0 N

S3 > Signal 1

TX LANE 1 P

S1 > Signal 2

TX LANE 1 N

S3 > Signal 2

TX LANE 2 P

S1 > Signal 3

TX LANE 2 N

S3 > Signal 3

TX LANE 3 P

S1 > Signal 4

TX LANE 3 N

S3 > Signal 4

TX LANE 4 P

S1 > Signal 5

TX LANE 4 N

S3 > Signal 5

TX LANE 5 P

S1 > Signal 6

TX LANE 5 N

S3 > Signal 6

TX LANE 6 P

S1 > Signal 7

TX LANE 6 N

S3 > Signal 7

TX LANE 7 P

S1 > Signal 8

TX LANE 7 N

S3 > Signal 8

TX LANE 8 P

S4 > Signal 1

TX LANE 8 N

S6 > Signal 1

TX LANE 9 P

S4 > Signal 2

TX LANE 9 N

S6 > Signal 2

TX LANE 10 P

S4 > Signal 3

TX LANE 10 N

S6 > Signal 3

TX LANE 11 P

S4 > Signal 4

TX LANE 11 N

S6 > Signal 4

TX LANE 12 P

S4 > Signal 5

TX LANE 12 N

S6 > Signal 5

TX LANE 13 P

S4 > Signal 6

TX LANE 13 N

S6 > Signal 6

TX LANE 14 P

S4 > Signal 7

TX LANE 14 N

S6 > Signal 7

TX LANE 15 P

S4 > Signal 8

TX LANE 15 N

S6 > Signal 8
Note:GPIB is the recommended interface to execute the switch matrix commands.

Test setup overview

Test setup includes acquisition and configuration parameters. You can also select report options when setting up tests. Use the options in the Setup panel and Reports panel to select and configure tests.

  1. Set up equipment.
  2. Do the prerun checklist.
  3. Set DUT parameters.
  4. Select one or more tests.
  5. Select acquisitions.
  6. Configuration test parameters.
  7. Set test measurement notification options.
  8. Select report options.

See also

About test setups

Before you click start

About running tests

Prerequisite

Compensate the signal path

Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a week. Failure to do so may result in the instrument not meeting warranted performance levels.
  1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.
  2. Disconnect any probes you have connected to the input channels.
  3. Set the instrument to Menu mode.
  4. Select Instrument Calibration from the Utilities menu.
  5. Note any instructions that appear in the resulting control window.
  6. Click Run SPC to begin the procedure. The procedure may take several minutes to complete.
  7. Verify that the Status changes to Compensated after the procedure is complete. If the Calibration Status field indicates anything other than Compensated, see Signal Path Compensation Status for information on the readout and recommended action.
Note:When making measurements at vertical scale settings less than or equal to 5 mV, you should perform the signal path compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at those volts/div settings.

Deskew and Attenuation

By clicking on the button opens up the Deskew and Attenuation Setup window which has the following options.

Deskew:

  1. Use Automated Deskew (Which is selected by default) automated deskew works in the following way:
    • By selecting the automated deskew, the application runs the deskew operation before acquiring the DUT signal.
    • Deskew will be performed to remove the skew of the setup which is primarily the cable set and oscilloscope channel. Deskew requires a low-frequency signal with a small rise/fall time. Both these requirements are fulfilled by the fast edge on the oscilloscope.
    • During deskew the other end of the cable connected to the fixture/ISI board is connected to the fast edge. Fast edge has a skew of less than 1 ps. If the +ve and -ve channels of fast edge are phase-matched, the user can ensure that the setup (cable+oscilloscope channel) has a skew of less than 1 ps.
      Figure 1. Deskew popup window


  2. Use Manual Deskew Manual

Attenuation:
  1. Use 6 dB Attenuation (Which is selected by default).
  2. Use Custom Attenuation.

Running tests

After selecting and configuring tests, review the Prerun checklist and then click Start to run the tests. While tests are running, you cannot access the Setup or Reports panels. To monitor the test progress, switch back and forth between the Status panel and the Results panel.

The application displays a report when the tests are complete. While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using the Alt + Tab key combination. To keep the TekExpress PCIe application on top, select Keep On Top from the TekExpress Options menu.

See also

Before you click start

About configuring tests

About setting up tests

Prerun checklist

Do the following before you click Start to run a test. If this is the first time you are running a test on a setup, refer to the information in Before you click start.

  1. Make sure that all the required instruments are properly warmed up (approximately 20 minutes).
  2. Perform Signal Path Compensation (SPC):
    1. On the oscilloscope main menu, select the Utilities menu.
    2. Select Instrument Calibration.
  3. Verify that the application is able to find the DUT. If it cannot, perform a search for connected instruments:
    1. In PCIe, select the Setup panel and then click the Test Selection tab.
    2. Select any test and then click Configure.
    3. In the Configuration section, click Global Settings.
    4. In the Instruments Detected section, click the drop-down arrow to the right of Real Time Scope and make sure that the oscilloscope with the (GPIB8::1::INSTR) designation is in the list.

See also

Equipment connection setup

Search instruments connected to the application

Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The application uses TekVISA to discover the connected instruments.
Note:The instruments required for the test setup must be connected and detected by the application, before running the test.
To refresh the list of connected instruments:
  1. Select Options > Instrument Control Settings.
  2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to search. Instrument search is based on the VISA layer, but different connections determine the resource type, such as LAN, GPIB, and USB. For example, if you choose LAN, the search will include all the instruments supported by the TekExpress that are communicating over the LAN.
  3. Click Refresh. The TekExpress application searches for the connected instruments.
    Search status of the instruments connected to LAN

  4. When the search is complete, a dialog box lists the instrument-related details based on the search criteria. For example, for the Search Criteria as GPIB, the application displays all the GPIB instruments connected to the application.
    TekExpress Instrument Control Settings window.

    The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the Last Updated field.

Starting the application

To start the TekExpress PCI Express, select from the oscilloscope menu bar. Applications > TekExpress PCI Express

Figure 1. TekExpress PCI Express application start screen (with ATI Mode)


Figure 2. TekExpress PCI Express application start screen (Non-ATI Mode)


During start, a "My TekExpress" folder is created in the Documents folder of the current user and gets mapped to "X" drive. When the application is closed properly, the "X" drive gets unmapped. Session files are then stored inside the X:\PCI Express folder. If this file is not found, the application runs an instrument discovery program to detect connected instruments before starting TekExpress PCI Express.

To keep the TekExpress PCI Express application on top of any application, select Keep On Top from the options menu. If the application goes behind the oscilloscope application, select Applications >TekExpress PCI Express to bring the application to the front.

Application controls

This section describes the application controls with functionality and its details.
Table 1. Application control description
ItemDescription
Options menu

Menu to display global application controls.
Test panel

Controls that open tabs for configuring test settings and options.
Start / Stop button

Use the Start button to start the test run of the measurements in the selected order. If prior acquired measurements are not cleared, then new measurements are added to the existing set. The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.
Pause / Continue button

Use the Pause button to pause the acquisition. When a test is paused, this button changes as Continue.
Clear button

Use the Clear button to clear all existing measurement results. Adding or deleting a measurement, or changing a configuration parameter of an existing measurement, also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on Results panel.
Note:This button is visible only when there are results data on the panel.
Application window move icon

Place the cursor over the top of the application window to move the application window to the desired location
Minimize icon

Minimizes the application.
Close icon

Close the application.
Mini view / Normal view

Mini view displays the run messages with the time stamp, progress bar, Start / Stop button, and Pause / Continue button. The application moves to mini view when you click the Start button.

Options menu functions

To access the Options menu, click in the upper-right corner of the application. It has the following selections:



Table 1. Options menu settings
MenuFunction
Default Test SetupOpens a new test setup with default configurations.
Open Test SetupOpens a previously saved test setup. Displays the list of previously saved test setup file names. Make the selection and click OK to open the test setup.
Save Test SetupSaves the current test configurations with the specified file name.
Save Test Setup AsSaves the current test setup with a different file name or file type.
Open RecentDisplays the recently opened test setup file names. Make the selection and click OK to open the test setup.
Instrument Control Settings

Detects, lists, and refreshes the connected instruments found on the specified connections (LAN, GPIB, USB, Serial, Non-VISA Resources, TekLink, and VXI).

Keep On Top

Always keeps the TekExpress PCI Express application on top of all the applications.

Email SettingsConfigures email options for test run and result notifications.
DeskewLoads oscilloscope channel deskew settings into the application.
HelpDisplays the TekExpress PCI Express help.
About TekExpress

Displays the application name, version, and hyperlink to end the user license agreement.

TekExpress instrument control settings

Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected instrument is displayed in the Retrieved Instruments window.

To access, click Options > Instrument Control Settings. Select USB and LAN as search criteria for TekExpress application and click Refresh. The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in the test configuration section.

Figure 1. TekExpress Instrument Control Settings window

See also

Options menu functions

Configure email settings

Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to configure email settings:

Figure 1. Email settings window


  1. Select Options > Email Settings to open the Email Settings dialog box.

  2. (Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate the addresses with commas.

  3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name, followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example: [email protected].

  4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location, and the SMTP Port number, in the corresponding fields.

    If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.

    Note:If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.
  5. In the Email Attachments section, select from the following options:

    • Reports: Select to receive the test report with the notification email.

    • Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

  6. In the Email Configuration section:

    • Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 0 MB.

    • Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

  7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

  8. To test your email settings, click Test Email.

  9. To apply your settings, click Apply.

  10. Click Close when finished.

Setup panel: Configure the test setup

The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.

DUT: Set DUT settings

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also affect the list of available tests in the Test Selection tab.

Figure 1. TekExpress PCI Express: DUT tab


Figure 2. TekExpress PCI Express: DUT Tab - Base Gen6


Click Setup > DUT to access the DUT parameters:

Table 1. DUT tab configuration

Setting

Description

DUT ID Adds an optional text label for the DUT to reports. The default value is DUT001.
Slot Number The slot parameter (1, 2, 4, 8,16, or 32) of the DUT.
  Comments icon (to the right of the DUT ID field) Opens a Comments dialog box in which to enter optional text to add to a report. The maximum number of characters is 256. To enable or disable comments appearing on the test report, refer View a generated report.
Acquire live waveforms Acquire active signals from the DUT for testing.
Use prerecorded waveform files Run tests on a saved waveform. Load a saved test setup
Test Mode
Sets the overall testing mode. Select Compliance or User Defined:
  • Compliance: Preselects tests and parameters to meet compliance specifications for the selected version, specification, and device type.
  • User Defined: Enables the user to select specific tests and set custom parameters for tests.
Note:Not applicable for the Device type / Specification type BaseSpec
SessionAllows you to save multiple config sessions and run multiple config/run sessions together.
Specification PCIe supports the CEM, BaseSpec, RefClockSpec, U.2 (SFF-8639), and M.2 specification.
Device Type

Sets the DUT device type. The device type available depends on the selected specification.

Following are the device types for each specifications
  • CEM:
    • Add-In-Card
    • System-Board
  • BaseSpec:
    • TX Test Board
    • SRIS TX Test Board
  • RefClockSpec:
    • Ref Clock
  • U.2 (SFF-8639):
    • Module
    • Host
  • M.2
    • M2_Add-In-Card
    • M2_Host
Note:CXL device type support is newly added to the TekExpress PCIe TX application. Refer CXL Support for more details.
Version
Sets the DUT generation version. Available versions are:
  • CEM: Gen 1 (1.0a and 1.1), Gen2 (2.0), Gen3 (3.0), Gen4 (4.0) and Gen5 (5.0)
  • Base Spec: Gen3 (3.0), Gen4 (4.0), Gen5 (5.0), and Gen6 (6.0)
  • RefClockSpec: Gen5(5.0) Supports all Gen1-5 Versions
  • U.2: Gen3 (3.0)
  • M.2: Gen3 (3.0)
  • CXL: Gen3 (3.0), Gen4 (4.0) and Gen5 (5.0)
Device Profile
Data Rates Sets the data rates to test (2.5 Gb/s, 5 Gb/s, 8 Gb/s, 16 Gb/s, 32 Gb/s, and 64 Gb/s). The data rates available depend on the selected DUT version.
Filters Opens the Filter Setup dialog box to select custom filter files with which to perform link analysis on the source waveforms.
Presets
Note:This settings is only available for Gen2, Gen3, Gen4, and Gen5 DUT versions.
Opens the Presets dialog box. User can select Gen2 preemphasis and Gen3 to Gen5 presets(P0 to P10) for signal quality tests in respective tabs. All preemphasis and presets are selected by default. At least one preemphasis level/preset must be selected for each generation.



Swings and Crosstalks Voltage Swing Limits

Sets the lane/link transmitter p-p voltage swing.

This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab.

Crosstalk Limits

Sets specific eye test limits depending on if the DUT design uses interleaved or non interleaved routing.

This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab. This is applicable for Gen2.

  • When the DUT uses noninterleaved routing, select Crosstalk (noninterleaved routing).
  • When the DUT uses interleaved routing, select No Crosstalk (interleaved routing).
SSC (Spread Spectrum Clocking)

Enables or disables SSC clocking.

This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab.

Lanes

Opens the Test Lane Setup dialog box to select the lanes to test. Lanes required for compliance testing are colored orange. At least one lane must be selected.

The Link Width setting determines the number of lanes that can be tested.

Automated DUT Control

Enables automatic toggling of the DUT into different test modes (generation/equalization). Requires the use of an AFG or AWG or NI USB toggle tool. Click Setup to access the Automated DUT control setup

Use Switch Matrix

Select to use the switch matrix. This solution allows you to map each of the several transmitter signals and forward the selected input either to another relay or to the oscilloscope channel.

Click Setup to configure the switch matrix. Refer Switch Matrix application for more details on configurations.

Note:
  • Keithley supports maximum of 12 lanes and Gigatronics supports maximum of 16 lanes.
  • Switch Matrix is applicable for Gen1, 2, 3 only.
Signal validation Signal validation Sets the application to validate acquisition signals and perform the specified action to take when acquired signals do not meet requirements. Select the action from the list.
Perform Pattern Decoding Select to validate the pattern according to the respective lane and preset for Gen3.
Deskew/Attenuation

Provides the option of setting deskew and attenuation values on the scope either in an automated way or manual way.

Refer Deskew and Attenuation for more details.

Test Type
Use this procedure to choose between CEM or Base type of Ref Clock testing.

Note:This is only available for Ref Clock testing and the measurement limits will be changed based on this setting.
1 In pre-recorded mode, waveform recall will not be successful if the session name is lengthy, i.e. more than 10 characters.

Filter setup dialog box

The filter setup dialog box lets you select custom filter files for performing link analysis on the source waveforms. The options available depends on the Specification selected.

Figure 1. Filter Setup for Gen6 BaseSpec


Figure 2. Filter Setup for Gen1-5 CEM


De-Embed

Select de-embed for the data rate; click Browse and select the de-embed filter file.

Note:
  • For 32 GB/s single ended probe in ATI Mode, select 2 de-embed filter files for positive and negative data respectively. For differential probe, select same filter file for both positive and negative data.
  • 32 GB/S filter files should be created with 200 GS/s sample rate and 33 GHz bandwidth.

Embed

Select Embed for the data rate; click Browse and select the embed filter file.

Automated DUT control setup

The Automated DUT Control dialog box sets the parameters needed for automatic toggling of the DUT into different test modes (generation/equalization). DUT automation requires the use of a signal source AFG or AWG or NI USB toggle.



ParameterDescription
Initial State
Initial State of DUTSets the starting state of the DUT.
Initial State of Signal SourceSets the AFG/AWG state to On (default) or Off. The On state enables the AFG/AWG output before the application starts signal acquisition. Some DUTs will toggle to the next signal state when the AFG/AWG initial state is On. Set the initial state to Off for these types of DUTs before running automated tests.
Number of Gen4 Dataclock patternsAllows to select the number of Gen4 dataclock patterns the DUT supports, between 0 to 15.
Note:The dataclock pattern is selected as 9 by default.
Number of Gen5 Dataclock patternsAllows to select the number of Gen5 dataclock patterns the DUT supports, between 0 to 15.
Note:The dataclock pattern is selected as 9 by default.
Automation Settings
Automation Settings (for AFG only)The Automation Settings values are as follows :
  • Use Default Settings: The signal source parameters are set to predefined values as recommended by the test specification. The signal source parameter fields are disabled and cannot be edited.
  • Manually Configure Settings: The signal source parameters are set directly at the AFG. The signal source parameter fields are disabled and cannot be edited. The PCIe application turns on or off the signal source without changing the settings.
  • Use Custom Settings: The signal source parameters are set to the values specified in the Signal Source Parameters area. The signal source parameter fields are enabled.
Signal Source Parameters
Signal TypeValid signal types are Sine and Square.
FrequencySets the AFG to output the specified frequency and amplitude values.
Amplitude
Burst CountSets the AFG to output the specified signal burst count.
Note:Ch 1 and Ch 2 on the AFG source are set to 180° phase difference in all modes except Manually Configure Settings.
Note:Using DC Caps or Manual toggle, you can eliminate the automatic toggling issues that is due to DC offset.

NI USB 6501 DUT Controller Support

The following information provides how to use NI USB 6501 DUT Controller Support.
  • TekExpress PCIe TX application added support for National Instrument USB-6501 CBB controller device in TekExpress PCIE Express TX application. This device can be used to toggle the DUT.
  • In order to detect the hardware and access it, the user will have to install the NI-DAQMX v20.7.1 software package in the Tekscope.
Steps to setup NI USB 6501 device in TekExpress:
  1. Go to Configuration Panel.
  2. Click on the Instrument Control Settings button.
  3. In the TekExpress Instrument Control Settings pop-up window, check Non-VISA Resources and then click the Refresh button.
  4. If the NI device is connected to the scope, it will be shown in the Retrieved Instruments.

  5. Close the pop-up window.
  6. The device now can be selected under Signal Source for DUT Automation.

Multiple-session run

Multiple-sessions run feature allows you to save multiple config sessions and run multiple config/run sessions together.

Click () button in the DUT panel, displays the Run/Config Session window. The Run/Config session window provides the list of saved sessions and the ability to run selected sessions.
  • Config session – Session saved by user manually from Run/Config Sessions window.
  • Run session – Session created automatically after the test is executed.


  • Session Name: Enter the name to save the config session. The maximum number of character supported is 40 and special characters (.,..,...,\,/:?”<>|*) are not supported.
  • Save: Save current configuration as a session with the given session name.
  • Close: Close the Run/Config Session window.
  • Default: Sets the application configurations to default values.
  • Load: Load the selected config/run session.
  • Delete: Delete the selected config/run session.
  • Run Sessions: Run the selected config/run session.

Enable/ Disable the Multi Run session

By default the Multi Run Session is enabled in the application. Set the IsMultiSessionRunEnabled value to false to disable the Multi Run Session feature in the TekExpress.exe.Config file, which is downloaded along the application.

Test Selection: Select the tests

Use the Test Selection tab to select the tests. The test measurements available depends on the settings selected in the DUT tab.

Figure 1. Test selection tab


Table 1. Test Selection tab configuration
SettingDescription
Signal TestsClick + to expand a group of commands. Click the check box adjacent to a test group to select all tests in that group. Click check boxes adjacent to individual tests to select those tests.
Deselect AllClick Deselect All button to deselect all tests.
Select AllClick Select All button to select all tests.
Show MOIClick Show MOI button to open the MOI (Methods of Implementation) document for all measurements.
SchematicClick Schematic button to view a diagram that shows the correct DUT and equipment setup for the selected test. Use to verify your test equipment setup before running the test.
Gen3, Gen4, and Gen5 testing

Click the required Preset Test tab and select the presets tests.

LanesClick the Lanes button in the Preset Test tab to view and select which lanes to use for preset testing. At least one lane must be selected.

Acquisitions: Set waveform acquisition settings

Use the Acquisition tab in the Setup panel to view and select test acquisition parameters, including the signal source channels, acquisition options, and waveform save options. This panel also shows the signal inputs required for the selected DUT parameters.

Contents displayed on this tab depend on whether you acquire active waveforms or use prerecorded waveform files (as set in the DUT tab. Contents displayed on this tab also depend on detected probes and the specified DUT type.

Active waveforms

Figure 1. Acquisitions tab: using active waveforms (with ATI channels)


Figure 2. Acquisitions tab : using active waveforms (with Non-ATI channels)


Table 1. Acquisitions tab configuration
SettingDescription
Source SelectionClick the Source fields to select signal sources for the listed lanes. The number of lanes shown depends on the parameters set in the DUT tab.
Refresh SourcesClick Refresh Sources to refresh the probe configuration after changing any probes. (This button performs the same function as the Refresh button in the Probe Configuration dialog box.)
View ProbesClick View Probes to view the detected probe configuration. Use the View Probes dialog box to enable or disable probe signal source access in the application.

Note:Only Differential option is available under Probe Method for Trimode probes.
Acquire OptionsClick the Acquire Options controls to set how the application acquires and analyzes signals.
Save OptionsClick the Save Options field to set how the application saves acquired waveforms (save all waveforms, save all waveforms after applying filters, or discard all waveforms after running analysis).
No. of AcquisitionsSelect the No. of acquisition for Gen4 from the drop-down.

Prerecorded waveforms

Figure 3. Acquisitions tab: using prerecorded waveforms


When using prerecorded waveform files, this panel lists available prerecorded waveform files. You can only select the source of the prerecorded waveform file for each test. See Set acquisition waveform source for prerecorded waveform files.

Set acquisition options

Select an Acquire Option to set the order in which waveforms are acquired and analyzed:

  • Acquire All Waveforms Before Analysis: Acquire all waveforms required by tests before performing analysis. All required user interventions (such as connecting to different lanes) are completed, and waveforms acquired, before the analysis is run. You can turn off the DUT after the acquisitions are completed.
  • Acquire Only – Do Not Analyze: Acquire all waveforms required by tests, and then stop (do not use waveforms to perform test analysis). Use this setting for testing multiple DUTs once the test and application settings are correct. Acquire all required waveforms and save the session for each DUT, and then recall the waveforms at a later point to analyze in Prerecorded mode.

See also

Set acquisitions signal source

Set acquisition waveform save options

Set acquisition waveform save options

Select a Save Option to set how to save acquired test waveforms:

  • Save All the Waveforms: Save all waveforms that were acquired for tests.
  • Save Only Analyzed Wfms: Save waveforms that was used for analysis.
  • No Waveforms Saved – Discard after analysis: Delete all acquired waveform data after analysis is complete.

Waveforms are saved to a folder that is unique to each session (a session starts when you click the Start button). The folder path is X:\PCI Express\Untitled Session\<DUT ID>\<date>_<time>. Images created for each analysis, CSV files with result values, reports, and other information specific to that particular execution are also saved in this folder. When the session is saved, content is moved to that session folder and the “Untitled Session” gets replaced by the session name.

Waveform file names

This application uses file name conventions to access the waveforms. It is recommended to save the waveforms with following file names.

  • Differential data waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Differential.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Diff.wfm

  • Differential clock waveform: Tek_PCIe_Slot_DataRate_LaneNumberClk_PresetNumber_Data_Differential.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00Clk_P0_d_Diff.wfm

  • Single ended data positive waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Pos.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Pos.wfm

  • Single ended data negative waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Neg.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Neg.wfm

See also

Set acquisitions signal source

Set acquisition waveform source for prerecorded waveform files

Set acquisition Acquire options

Set acquisition waveform source for prerecorded waveform files

When using prerecorded waveform files, there are no acquisition source selections to make. You can only select the source of the prerecorded waveform files for each test.



If you selected to use a prerecorded waveform file (in the DUT tab), the lane and source fields are not applicable and are not shown. The Acquisition tab instead shows a table of the waveforms used for the required test acquisitions.

You can load a different waveform file for each table item. To load a different waveform file:

  1. Click the ellipsis button ( ) of the waveform file to change.
  2. Select the waveform task to perform (replace, remove, or select the waveform file).
  3. Use the dialog box to navigate to and select the waveform file with which to replace the current file. You need to select all required differential waveforms for analysis. For example, select one data waveform and one clock waveform for each acquisition (except 2.5 Gbps) for testing a system board.

Note:Clock signals are not required for Gen1 (2.5 Gbps data rate) testing.

See also

Set acquisition signal source

Set acquisition options

Set acquisition waveform save options

Set acquisition signal source

Use this procedure to set the channel sources for live waveform acquisitions. The number of Lane and Source fields shown depends on the number of lanes selected for testing in the DUT tab.

  1. Click Setup > Acquisitions.
  2. Click in the Source column of the field to change.
  3. Click the arrow button to list available sources from which to select.

See also

Set acquisition options

Set acquisition waveform save options

Set acquisition waveform source for prerecorded waveform files

No. of Acquisitions

Use this procedure to set the number of acquisitions for each signal in the dropdown. This procedure is applicable for CEM Gen4 and Gen5. Minimum number of acquisition is 1 and the maximum is 10. Default selected is 1.

Jitter Test Acquisition

Use this procedure to choose the signal pattern to acquire the Gen5 Base jitter measurements. This procedure is applicable for Basespec Gen5 Jitter measurements only. The available options are Complaince and Data Clock. Compliance is seleceted as default option.

Analysis Tool

Use this procedure to choose the analysis tool to be used for the Ref Clock testing.

Available options are:
  • Intel CJT
  • Skyworks Clock Jitter Tool
  • DPOJET


Configuration: Set measurement limits for tests

Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific configurations available in this tab depends on the selections made in the DUT panel and Test Selection panel.

Table 1. Configuration tab: Common parameters
SettingsDescription
Mode
Determines whether test parameters are in compliance or can be edited.
  • Compliance: All the test parameters are editable except Use Cursors in Global Settings.
  • User Defined: All test parameters and global parameters are editable in this mode.
Limit Editor

Displays the upper and lower limits for the applicable measurement using different types of comparisons. In the Compliance Mode, you can view the measurement high and low limits used for the tests displayed in the tree view of the Measurements tab. When running tests in User Defined Mode, you can edit the limit settings in the Limits Editor.

The second table shows the tests with the limits calculated dynamically as per the specification.

Figure 1. Configuration tab: Global Settings


Table 2. Configuration tab: Global Settings configuration
SettingDescription
Test ModeDetermines whether test parameters are in compliance or can be edited (User Defined Mode).
  • Compliance: Most test parameter values cannot be edited.
  • User Defined: Enables editing of most test parameters.
Note:Not applicable for the Device type / Specification type BaseSpec
Instruments DetectedDisplays a list of the connected instruments found during the instrument discovery. Instrument types include equipment such as oscilloscopes and signal generators.
Instrument ControlClick Settings to search for connected instruments and view instrument connection details. Connected instruments displayed in TekExpress instrument control settings and can be selected for use under Global Settings in the test configuration section.
Manual Toggle

Click Setup to manually toggle AWG or AFG.

This is enabled when the Signal Source for DUT Automation in Instruments Detected is selected.

Automated DUT ControlEnables automatic toggling of test patterns for DUT tests. Requires an AWG or AFG as part of the test setup. Click Setup to configure the DUT automation settings.
Record Length, Sample Rate, Bandwidth
These settings apply to all tests selected for the indicated data rate.
  • Record Length: Specifies the waveform record length.
  • Sample Rate: Specifies the oscilloscope sample rate to use for all tests.
  • Bandwidth: Specifies the oscilloscope bandwidth to use for all tests.
Sig Validation ThresholdSets the threshold voltage to use for signal validation.
Trigger Type (Gen3/Gen4/Gen5)
  • Edge
  • Width
  • Auto
Note:When auto is selected, width trigger type is applied. If it fails, edge trigger type is applied.
CTLEThis configuration setting allows the user to configure for CTLE optimization for Gen6 jitter measurements. Refer CTLE optimization feature for more details.
Scope NoiseThis configuration setting allows the user to apply scope noise compensation for CTLE optimization and measurement analysis for Gen6 data rate test. Refer Scope Noise Characterization for more details.
SigTest Configuration

Click Setup; select the executable (.exe) for Gen1, 2, 3, 4, and 5 and template configuration for signal quality and preset tests for the data rates selected.

Check/Un-check Silent mode to run sigtest in Silent mode/non-silent mode.

Analysis tool (For RfClockSpec Only)
  • Intel CJT
  • Skyworks Clock Jitter Tool
  • DPOJET

CTLE optimization feature

This configuration setting allows the user to configure for CTLE optimization for Gen6 jitter measurements.

  • Record Length:
    • The Record Length of the waveform to be acquired for CTLE optimization.
    • Range 1M to 20M. Default value is 1M
  • Step Size:
    • Sets up the step size for the CTLE optimization iteration.
    • Values: 1, 0.5, 0.25
  • Optimum CTLE:
    • User defined CTLE value.
    • Default value 0.0 dB

Scope Noise Characterization

This configuration setting allows the user to apply scope noise compensation for CTLE optimization and measurement analysis for Gen6 data rate test.

There are two modes to apply the scope noise.
  • Automated Scope Noise
  • Manual Scope Noise

Automated Scope Noise calculates the Scope Noise for various Vertical settings, Filter files, and CTLE. During execution it will select the Scope Noise which is closest in Vertical Scale to the Vertical Scale decided.

Manual Mode will use the same Noise Compensation irrespective of Vertical Scale and CTLE applied.

Use the radio buttons to switch between these modes.

Automated Scope Noise

This functionality works in two steps:
  1. Creating the Scope Noise Data.
    Note:This step is to be done before running the TekExpress test session.
    • In Automated Mode, click on the Setup button. This pops up the 'Automated Scope Noise Setup' window.

    • Select Min, Max Scale, Step Size and applicable filters and then click Run.

      It will calculate the scope noise value for the selected scales and for different Filter combinations. For example: Live_BT, Live_BT_CTLE0, Live_BT_CTLE1…. Live_BT_CTLE15, and store them in a csv file. The file path is C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express\ScopeNoiseData.

  2. Using the scope noise data during test run.
    • When we run the test session, the appropriate value will be picked up from the file based on the scale of the waveform acquired and the filters applied. TekExpress searches this scope noise value during the CTLE optimization (to run RJ measurement) and during the measurement analysis.
      Note:If the waveform scale value falls in between the available values in the file, then nearest scale value would be picked up.
    • If the file is not present or the searched combination is not present in the table then TekExpress uses the default values selected under manual mode.

Manual Scope Noise

In the manual mode the user can directly input the scope noise compensation value for corresponding measurement types.

Preferences: Set the test run preferences

Use Preferences tab to set the application action on completion of a measurement. The Preferences tab has the feature to enable or disable certain options related to the measurement execution.

Figure 1. Preferences tab


Refer the below table for the options available in the Preferences tab:

Table 1. Preferences tab settings
SettingDescription
Execution Options
Show alert when new deskew values are configured on TekScope
Actions on Test Measurement Failure
On Test Failure, pause the test and let me investigateSelect to pause the test run and allow you to investigate when the test execution is failed.
On Test Failure, stop and notify me of the failure

Select to stop the test run on Test Failure, and to get notified via email. By default, it is unselected. Click Email Settings to configure the email settings to receive notifications.

Popup Settings
Auto close Warnings and informations during Sequencing

Auto close after <no> seconds

Select to close the warnings and information window automatically after the specified amount of time.

Specify the time in seconds using the edit box.

Auto close Error Messages during Sequencing. Show in Reports

Auto close after <no> seconds

Select to close the error message window automatically after the specified amount of time.

Specify the time in seconds using the edit box.

Status panel: View the test execution status

The Status panel contains the Test Status and Log View tabs, which provides status on the test acquisition and analysis (Test Status) and listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start to execute the test. Select the Test Status or the Log View tab to view these items while the test execution is in progress.

View test execution status

The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.

The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand () and collapse () the table rows.

Figure 1. Test execution status view in Status panel


Table 1. Test execution status table headers
ControlDescription
Test NameDisplays the measurement name.
AcquisitionDescribes the type of data being acquired.
Acquire StatusDisplays the progress state of the acquisition:
  • To be started
  • Started Acquisition
  • Completed Acquisition
Analysis StatusDisplays the progress state of the analysis:
  • To be started
  • In Progress
  • Completed

View test execution logs

The Test Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.

Figure 1. Log view in Status panel


Table 1. Status panel settings
ControlDescription
Message HistoryLists all the executed test operations and timestamp information.
Auto Scroll

Enables automatic scrolling of the log view as information is added to the log during the test execution.

Clear LogClears all the messages from the log view.
Save

Saves the log file into a text file format. Use the standard Save File window to navigate to and specify the folder and file name to save the log text.

Results panel: View summary of test results

When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.

In the Results table, each test result occupies a row. By default, results are displayed in summary format with the measurement details collapsed and with the Pass/Fail column visible.

Figure 1. Results panel with measurement results


Click icon on each measurement in the row to expand and to display the minimum and maximum parameter values of the measurement.

Filter the test results

Each column in the result table can be customized and displayed by enabling or disabling any column as per your requirement. You can change the view in the following ways:
  • To remove or restore the Pass/Fail column, select Preferences > Show Pass/Fail.
  • To collapse all expanded tests, select Preferences > View Results Summary.
  • To expand all the listed tests, select View Results Details from the Preferences menu in the upper right corner.
  • To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.
  • To view the results grouped by lane or test, select the corresponding item from the Preferences menu.
  • To expand the width of a column, place the cursor over the vertical line that separates the column from the column to the right. When the cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.
  • To clear all test results displayed, click Clear.

Reports panel: Configure report generation settings

Click Reports panel to configure the report generation settings and select the test result information to include in the report. You can use the Reports panel to configure report generation settings, select test content to include in reports, generate the report, view the report, browse for reports, name and save reports, and select report viewing options.

Report configuration settings

The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 1. Report panel- Configuration tab


Table 1. Report configuration panel settings
ControlDescription
ViewClick to view the most current report.
Generate Generates a new report based on the current analysis results.
Report Update Mode Settings
Generate new reportEach time when you click Run and when the test execution is complete, it will create a new report. The report can be in either .mht, .pdf, or .csv file formats.
Append with previous run sessionAppends the latest test results to the end of the current test results report. Each time when you click this option and run the tests, it will run the previously failed tests and replace the failed test result with the new pass test result in the same report.
Include header in appended reportsSelect to include header in appended reports.
Replace current test resultsReplaces the previous test results with the latest test results. Results from newly added tests are appended to the end of the report.
In previous run, current session

Select to replace current test results in the report with the test result(s) of previous run in the current session.

In any run, any sessionSelect to replace current test results in the report with the test result(s) in the selected run session’s report. Click and select test result of any other run session.
Report Creation Settings
Report name

Displays the name and path of the <Application Name> report. The default location is at \My Documents>\My TekExpress\<Application Name>\Reports. The report file in this folder gets overwritten each time you run a test unless you specify a unique name or select to auto increment the report name.

To change the report name or location, do one of the following:
  • In the Report Path field, type the current folder path and name.
  • Double-click in the Report Path field and then make selections from the popup keyboard and click Enter.

Be sure to include the entire folder path, the file name, and the file extension. For example: C:\Documents and Settings\your user name\My Documents\My TekExpress\<Application Name> \DUT001.mht.

Note:You cannot set the file location using the Browse button.

Open an existing report

Click Browse, locate and select the report file and then click View at the bottom of the panel.

Save as type

Saves a report in the specified file type, selected from the drop-down list. The report is saved in .csv, .pdf, or .mht.

Note:

If you select a file type different from the default, be sure to change the report file name extension in the Report Name field to match.

Auto increment report name if duplicate

Sets the application to automatically increment the name of the report file if the application finds a file with the same name as the one being generated. For example: DUT001, DUT002, DUT003. This option is enabled by default.

View report after generating

Automatically opens the report in a Web browser when the test execution is complete. This option is selected by default.

Report Customization Settings
Create CXL Report
Creates CXL device type for AIC/SYB of CEM Spec and Tx Test Board/SRIS Test Board of BaseSpec.
Note:This option is unselected by default.

CXL Support

Note:CXL device type support is newly added to the TekExpress PCIe TX application.
  • Supported Device Type and Data Rates:
    Device TypesData Rates
    CXL Add-In Card
    • 8 GB/s
    • 16 GB/s
    • 32 GB/s
    CXL System Board
    • 8 GB/s
    • 16 GB/s
    • 32 GB/s
    CXL TX Test Board
    • 8 GB/s
    • 16 GB/s
    • 32 GB/s
    CXL SRIS TX Test Board
    • 16 GB/s
    • 32 GB/s
  • Specification Reference: PCI Express Card Electromechanical Specification Revision 4.0 v1.0 and PCI Express Base Specification Revision 4.0 v1.0
  • Test Setup: The test setup for CXL is same as CEM or Base specification device types. Additionally, user needs to select Create CXL Report checkbox in the report panel to run the test in CXL mode.

Configure report view settings

The View Settings tab describes the report view settings to configure the Reports panel. Select report view settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 1. Report panel-View settings tab


Table 1. Report panel view settings
ControlDescription
Contents To Save Settings
Include pass/fail info in details tableSelect to include pass/fail information in the details table of the report.
Include detailed resultsSelect to include detailed results in the report.
Include plot imagesSelect to include the plot images in the report.
Include setup configurationSets the application to include hardware and software information in the summary box at the top of the report. Information includes: the oscilloscope model and serial number, the oscilloscope firmware version, and software versions for applications used in the measurements.
Include user commentsSelect to include any comments about the test that you or another user have added in the DUT tab of the Setup panel. Comments appear in the Comments section, below the summary box at the beginning of each report.
Include switch matrix configurationSelect to include the switch matrix configuration in the report.
Include Intermediate ResultsSelect to include intermediate test results for Gen4 and Gen5.
Group Test Result By
Test NameSelect to group the test results based on the test name in the report..
LaneSelect to display the test results by lane.
Equalization Select to display the test results by equalization.
Pass/Fail ResultsSelect to display the test results by pass or fail results.

View a generated report

Sample report and its contents

A report shows detailed results and plots, as set in the Reports panel.

Figure 1. Report


Setup Information
The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and serial number, optical module model and serial number, and software version numbers of all associated applications.
Test Name Summary Table
The test summary table lists all the tests which are executed with its result status.
Measurement
The measurement table displays the measurement related details with its parameter value.
User comments

If you had selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.

Generation Pass/Fail Table
The Generation Pass/Fail Table shows the pass/fail result of each individual generation. This table is shown only when the results are grouped by Test Name.

Saving and recalling test setup

Overview

You can save the test setup and recall it later for further analysis. Saved setup includes the selected oscilloscope, general parameters, acquisition parameters, measurement limits, waveforms (if applicable), and other configuration settings. The setup files are saved under the setup name at X:\TekExpress PCI Express

Figure 1. Example of Test Setup File


Use test setups to:
  • Recall a saved configuration.
  • Run a new session or acquire live waveforms.
  • Create a new test setup using an existing one.
  • View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results summary.
  • Run a saved test using saved waveforms.
Note:Images that are shown in this Saving and recalling test setup chapter are for illustration purpose only and it may vary depending on the TekExpress application.

Save the configured test setup

You can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s default value.

  • Select Options > Save Test Setup to save the opened setup.

  • Select Options > Save Test Setup As to save the setup with different name.

Load a saved test setup

To open (load) a saved test setup, do the following:

  • Select Options > Open Test Setup.

  • From the File Open menu, select the setup file name from the list and click Open.

Note:Parameters that are set for the respective test setup will enable after opening the file.

Perform a test using pre-run session files

Complete the following steps to load a test setup from a pre-run session:
  1. Select Options > Open Test Setup.

  2. From the File Open menu, select a setup from the list and then click Open.

    Note:Parameters that are set for the respective test setup will enable after opening the file.
  3. Switch the mode to Use Pre-recorded waveform files in the DUT panel.

  4. Select the required waveforms from the selected setup in the Acquisitions tab and click Start.

  5. The selected waveform file can be removed/replaced by clicking on the () icon.

  6. After successful completion of the test, the waveform report files are stored at X:\<Application Name>\Reports.
  7. The overall test result status after completion of the test execution is displayed in the Results Panel.

Save the test setup with a different name

To save a test setup with a different name, follow the steps:
  1. Select Options > Save Test Setup As.

  2. Enter the new test setup name and click Save.

Switch Matrix application

Product description

Switch Matrix application allows to configure and setup automated multi-lane testing using RF switch. The solution allows you to map each of the several transmitter signals and forward the selected input either to another relay or to the oscilloscope channel.

Application overview

This section describes the Switch Matrix application settings.



Table 1. Switch Matrix configuration settings
Item Description


Click to expand/collapse the switch matrix configuration.

Options



Click Help to view the software help document and About Switch Matrix for software version.
Switch Matrix configuration

Configuration



Select the configuration option:

  • Keithley S46T: 6-input-to-1-output switch configuration
  • Gigatronics ASCOR 8000: 8-input-to-1-output switch configuration
  • MiniCircuit ZTM6SP4T40: 4-input-to-1-output switch configuration
  • MiniCircuit ZTM28SP6T40: 6-input-to-1-output switch configuration
  • Auto Detect: Select to autodetect the switch.
  • New Configuration: Select to manually configure the switch.
  • Saved file names: Saved configuration file name(s) are displayed in the drop-down list. Select to recall the configuration.

    Below are the list of saved files available for Keithley and Gigatronics configurations.

  • PCE_Giga_AIC_x16
  • PCE_Giga_SYB_x8
  • PCE_GigaCCD_SYB_x16
  • PCE_Keithley_AIC_x12
  • PCE_Keithley_SYB_x6
  • Show All Files : Select to view the list of all saved files.

Vendor



Select the vendor from the drop-down list. This field is displayed:
  • When you select Configuration > New Configuration to create a fresh configuration.
  • When you open a saved configuration. The displayed vendor name is not editable.
  • When Auto Detect is selected. The displayed vendor name is not editable.

Link Width



Select the Link Width from the drop-down list. This determines the maximum number of lanes supported by the DUT.

Add <X> more lane(s)



Select to add extra lanes (Additional1, Additional2,....) to the lanes list. The extra lanes added are displayed in the relay signals.

You can add a maximum of 10 lanes.

Rename Lanes



Click to rename the lanes. Enter the LanePrefix and select the increment label type to suffix by either number or alphabet. The number of lanes depends on the Link Width selected. Clear the Auto rename lane check box to set unique names for the lanes.



De-embed

De-embed



Select the De-embed option:

Select the de-embed option and click Select Filter File to browse and select the filter file(s).

Debug Mode

Debug Mode



Select Debug Mode to manually configure the switch.

Switch Address

Enter the Switch Address in the GPIB or TCPIP format.

GPIB format: GPIB0:X:INSTR

TCPIP format: TCPIP::IPADDR::INSTR

Init Switch

This will synchronize the configuration of relay(s) in the application with the relay(s) in the switch. Synchronization will be successful only for the relays whose configuration matches with the physical switch. Pass/Fail status is displayed next to the button.

Note:Relay configurations (number of relays, number of relay inputs, and name of relays) in the application should match the physical switch, for successful synchronization.

Switch Self-Test

This will close and open all switch channels one-by-one and displays the pass/fail status of the channel next to the ID. A self-test report (CSV) is generated at the end of the process. You cannot abort this process.

Note:Initialize the switch before performing the self-test.

Reset Switch

Click Reset Switch to reset the switch. This will open all channels.

Scope Address

Enter the oscilloscope address in the GPIB or TCPIP format.

GPIB format: GPIB0:X:INSTR

TCPIP format: TCPIP::IPADDR::INSTR

Init Scope

Enter the oscilloscope address in the Scope Address field and click Init Scope to initialize the oscilloscope. This will establish the connection with the oscilloscope. The pass/fail status is displayed next to the button.

Apply De-embed settings

Select to apply de-embed settings to the channels.

When the oscilloscope is initialized and de-embed settings are configured, closing a connection will apply the de-embed settings and then close the connection.

Relays

Relays



Select the relay(s). In SPnT, n represents the number of connection signals for the relay. For example, SP4T is a four signal connection relay.

This field displays only for a new configuration. By default, zero relays are selected.

Enter the total number of relays to be loaded in their respective input box and click Load.

You can also click or to increase or decrease the number.

Save



Click to save the configuration at C:\ProgramData\Tektronix\Switch Matrix Configurations\*.xml.

This operation checks whether all the required configurations are done. If any of the required configurations are not selected, then error popup is displayed, which prompts you to complete the configuration(s).

Clear All



Click to clear all configurations. The application will be loaded with Configuration drop-down (default).

Channel Status



Click to view the relays and status of channels of Keithley or Gigatronics switch. This updates the channel status dynamically.

In Switch Channel Status Viewer, select the Vendor type, enter the Switch Address and click Init to initialize the switch. This will establish the connection with the switch.

Click Query Status to get the details of the relays of the switch and the status of the channels.

Click Reset to reset the status viewer.



Graphical View



Click to view the graphical representation of the configured relays. If the relays are cascaded, then they are also displayed in the graphical representation.

Relay configuration

Signal Polarity



Select the signal polarity of DUT:

  • Positive: populates Lane0+, Lane1+, …. connection signals.
  • Negative: populates Lane0-, Lane1-, …. connection signals.
  • Differential: populates Lane0, Lane1, …. connection signals.
Relay Name

Enter the relay name. This name should match the relay name of the connected switch.

Delete



Click to delete the relay. This configuration is only available for the configured (loaded) relays, when Configuration > New Configuration is selected.

Cascade



Select to cascade the relay by connecting the common channel as the input signal for another relay.

Select the Relay and the Input of the relay. Check that the selected relay signal displays the appropriate relay name.

The cascade settings is also displayed in the graphical view.

Click here to get details about Cascade.

Note:Select the cascade settings before you save the configuration.
Common

Select the oscilloscope channel for Common. If cascaded, it displays the name of the relay.

Click Reset Inputs to clear all connection signal settings.

Note:Select the common settings for all the relays, before you save the configuration.


Signal

Select the DUT connection signal. This drop-down list shows the lanes based on Link Width and Signal Polarity settings.

If the link width is x8 and signal polarity is Positive, then the Signal drop-down list will have Lane0+ to Lane7+ options.

Input

This button is enabled only in debug mode and if a valid signal is configured for the channel. Click to close or open the channel.

ID

Enter the three character alias name for the channel. This is shown in the graphical view of switch matrix configuration.

Filter File

This column shows or indicating the status of the filter file configuration for the channel. If no de-embed option is selected, then this column remains blank.

Status

This column displays the status of the channel.

Channel closed (normally closed) :

Channel opened (normally opened) :

1 Configure at least one relay before configuring the de-embed settings.

File name extensions

This application uses the following file name extensions:

File name extension Description
.html Saved configuration and Graphical view file formats
.xml Switch Matrix configuration files

Status indicators

Status indicators Description

Success indicator

Failure indicator

Closed channel indicator (NC = Normally Closed)

Opened channel indicator (NO = Normally Opened)

Saved configurations

Click Configuration > Show All Files to view the list of all saved files.



Table 1. Saved configurations
Item Description
Open Opens the selected file.
Delete Deletes the selected file.
Cancel Closes the Saved Configurations window.

De-embed settings

De-embed allows you to apply filter file(s) for relay(s). Select the De-embed option and click Select Filter File to browse and select the filter file(s).

Figure 1. De-embed options


Graphical view of switch matrix configuration

The Graphical view displays the pictorial representation of the switch configuration.

The following figure displays the graphical view of a Keithley switch configuration.



Saving the configuration

Click Save in the configuration panel; in the Configuration Save dialog box, enter the file name and click Save. The default save path is C:\ProgramData\Tektronix\Switch Matrix Configurations\.



Note:Save configuration checks whether all the required configurations are done. If any of the required configurations are not selected, then error message is displayed, which prompts you to complete the configuration(s).

Feature description

Error messages

Error message Possible solution

"A filename cannot be empty and it cannot contain any of the following characters:\n\t. .. \\ / : ? \" < > | * ! @ # $ % ^ & * ( ) - + ., / \\ \' < >

Also, the file name cannot be \"Keithley S46T\",\"Gigatronics ASCOR 8000\",\"MiniCircuit ZTM6SP4T40\",\"MiniCircuit ZTM28SP6T40\", \"Select\", \"New Configuration\", \"Custom\" , \"Auto Detect\" or \"Show All Files\""

Configure appropriate signals before the de-embed settings. Select at least one signal for a relay before configuring the de-embed settings.
Either the instrument address is invalid or instrument is not connected. Check the GPIB connection from oscilloscope to switch and verify the instrument address.

Error occurred while trying to recall the configuration settings.

Try re-creating configuration or recalling a different configuration file.

Re-create the configuration file or recall a different configuration file.
Error occurred while trying to access the connection for open/close operation.
Filter file <FilterFileName> not found. Reselect the de-embed filter file and try again.
Graphical view is not generated or does not exist.
Initialize the switch Initialize the switch and then perform the switch operations.
Instrument address doesn't belong to any supported switch. Verify the switch address.
Instrument address is empty. Instrument address cannot be empty. Enter a valid instrument address in the GPIB (GPIB0:X:INSTR) or TCPIP (TCPIP::IPADDR::INSTR) format.
No switch detected. Connect a Keithley or Mini Circuit switch and try auto detection by selecting Configuration > Auto Detect. Check the GPIB connection from the oscilloscope to switch and whether the instrument is detected in TekVisa.
Number of relays cannot be more than 26
Please ensure that the name(s) of the configured relay(s) match the ones present on the physical switch.
Relay name cannot be empty
Scope initialization failed. Check if the address is valid and ensure that the instrument is switched on and try again. Validate the oscilloscope address try again.
Switch communication failed... Ensure that the switch is on. Reset the switch and try again.
Switch initialization failed. Check if the address is valid and ensure that the instrument is switched on and try again. Validate the switch address and ensure that the instrument is switched on. Try again.
The start count cannot be more than 74
Timeout Error. Either the command is invalid or instrument is not active. Check the command syntax and the connection of the instrument by SWITCH:*IDN command.
Two or more lanes have same name. The lane names should be unique.
Two or more relays have same name.

SCPI Commands

About SCPI command

You can use the Standard Commands for Programmable Instruments (SCPI) to communicate remotely with the TekExpress application. Complete the TCPIP socket configuration and the TekVISA configuration in the oscilloscope or in the device where you are executing the script.
Note:If you are using an external PC to execute the remote interface commands, then install TekVISA in the PC to make the configurations.

Socket configuration for SCPI commands

This section describes the steps to configure the TCPIP socket configuration in your script execution device and the steps to configure the TekVISA configuration in the oscilloscope to execute the SCPI commands.

TCPIP socket configuration

  1. Click Start > Control Panel > System and Security > Windows Firewall > Advanced settings.

  2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer > Inbound Rules and click New Rule…

  3. In New Inbound Rule Wizard menu
    1. Select Port and click Next.

    2. Select TCP as rule apply, enter 5000 for Specific local ports and click Next.

    3. Select Allow the connection and click Next.

    4. Select Domain, Private, Public checkbox and click Next.

    5. Enter Name, Description (optional), and click Finish.

  4. Check whether the Rule name is displayed in Windows Firewall with Advanced Security menu > Inbound Rules.

TekVISA configuration

  1. Click Start > All Programs > TekVISA > OpenChoice Instrument Manager.

  2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of the TekExpress device in Hostname and type Port as 5000. Click to configure the IP address with Port.

    Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the oscilloscope where the TekExpress application is running.



  3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager > Instruments.

  4. Double-click OpenChoice Talker Listener and enter the Command *IDN? in command entry field and click Query. Check that the Operation is successful and Talker Listener Readout displays the Command / Data.

Set or query the device name of application

This command sets or queries the device name of the application.

Syntax

TEKEXP:SELECT DEVICE,"<DeviceName>" (Set)

TEKEXP:SELECT? DEVICE (Query)

Command arguments

Argument NameArgument Type

<DeviceName>

<String>

Returns

<String>

Examples

TEKEXP:SELECT DEVICE,"<DeviceName>" command sets the device name of the application.

TEKEXP:SELECT? DEVICE command returns the selected device name of the application.

Set or query the suite name of the application

This command sets or queries the suite name of the application.

Syntax

TEKEXP:SELECT SUITE,"<SuiteName>" (Set)

TEKEXP:SELECT? SUITE (Query)

Command arguments

SuiteName
  • For CEM, valid values are System-Board, Add-In-Card
  • For U.2(SFF-8639), valid values are Host, Module
  • For BaseSpec, valid value is TX Test Board and SRIS TX Test Board
  • For M.2, valid values are M2_Add-In-Card and M2_Host
  • For RefClockSpec valid value is Ref Clock

Returns

<String>

Examples

TEKEXP:SELECT SUITE,"<SuiteName>" command sets the suite name of the application.

TEKEXP:SELECT? SUITE command returns the selected suite of the application.

Set or query the test name of the application

This command selects or deselects the specified test name of the application.

Syntax

TEKEXP:SELECT TEST,"<TestName>",<Value> (Set)

TEKEXP:SELECT TEST,"<ALL>" (Set)

TEKEXP:SELECT? TEST (Query)

Command arguments

TestNameValue
Tests for CEM
  • Median Peak Jitter Gen1
  • Min Eye Width Gen1
  • Min Time Between Crossovers Gen1
  • Non Transition Eye Diagram Gen1
  • Peak to Peak Jitter Gen1
  • RMS Jitter (Per Edge) Gen1
  • Transition Eye Diagram Gen1
  • Unit Interval Gen1
  • Composit Eye Height Gen2
  • Dj_dd Gen2
  • Min Eye Width Gen2
  • Min Time Between Crossovers Gen2
  • Non Transition Eye Diagram Gen2
  • Peak to Peak Jitter Gen2
  • RJ(RMS) Gen2
  • TJ @ E-12 Gen2
  • Transition Eye Diagram Gen2
  • Unit Interval Gen2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
  • Composite Eye Height Gen4
  • Dj_dd Gen4
  • Extrapolated Eye Height Gen4
  • Min Eye Width Gen4
  • Min Time Between Crossovers Gen4
  • Non Transition Eye Diagram Gen4
  • Peak to Peak Jitter Gen4
  • RJ(RMS) Gen4
  • TJ @ E-12 Gen4
  • Transition Eye Diagram Gen4
  • Uncorrelated PWJ TJ@E-12 Gen4
  • Unit Interval Gen4
  • Composite EH Gen5
  • Composite EW Gen5
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

  • Deterministic DD Jitter Gen5
  • ExtrapolatedJitter Gen5
  • Eye Height@BER Gen5
  • Eye Width@Ber Gen5
  • RandomJitter Gen5
  • UnitInterval Gen5
  • TIE RJ(RMS) Gen5
  • Uncorrelated TIE TJ @E-12 Gen5 (Add-In Card Only)
  • Uncorrelated TIE DJ dd@E-12 Gen5 (Add-In Card Only)
  • Uncorrelated PWJ TJ @E-12 Gen5 (Add-In Card Only)
  • Uncorrelated PWJ DJ dd@E-12 Gen5 (Add-In Card Only)
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Tests for BaseSpec
  • Average UI Gen3
  • AC CM 4GHz Gen3
  • AC CM 30KHz-500MHz Gen3
  • DDj Gen3
  • EIEOS Min Voltage Gen3
  • F/2 Jitter Gen3
  • PS21 Ratio Gen3
  • PWJ RJ (RMS) Gen3
  • TIE RJ (RMS) Gen3
  • Uncorrelated PWJ DJ dd@E-12 Gen3
  • Uncorrelated PWJ TJ@E-12 Gen3
  • Uncorrelated TIE DJ dd@E-12 Gen3
  • Uncorrelated TIE TJ @ E-12 Gen3
  • V Tx_no_eq Gen3
  • Average UI Gen4
  • AC CM 8Ghz Gen4
  • AC CM 30KHz-500MHz Gen4
  • DDj Gen4
  • EIEOS Min Voltage Gen4
  • F/2 Jitter Gen4
  • PS21 Ratio Gen4
  • PWJ RJ (RMS) Gen4
  • TIE RJ (RMS) Gen4
  • Uncorrelated PWJ DJ dd@E-12 Gen4
  • Uncorrelated PWJ TJ@E-12 Gen4
  • Uncorrelated TIE DJ dd@E-12 Gen4
  • Uncorrelated TIE TJ @ E-12 Gen4
  • V Tx_no_eq Gen4
  • Average UI Gen5
  • AC CM 4GHz Gen5
  • AC CM 16GHz Gen5
  • DDj Gen5
  • EIEOS Min Voltage Gen5
  • F/2 Jitter Gen5
  • PS21 Ratio Gen5
  • PWJ RJ (RMS) Gen5
  • TIE RJ (RMS) Gen5
  • Uncorrelated PWJ DJ dd@E-12 Gen5
  • Uncorrelated PWJ TJ@E-12 Gen5
  • Uncorrelated TIE DJ dd@E-12 Gen5
  • Uncorrelated TIE TJ @ E-12 Gen5
  • V Tx_no_eq Gen5
  • RLM_Gen6
  • SNDR_Gen6
  • Uncorrelated Tie Tj@ E-12 Gen6
  • Uncorrelated TIE DJ dd@E-12 Gen6
  • TIE RJ(RMS) Gen6
  • Uncorrelated PWJ TJ @E-12 Gen6
  • Uncorrelated PWJ DJ dd@E-12 Gen6
  • PS21Ratio Gen6
  • V Tx_Boost Gen6
  • AC CM 16Ghz Gen6
  • AC CM 30KHz-500MHz Gen6
  • V Tx_Diff_Pk_To_Pk Gen6
  • V Tx_EIEOS Gen6
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Tests for U.2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Tests for M.2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Test for RefClockSpec
  • HF RMS Jitter Gen5
  • AC-REFCLK Gen5
{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Returns

{True | False} or {1 | 0}

Examples

TEKEXP:SELECT TEST,"<TestName>",1 command selects the specified test in the Test Panel.

TEKEXP:SELECT TEST,"<ALL>" command select all the tests in the Test Panel.

TEKEXP:SELECT? TEST command returns the list of selected tests.

Set or query the version name of the application

This command sets or queries the version name of the application.

Syntax

TEKEXP:SELECT VERSION,”<VersionName>” (Set)

TEKEXP:SELECT? VERSION (Query)

Command arguments

Argument NameArgument TypeValid Values
<VersionName><String>It is the name of the version on the DUT panel of the application.
VersionName
  • Gen1-1.0a (Applicable for DeviceName = CEM)
  • Gen1-1.1 (Applicable for DeviceName = CEM)
  • Gen2-2.0 (Applicable only DeviceName = CEM)
  • Gen3-3.0 (Applicable only DeviceName = CEM, BaseSpec, U.2(SFF-8639 and M.2)
  • Gen4-4.0 (Applicable only DeviceName = CEM and BaseSpec)
  • Gen5-5.0 (Applicable only DeviceName = CEM, BaseSpec and RefClockSpec)
  • Gen6-6.0 (Applicable only DeviceName = BaseSpec)

Returns

<String>

Examples

TEKEXP:SELECT VERSION,”<VersionName>” command sets the version name of application.

TEKEXP:SELECT? VERSION command returns the version name of application.

Set or query the general parameter values

This command sets or queries the general parameter values of the application.

Syntax

TEKEXP:VALUE GENERAL,"<ParameterName>","<Value>" (Set)

TEKEXP:VALUE? GENERAL,"<ParameterName>" (Query)

Command arguments

Table 1. Command arguments for general settings
ParameterNameValue
Value
Specifies the value parameters.
  • For InstrumentType, valid values are:
    • Comment
  • For DUTID, valid values are:
    • Comment
InstrumentType

Specifies the instrument type.

Valid values are:
  • Alternate Real Time Scope
  • Real Time Scope
DataRate2Gb
  • Included
  • Excluded
DataRate5Gb
  • Included
  • Excluded
DataRate8Gb
  • Included
  • Excluded
DataRate16Gb
  • Included
  • Excluded
DataRate32Gb
  • Included
  • Excluded
DataRate64Gb
  • Included
  • Excluded
PreEmphasis3dB
  • Included
  • Excluded
PreEmphasis6dB
  • Included
  • Excluded
SSC
  • On
  • Off
VoltageSwing
  • Full
  • Reduced
Link Widths
  • 1 Lane
  • 2 Lanes
  • 4 Lanes
  • 8 Lanes
  • 16 Lanes
SignalPreset8Gb

Signal quality preset selection values are P0, P1, P2, P3, P4, P5, P6, P7, P8, P9, P10.

To select multiple signal quality preset, specify as P0_P1_P2

SignalPreset16Gb
SignalPreset32Gb
Preset8Gb

Preset selection values are P0_, P1_, P2_, P3_, P4_, P5_, P6_, P7_, P8_, P9_, P10_.

To select multiple signal quality preset, specify as P0_P1_P2

Preset16Gb
Preset32Gb
Preset64Gb

Preset selection values are Q0_, Q1_, Q2_, Q3_, Q4_, Q5_, Q6_,Q7_, Q8_, Q9_, Q10_.

To select multiple signal quality preset, specify as Q0_Q1_Q2

Acquisition
  • BeforeAnalysis
  • AcquireOnly
AcquisitionCountGen4 1 to 10
AcquisitionCountGen5
SaveOptions
  • Save All the Waveforms
  • Save Only Analyzed Waveform
  • No Waveforms saved - Discard after analysis
DeEmbed2Gb
  • Included
  • Excluded
DeEmbed5Gb
  • Included
  • Excluded
DeEmbed8Gb
  • Included
  • Excluded
DeEmbed16Gb
  • Included
  • Excluded
DeEmbed32Gb
  • Included
  • Excluded
DeEmbed64Gb
  • Included
  • Excluded
Embed8Gb
  • Included
  • Excluded
Embed16Gb
  • Included
  • Excluded
Embed32Gb
  • Included
  • Excluded
Filterfile2Gb Filterfile2Gb.flt
Filterfile5Gb Filterfile5Gb.flt
FilterfileDeEmbed8Gb FilterfileDeEmbed8Gb.flt
FilterfileEmbed8Gb FilterfileEmbed8Gb.flt
FilterfileDeEmbed16Gb FilterfileDeEmbed16Gb.flt
FilterfileEmbed16Gb FilterfileEmbed16Gb.flt
FilterfileDeEmbed32GbPos FilterfileDeEmbed32GbPos.flt
FilterfileDeEmbed32GbNeg FilterfileDeEmbed32GbNeg.flt
FilterfileDeEmbed64GbPosFilterfileDeEmbed64GbPos.flt
FilterfileDeEmbed64GbNeg FilterfileDeEmbed64GbNeg.flt
FilterfileEmbed32Gb FilterfileEmbed32Gb.flt
FilterfileDeEmbed32GbFilterfileDeEmbed32Gb.flt
EnableDUTAutomation
  • Included
  • Excluded
DeskewAutomation
  • Included
  • Excluded
Automation Settings
  • Use Default Settings
  • Manually Configure Settings
  • Use Custom Settings
Signal Type
  • Square
  • Sine
Gen4DataClockPatternCount0 to 9
Gen5DataClockPatternCount0 to 9
RecordLength2Gb 2.5e6
RecordLength5Gb 10e6
RecordLength8Gb 10e6
RecordLength16Gb 20e6
RecordLength32Gb 12.5e6
RecordLength64Gb12.5e6
SampleRate2Gb 50e9
SampleRate5Gb 50e9
SampleRate8Gb 50e9
SampleRate16Gb 100e9
SampleRate32Gb 200e6
SampleRate64Gb200e6
Bandwidth2Gb 6e9
Bandwidth5Gb 12.5e9
Bandwidth8Gb 13e9
Bandwidth16Gb 16e9
Bandwidth32Gb
  • 33e9 (CEM)
  • 50e9 (Base)
Bandwidth64Gb50e9
Signal Validation
  • Prompt me if Signal Check Fails
  • Skip Test if Signal Check Fails
  • Turn Off Signal Check
SqSigtestPathGen3

Sigtest file path.

Example: C:\Program Files (x86)\SigTest 4.0.51\SigTest.exe

PresetSigtestPathGen3
SqtestPathGen4
PresetSigtestPathGen4
SqtestPathGen5
PresetSigtestPathGen5
PHYSigtestPathGen5
SigtestTemplate2Gbps
SigtestTemplate5Gbps3Db
SigtestTemplate5Gbps6Db
SigtestTemplate8Gbps
SigtestTemplate16Gbps
SigtestTemplate32GbpsJitterMeas
SigtestTemplate32GbpsVoltageMeas
SigtestTemplate16GbpsPwjTest
SigtestTemplate32GbpsPHYTest
SigtestTemplate32GbpsSignalTest
Include Intermediate Results
  • Included
  • Excluded
Awg Clock Setup
  • Included
  • Excluded
SRIS SSC
  • On
  • Off
SlotNumber 05
Scope Noise Auto Mode
  • Included
  • Excluded
CTLE Auto Mode
  • Included
  • Excluded
CTLERecordLengthValue: 1.0 to 20.0
OptimalCTLEValueValue: 0.0 to 15.0
CTLEStepSize
  • 0.25
  • 0.5
  • 1.0
Scope Noise Compensation (SNDR)Value: 0.0 to 20.0
Scope Noise Compensation (TIE Jitter)Value: 0.0 to 20.0
Scope Noise Compensation (PWJ)Value: 0.0 to 20.0
Signal Validation Threshold(mV) 200
Report Update Mode
  • New
  • Append
  • Replace
Trigger Type
  • Edge
  • Width
  • Auto
DUTID Comment

User comment

Timer Warning Info Message Popup
  • "True"
  • "False"
Timer Warning Info Message Popup Duration 0 to 20
Timer Error Message Popup
  • "True"
  • "False"
Timer Error Message Popup Duration 0 to 20
On Failure Stop and Notify True or False
Automate with Switch True or False
DeskewAlertEnabled True or False
On Failure Stop and Notify True or False
On Failure Pause True or False
JitterTestAcquireType (For Basespec Only)
  • CompliancePattern
  • DataClockPattern
SigtestSilentModeTrue or False
Gen5RefClockData (For RefClockSpecOnly)True or False
SiliconLabTool (For RefClockSpecOnly)True or False
Probing Type (For All)
  • Differential
  • Single Ended
RecordLengthRefGen5 (For RefClockSpec Only)80e6
SampleRateRefGen5 (For RefClockSpec Only) 50e9
BandwidthRefGen5 (For RefClockSpec Only)5e9
Table 2. Command arguments for report settings
ParameterNameValue
Report Update Mode
  • New
  • Append
  • Replace
Report Path

X:\<application name>\Reports\DUT001.mht

Save As Type
  • Web Archive (*.mht;*.mhtml)
  • PDF (*.pdf;)
  • CSV (*.csv;)
Auto increment report name if duplicate{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Create report at the end{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Include Pass/Fail Results Summary{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Include Detailed Results{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Include Plot Images{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Include Setup Configuration{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
CXL Report Selection
  • Included
  • Excluded
Include Complete Application Configuration{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected
Include User Comments{True | False} or {1 | 0}

It represents selected or unselected.

Where,
  • True or 1 - Selected
  • False or 0 - Unselected

Returns

<NRf> or <String>

Examples

TEKEXP:VALUE GENERAL,"<ParameterName>","<Value>" command set the value for the specified general parameter.

TEKEXP:VALUE? GENERAL,"<ParameterName>" command returns the value for the specified general parameter.

Query the available devices in the DUT panel of the application

This command queries the list of available devices on the DUT panel as comma separated values.

Syntax

TEKEXP:LIST? DEVICE (Query)

Command arguments

DeviceDevice Type and valueDescription
<Device>
  • CEM
  • BaseSpec
  • RefClockSpec
  • U.2(SFF-8639)
  • M.2
It is the name of the device on the DUT panel of the application.

Returns

<String>

Examples

TEKEXP:LIST? DEVICE command returns the list of available devices.

Query the available suites for the selected device

This command queries the list of available suites for the selected device as comma separated values.

Syntax

TEKEXP:LIST? SUITE (Query)

Returns

<String>

Examples

TEKEXP:LIST? SUITE command returns the list of available suites for the selected device.

Query the list of available tests of the application

This command queries the list of available tests of the application for the selected device as comma separated values.

Syntax

TEKEXP:LIST? TEST (Query)

Command arguments

TestNameString
Tests for CEM
  • Median Peak Jitter Gen1
  • Min Eye Width Gen1
  • Min Time Between Crossovers Gen1
  • Non Transition Eye Diagram Gen1
  • Peak to Peak Jitter Gen1
  • RMS Jitter (Per Edge) Gen1
  • Transition Eye Diagram Gen1
  • Unit Interval Gen1
  • Composit Eye Height Gen2
  • Dj_dd Gen2
  • Min Eye Width Gen2
  • Min Time Between Crossovers Gen2
  • Non Transition Eye Diagram Gen2
  • Peak to Peak Jitter Gen2
  • RJ(RMS) Gen2
  • TJ @ E-12 Gen2
  • Transition Eye Diagram Gen2
  • Unit Interval Gen2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
  • Composite Eye Height Gen4
  • Dj_dd Gen4
  • Extrapolated Eye Height Gen4
  • Min Eye Width Gen4
  • Min Time Between Crossovers Gen4
  • Non Transition Eye Diagram Gen4
  • Peak to Peak Jitter Gen4
  • RJ(RMS) Gen4
  • TJ @ E-12 Gen4
  • Transition Eye Diagram Gen4
  • Uncorrelated PWJ TJ@E-12 Gen4
  • Unit Interval Gen4
  • Composite EH Gen5
  • Composite EW Gen5
  • Deterministic DD Jitter Gen5
  • ExtrapolatedJitter Gen5
  • Eye Height@BER Gen5
  • Eye Width@Ber Gen5
  • RandomJitter Gen5
  • UnitInterval Gen5
  • TIE RJ (RMS) Gen5
  • Uncorrelated PWJ DJ dd@E-12 Gen5 (Add-In Card Only)
  • Uncorrelated PWJ TJ@E-12 Gen5 (Add-In Card Only)
  • Uncorrelated TIE DJ dd@E-12 Gen5 (Add-In Card Only)
  • Uncorrelated TIE TJ @ E-12 Gen5 (Add-In Card Only)
Tests for BaseSpec
  • Average UI Gen3
  • AC CM 4GHz Gen3
  • AC CM 30KHz-500MHz Gen3
  • DDj Gen3
  • EIEOS Min Voltage Gen3
  • F/2 Jitter Gen3
  • PS21 Ratio Gen3
  • PWJ RJ (RMS) Gen3
  • TIE RJ (RMS) Gen3
  • Uncorrelated PWJ DJ dd@E-12 Gen3
  • Uncorrelated PWJ TJ@E-12 Gen3
  • Uncorrelated TIE DJ dd@E-12 Gen3
  • Uncorrelated TIE TJ @ E-12 Gen3
  • V Tx_no_eq Gen3
  • Average UI Gen4
  • AC CM 8Ghz Gen4
  • AC CM 30KHz-500MHz Gen4
  • DDj Gen4
  • EIEOS Min Voltage Gen4
  • F/2 Jitter Gen4
  • PS21 Ratio Gen4
  • PWJ RJ (RMS) Gen4
  • TIE RJ (RMS) Gen4
  • Uncorrelated PWJ DJ dd@E-12 Gen4
  • Uncorrelated PWJ TJ@E-12 Gen4
  • Uncorrelated TIE DJ dd@E-12 Gen4
  • Uncorrelated TIE TJ @ E-12 Gen4
  • V Tx_no_eq Gen4
  • Average UI Gen5
  • AC CM 4GHz Gen5
  • AC CM 16GHz Gen5
  • DDj Gen5
  • EIEOS Min Voltage Gen5
  • F/2 Jitter Gen5
  • PS21 Ratio Gen5
  • PWJ RJ (RMS) Gen5
  • TIE RJ (RMS) Gen5
  • Uncorrelated PWJ DJ dd@E-12 Gen5
  • Uncorrelated PWJ TJ@E-12 Gen5
  • Uncorrelated TIE DJ dd@E-12 Gen5
  • Uncorrelated TIE TJ @ E-12 Gen5
  • V Tx_no_eq Gen5
  • UnitInterval Gen6
  • RLM Gen6
  • SNDR Gen6
  • Uncorrelated Tie Tj@ E-06 Gen6
  • Uncorrelated TIE DJ dd@E-06 Gen6
  • TIE RJ(RMS) Gen6
  • Uncorrelated PWJ TJ @E-06 Gen6
  • Uncorrelated PWJ DJ dd@E-06 Gen6
  • PS21Ratio Gen6
  • V Tx_Boost Gen6
  • AC CM 16Ghz Gen6
  • AC CM 30KHz-500MHz Gen6
  • V Tx_Diff_Pk_To_Pk Gen6
  • V Tx_EIEOS Gen6
Tests for U.2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
Tests for M.2
  • Composit Eye Height Gen3
  • Dj_dd Gen3
  • Min Eye Width Gen3
  • Min Time Between Crossovers Gen3
  • Non Transition Eye Diagram Gen3
  • Peak to Peak Jitter Gen3
  • RJ(RMS) Gen3
  • TJ @ E-12 Gen3
  • Transition Eye Diagram Gen3
  • Unit Interval Gen3
Test for RefClockSpec
  • RMS Jitter Gen5
  • AC-REFCLK Gen5 1

Returns

<String>

Examples

TEKEXP:LIST? TEST command returns the list of available tests for the selected device.

1 Supported in Skyworks Clock Jitter Tool.

Query the available version names of the application

This command queries the list of available version names of the application for the selected device as comma separated values.

Syntax

TEKEXP:LIST? VERSION (Query)

Returns

<String>

Examples

TEKEXP:LIST? VERSION command returns the list of version names for the selected device.

Query the list of available instruments based on the specified instrument type

This command queries the list of available instruments based on the specified instrument type.

Syntax

TEKEXP:LIST? INSTRUMENT,"<InstrumentType>" (Query)

Command argument

Argument NameArgument value
<InstrumentType><String>

Returns

<String>

Examples

TEKEXP:LIST? INSTRUMENT,"Real Time Scope" command returns the list of available instruments based on the real time scope type.

Set or query the IP address of the instrument based on the specified instrument type

This command sets or queries the IP address of the instrument based on the specified instrument type.

Syntax

TEKEXP:INSTRUMENT? "<InstrumentType>" (Query)

TEKEXP:INSTRUMENT, "<InstrumentType>","<Value>" (Set)

Command argument

Argument NameArgument Type
<InstrumentType><String>
<Value><String>

TCPIP::XXX.XX.XXX.XXX::INSTR

Returns

<String>

Examples

TEKEXP:INSTRUMENT? "<InstrumentType>" command returns the IP address of the oscilloscope.

TEKEXP:INSTRUMENT, "<InstrumentType>","<value>" command sets the oscilloscope to the specified IP address.

Query the information of the generated report file

This command queries the information of the generated report file in the format "<FileSize>","<FileName>".

Pre‐requisite

A session should be run earlier and the report should be generated to get the information of the report.

Syntax

TEKEXP:INFO? REPORT (Query)

Returns

<FileSize>:: <String>

<FileName>:: <String>

Examples

TEKEXP:INFO? REPORT command returns the information of the generated report in the format ("1215”,"DUT001.mht”).

Query the information of the generated waveform files

This command queries the information of the generated waveform files in the format.

<File1Size,"File1Name”>.

If there are more than one waveform, the waveform file names are displayed with the comma separated values in the format

<File1Size,"File1Name">,<File2Size,"File2Name">.

Syntax

TEKEXP:INFO? WFM (Query)

Returns

<FileSize>:: <String>

<FileName>:: <String>

Examples

TEKEXP:INFO? WFM command returns the information of the generated waveform in the format (20000858,"X:\PCI Express\Untitled Session\DUT001\20200916_041609\Iter1_Short Record‐length for SCOPE Period_NoSSC_DIFF.wfm”).

Query the information of the generated image files

This command queries the information of the generated image files in the format.

<File1Size,"File1Name”>.

If there are more than one image, the image file names are displayed with the comma separated values in the format

<File1Size,"File1Name">,<File2Size,"File2Name">.

Syntax

TEKEXP:INFO? IMAGE (Query)

Returns

<FileSize>:: <String>

<FileName>:: <String>

Examples

TEKEXP:INFO? IMAGE command returns the information of the generated image in the format (109058, "X:\PCI Express\Untitled Session\DUT001\20200916_041609\Iter1_Short Record‐length for SCOPE Period_NoSSC_DIFF.png";22794,"X:\PCI Express\UntitledSession\DUT001\20 200916_041609\ScopePeriodPlot_Iteration1WithCursor.png").

Query the active TekExpress application name

This command queries the active TekExpress application name running on the oscilloscope.

Syntax

TEKEXP:*IDN? (Query)

Returns

<String>

Examples

TEKEXP:*IDN? command returns the active TekExpress application name running on the oscilloscope.

Set or query the DUTID of application

This command sets or queries the DUTID of the application.

Syntax

TEKEXP:VALUE DUTID,"<Value>" (Set)

TEKEXP:VALUE? DUTID (Query)

Command arguments

Argument NameArgument Type
<Value><String>

Returns

<String>

Examples

TEKEXP:VALUE DUTID,"DUT001" command sets the DUTID of the application to DUT001.

TEKEXP:VALUE? DUTID command returns the DUTID of the application.

Sets or query the acquire mode status

This command sets or queries the acquire mode status.

Syntax

TEKEXP:ACQUIRE_MODE <Mode> (Set)

TEKEXP:ACQUIRE_MODE? (Query)

Command arguments

Argument NameArgument value
<Mode>
  • LIVE
  • PRE‐RECORDED

Returns

LIVE | PRE‐RECORDED

Examples

TEKEXP:ACQUIRE_MODE LIVE command sets the acquire mode to the Live mode.

TEKEXP:ACQUIRE_MODE? command returns the current acquire mode.

Set or query the execution mode status

This command sets or queries the execution mode status.

Syntax

TEKEXP:MODE <Mode> (Set)

TEKEXP:MODE? (Query)

Command arguments

Argument NameArgument value
<Mode>
  • COMPLIANCE
  • USER‐DEFINED

Returns

COMPLIANCE | USER‐DEFINED

Examples

TEKEXP:MODE COMPLIANCE command sets the execution mode to the compliance mode.

TEKEXP:MODE? command returns the current execution mode.

Generate the report for the current session

This command generates the report for the current session.

Syntax

TEKEXP:REPORT GENERATE(Set)

Arguments

N/A

Examples

TEKEXP:REPORT GENERATE command generates the report for the current session.

Query the value of specified report header field in the report

This command queries the value of specified report header field in the report.

Syntax

TEKEXP:REPORT? ”<Device Field>” (Query)

Command arguments

Argument NameArgument Type
<Device Field>

Device field is the header name of each field in the setup information section of the report.



<String>

Returns

<String>

Examples

TEKEXP:REPORT? "DUT ID" command returns the value of DUT ID field in the report.

Query the value of specified result detail available in report summary/details table

This command queries the value of specified result detail available in report summary/details table.

Syntax

TEKEXP:RESULT? "<TestName>" (Query)

TEKEXP:RESULT? "<TestName>","<ColumnName>" (Query)

TEKEXP:RESULT? "<TestName>","<ColumnName>",<RowNumber> (Query)

Command arguments

Argument NameArgument Type
<TestName>

It is the test name of which the details are required in the report.

<String>
<ColumnName>

It is the column header name of which the details are required in the report.

<String>
<RowNumber>

It is the row number of which the details are required in the report.

<String>

Returns

<String>

Examples

TEKEXP:RESULT? "<TestName>" will return the pass fail status of test.

TEKEXP:RESULT? "<TestName>","<ColumnName>" will return all the row values of specific column for the test with comma separated values.

TEKEXP:RESULT? "<TestName>","<ColumnName>",<RowNumber> will return the column value of specified row number.

Restore the setup to default settings

This command restores the setup to default settings.

Syntax

TEKEXP:SETUP Default(Set)

Arguments

N/A

Examples

TEKEXP:SETUP Default command restores the setup to default settings.

Save the setup

This command saves the setup.

Syntax

TEKEXP:SETUP Save(Set)

Examples

TEKEXP:SETUP Save command saves the setup.

Save the settings to a specified session

This command saves the settings to a specified session.

Syntax

TEKEXP:SETUP Save,"<SessionName>"

Command arguments

Argument NameArgument value
<SessionName><String>

Examples

TEKEXP:SETUP Save,"<SessionName>" command saves the settings to a specified session.

Open the setup from a specified session

This command opens the setup from a specified session.

Syntax

TEKEXP:SETUP Open,"<SessionName>"(Set)

Command arguments

Argument NameArgument value
<SessionName><String>

Examples

TEKEXP:SETUP Open,"<SessionName>" command opens the setup from a specified session.

Query the current setup file name

This command queries the current setup file name.

Syntax

TEKEXP:SETUP? CURRENT (Query)

Returns

<String>

Examples

TEKEXP:SETUP? CURRENT command returns the current setup file name.

Run/stop/pause/resume the selected measurements execution in the application

This command run/stop/pause/resume the selected measurements execution in the application.

Syntax

TEKEXP:STATE <operation mode> (Set)

Command arguments

Argument NameArgument value
<operation mode>
  • RUN
  • STOP
  • PAUSE
  • RESUME

Returns

RUN | STOP | PAUSE | RESUME

Examples

TEKEXP:STATE RUN command runs the execution for the selected measurements.

Query the current measurement execution status

This command queries the current measurement execution status.

Syntax

TEKEXP:STATE? (Query)

Returns

RUNNING | PAUSED | WAIT | ERROR | READY

Examples

TEKEXP:STATE? command returns the current measurement execution status.

Query whether the current setup is saved or not saved

This command queries whether the current setup is saved or not saved.

Syntax

TEKEXP:STATE? SETUP (Query)

Returns

Saved or Not‐Saved

Examples

TEKEXP:STATE? SETUP command returns whether the current setup is saved or not saved.

Query the status of the previous command execution

This command queries whether the previous command execution is completed successfully.

Syntax

TEKEXP:*OPC? (Query)

Returns

{0 | 1} or {True | False}

1 or True indicates that command execution is successful.

0 or False indicates that command execution is failed.

Examples

TEKEXP:*OPC? command returns whether the previous command operation is completed successfully.

Query the last error occurred

This command queries the last error occurred.

Syntax

TEKEXP:LASTERROR? (Query)

Returns

<String>

Examples

TEKEXP:LASTERROR? command returns the last error occurred.

Set or query the popup details

This command sets or queries the popup details.

Syntax

TEKEXP:POPUP? (Query)

TEKEXP:POPUP "<PopupResponse>" (Set)

Command arguments

Argument NameArgument value
<PopupResponse>
  • Yes
  • No

Returns

The pop‐up details return in the following format:

"<Tittle>","<message>","<response1>,<response2>".

Where,

<Tittle> :: <String>

<message> :: <String>

<response1>,<response2> :: <String>

Examples

TEKEXP:POPUP? command returns the popup details in following format ": "Do you really want to exit TekExpress?";Responses: "Yes, No".

TEKEXP:POPUP "Yes" command sets the popup response to Yes.

Sets or query the limit values in the limits editor window

This command sets or queries the limit values in the limits editor window.

Syntax

TEKEXP:VALUE LIMIT,<TestName>,<LimitHeader>,<Value1>,<CompareString>,<Value2>(Set)

TEKEXP:VALUE? LIMIT,<TestName>,<LimitHeader> (Query)

Returns

<String> or <NRf>

Examples

TEKEXP:VALUE LIMIT,<TestName>,<LimitHeader>,<Value1>,<CompareString>,<Value2> command sets the limits value for the specified testname and limit header.

TEKEXP:VALUE? LIMIT,<TestName>,<LimitHeader> command returns the limits value for the specified testname and limit header.

Set or query the waveform file recalled for the specified test name and acquire type

This command set or queries the waveform file recalled for the specified test name and acquire type.

If there are more than one waveform, the waveform file names are displayed with the symbol "$" separated values in the format

<WaveformFileName1$ WaveformFileName2>.

Syntax

TEKEXP:VALUE WFMFILE,<TestName>,<AcquireType>,<WaveformFileName> (Set)

TEKEXP:VALUE? WFMFILE,<TestName>,<AquireType> (Query)

Returns

<String>

Examples

TEKEXP:VALUE WFMFILE,<TestName>,<AquireType>,<WaveformFileName> command recalls the sepcified waveform file for the specified testname and acquire type.

TEKEXP:VALUE? WFMFILE,<TestName>,<AquireType> command returns the waveform file name recalled for the specified testname and acquire type.

Set or query the enable/disable status of Verbose function

This command sets or queries the enable/disable status of Verbose function.

Syntax

TEKEXP:VALUE VERBOSE,"<Value>" (Set)

TEKEXP:VALUE? VERBOSE (Query)

Arguments

Argument NameArgument value
<Value>{True | False} or {1 | 0}

It represents enabled or disabled.

Where,
  • True or 1 - enabled
  • False or 0 - disabled

Returns

{True | False} or {0 | 1}

Examples

TEKEXP:VALUE VERBOSE,"<Value>" command enable or disable the Verbose function.

TEKEXP:VALUE? VERBOSE command returns the enable or disable status of Verbose function.

Set or query the View report after generating option status

This command sets or queries the enable/disable status of the View report after generating function.

Syntax

TEKEXP:VALUE? GENERAL,"View Report After Generating" (Query)

TEKEXP:VALUE GENERAL,"View Report After Generating",<value> (Set)

Arguments

Argument NameArgument value
<Value>{True | False} or {1 | 0}

It represents enabled or disabled.

Where,
  • True or 1 - enabled
  • False or 0 - disabled

Returns

{True | False} or {0 | 1}

Examples

TEKEXP:VALUE? GENERAL,"View Report After Generating" command returns the enable or disable status of view report after generating option.

TEKEXP:VALUE GENERAL,"View Report After Generating",<value> command enable or disable the view report after generating option.

Returns the report as XML string

This command returns the report as XML string.

Syntax

TEKEXP:REPORTASXML? (Query)

Returns

<String>

Examples

TEKEXP:REPORTASXML? command returns the report XML string.

Copies all the images from current run session to the given destination location

This command copies all the images from current run session to the given destination location.

Syntax

TEKEXP:COPYIMAGES <DestinationPath> (Set)

Command argument

<DestinationPath> :: <String>

Returns

NA

Examples

TEKEXP:COPYIMAGES C:\Temp command copies all the images from current run session to the mentioned location.

Selects the specified test(s) and deselect all other tests

This command selects the specified test(s) and deselect all other tests.

Syntax

TEKEXP:SELECTID <”TestID”> (Set)

Command argument

Argument NameArgument value
TestID String

Returns

NA

Examples

TEKEXP:SELECTID "11101"This command select the test associated with the ID and deselects all other tests in the application.

TEKEXP:SELECTID “11101,11102”This command selects the tests associated with the IDs and other tests will be deselected.

Returns the complete information about the selected test

This command returns the complete information about the selected test.

The information includes application name, TestID, Device selected, Suite selected, version, Test name, Test description.

Syntax

TEKEXP:TESTINFO? (Query)

Returns

<String>

Examples

TEKEXP:TESTINFO? This command returns the following details:

<TekExpress> <Test Id="11101" Device="TX-Device" Suite="Group1" Version="Spec 1.0" Name="Algorithm Library Measurement" Description="This is Algorithm Library measurement test. Refer Section-B of TekExpress SampleApp Development Guide for more details.

Set the default session

Sets the application configurations to default value.

Syntax

TEKEXP:SESSION DEFAULT (set)

Examples

TEKEXP:SESSION DEFAULT, sets the application configurations to default value.

Save the run/config sessions

Enter the name to save/config the session.

Syntax

TEKEXP:SESSION SAVE,“Session Name” (set)

Command arguments

Argument NameArgument value
<Session Name><String>

Examples

TEKEXP:SESSION SAVE,“Session Name” saves the session.

Load the run/config session

Load the selected config/run session.

Syntax

TEKEXP:SESSION LOAD, “Session Name” (set)

Command arguments

Argument NameArgument value
<Session Name><String>

Examples

TEKEXP:SESSION LOAD, “Session Name”, load the selected config/run session.

Delete the run/config session

Deletes the selected config/run session.

Syntax

TEKEXP:SESSION DELETE, "Session1, Session2" (set)

Command arguments

Argument NameArgument value
<Session Name><String>

Examples

TEKEXP:SESSION DELETE, "Session1, Session2", deletes the selected config/run session.

Run the run/config saved session

Run the selected config/run session.

Syntax

TEKEXP:SESSION RUN, “Session Name’s separated by comma” (set)

Command arguments

Argument NameArgument value
<Session Name><String>
Session Name’s separated by comma (to run the multiple run sessions)<String>

Examples

TEKEXP:SESSION RUN, “Session Name’s separated by comma”, runs the selected config/run session.

Query the available list in the run/config session

Returns the list of available config/run session.

Syntax

TEKEXP:SESSION? LIST

Returns

Returns the list of available config/run session.

Examples

TEKEXP:SESSION? LIST, returns the list of available config/run session.

Query the current run/config session

Returns the selected config/run session.

Syntax

TEKEXP:SESSION? CURRENT

Returns

Returns the selected config/run session.

Examples

TEKEXP:SESSION? CURRENT, returns the selected config/run session.

Override the run/config session

Overrides the selected config/run session.

Syntax

TEKEXP:SESSION SAVE,"SessionName", "True" (set)

Command arguments

Argument NameArgument TypeArgument Value
<Session Name><String>{True | False} or {1 | 0}

It represents enabled or disabled.

Where,
  • True or 1 - enabled
  • False or 0 - disabled

Returns

{True | False} or {0 | 1}

Examples

TEKEXP:SESSION SAVE,"SessionName", "True", overrides the selected config/run session.

Exit or close the application

The command exits or close the application

Syntax

TEKEXP:EXIT(Set)

Examples

TEKEXP:EXIT command close the application.

Examples

import sys

from time import sleep

import platform

import os

import traceback

import socket_instrument

import csv

_dutId = 'Test DUTID'

_deviceName = "CEM"

_suiteName = "Add-In-Card"

_versionName = "Gen1 - 1.1"

[_param, _value] = ['Signal Validation', 'Turn Off Signal Check']

_measList = ['Unit Interval Gen1']

#No need to change the IP address as it is running on same machine

ipAddress = "localhost"

si = socket_instrument.SocketInstrument(ipAddress, 5000)

print si.instId

# Set DUTID

si.write('TEKEXP:VALUE DUTID,"{0!s}"'.format(_dutId))

print si.query('TEKEXP:VALUE? DUTID')

# Set device

si.write('TEKEXP:SELECT DEVICE,"{0!s}"'.format(_deviceName))

while si.query('TEKEXP:SELECT? DEVICE') != '"{}"'.format(_deviceName):

sleep(1)

print si.query('TEKEXP:SELECT? DEVICE')

# Set test suite

si.write('TEKEXP:SELECT SUITE,"{0!s}"'.format(_suiteName))

while si.query('TEKEXP:SELECT? SUITE') != '"{}"'.format(_suiteName):

sleep(1)

print si.query('TEKEXP:SELECT? SUITE')

# Set test version

si.write('TEKEXP:SELECT VERSION,"{0!s}"'.format(_versionName))

while si.query('TEKEXP:SELECT? VERSION') != '"{}"'.format(_versionName):

sleep(1)

print si.query('TEKEXP:SELECT? VERSION')

# Set Signal Validation to 'Turn Off'

si.write('TEKEXP:VALUE GENERAL,"{0!s}","{1!s}"'.format(_param, _value))

print si.query('TEKEXP:VALUE? GENERAL,"{0!s}"'.format(_param))

# Assign Test name

si.write('TEKEXP:SELECT TEST,ALL,FALSE')

sleep(2)

for _meas in _measList:

si.write('TEKEXP:SELECT TEST,"{0!s}",TRUE'.format(_meas))

sleep(2)

selectedMeasurements = si.query('TEKEXP:SELECT? TEST')

selectedMeasurements = selectedMeasurements.replace('"','').split(',')

#print 'Selected Measurements'

#for meas in selectedMeasurements:

#print meas

# if any General Parameters User want to modify can be done here

# Execution Starts

"""Execution function with popup handling"""

appStatus = si.query('TEKEXP:STATE?')

if appStatus == 'READY':

si.write('TEKEXP:STATE RUN')

while str(si.query('TEKEXP:STATE?')) != 'RUNNING':

sleep(1)

appStatus = si.query('TEKEXP:STATE?')

try:

while str(appStatus) != 'READY':

appStatus = si.query('TEKEXP:STATE?')

if appStatus in ['RUNNING']:

sleep(2)

print('Application Status: ..{}..'.format(appStatus))

if appStatus in ['WAIT','ERROR']:

print('\n----------------------------------------')

print('Application Status: {} Message'.format(appStatus))

info = str(si.query('TEKEXP:POPUP?'))

[Title, Message, Responses] = info.split(';')

ResponseOptions = str(Responses[12:-1]).strip('"')

ResponseOptions = ResponseOptions.split(',')

print('\n\n'+Title+'\n\n'+Message+'\n')

print("----------------------------------------")

for res in ResponseOptions:

print str(ResponseOptions.index(res)) + ' > ' + res

userResponse = int(input('Choose your option: '))

si.write('TEKEXP:POPUP "{0!s}"'.format(ResponseOptions[userResponse]))

print('\nResponse Sent: "{0!s}"'.format(ResponseOptions[userResponse]))

print("----------------------------------------")

print("***** EXECUTION COMPLETED *****")

except Exception:

print("Exception Occured")

# Get the Measurement Results

allDetailsList = list()

allValuesList = list()

allMarginList = list()

for meas in _measList:#selectedMeasurements:

allDetailsList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Details'))).replace('"','').split(',')

allValuesList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Value'))).replace('"','').split(',')

allMarginList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Margin'))).replace('"','').split(',')

results = zip(allDetailsList, allValuesList, allMarginList)

# Define local variables

testResultList = list()

details = list()

values = list()

margines = list()

# Header Info for the CSV file

header1CSV=["Detail"]

header2CSV=["Value"]

header3CSV=["Margin"]

header=zip(header1CSV,header2CSV,header3CSV)

testResultList.append(header)

# Convertion to suitable for CSV formatting

testResultList.append(results)

# Open a CSV file object

csvFilePath = "C:\\Test_PCI_Results.csv"

csvFilObj = open(csvFilePath,"wb")

# writing CSV file with the statistical values

mywritter=csv.writer(csvFilObj)

for rowVal in testResultList:

mywritter.writerows(rowVal)

# Closing the CSV file object

csvFilObj.close()

si.disconnect()

References

Application directories

You can find the application files at C:\Program Files\Tektronix\TekExpress PCI Express. The application directory and associated files are organized as follows:



The following table lists the default directory names and their usage:
Table 1. Application directories and usage
Directory names Usage
Bin Contains application libraries
Compliance Suites Contains test suite specific files
Examples Contains various support files
ICP Contains instrument and application specific interface libraries
Images Contains images of the application
Lib Contains utility files specific to the application
LicensesContains all the license files
Report Generator Contains style sheets for report generation
Tools Contains instrument and application specific files

File name extensions

The TekExpress PCIe application uses the following file name extensions:

File name extension

Description

.TekX

Application session files (the extensions may not be displayed)

.py

Python test file. See the TekExpress PCI Express\Examples folder for a sample file

.xml

Test-specific configuration information (encrypted) file

Application log file

.wfm

Test waveform file

.mht

Test result reports (default). Test reports can also be saved in HTML format

.flt

Filter files

.chm, pdf

Help manuals

Waveform file names

This application uses file name conventions to access the waveforms. It is recommended to save the waveforms with following file names.

  • Differential data waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Differential.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Diff.wfm

  • Differential clock waveform: Tek_PCIe_Slot_DataRate_LaneNumberClk_PresetNumber_Data_Differential.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00Clk_P0_d_Diff.wfm

  • Single ended data positive waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Pos.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Pos.wfm

  • Single ended data negative waveform: Tek_PCIe_Slot_DataRate_LaneNumber_PresetNumber_Data_Neg.wfm

    Example: Tek_PCIe_01_8Gbps_Ln00_P0_d_Neg.wfm

See also

Select report options

View test-related files

Application directories and their contents

Before you click start

View test-related files

Files related to tests are stored in the My TekExpress\PCI Express folder. Each test setup in this folder has a test setup file and a test setup folder, both with the test setup name.

The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.

Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.

Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside its matching session folder:



Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran tests using prerecorded waveform files, these are included here.

The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\PCI Express. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the Untitled Session folder until you run a new test or until you close the PCIe application.

See also

File name extensions

Before you click start

De-embed using filter files

TekExpress PCIe provides an option to de-embed the signal path using filter files. You create the filter files. The filter files are .flt files composed of de-embed filter coefficients for a particular sampling rate. A filter file created for one sampling rate might not work for other sampling rates, so it is important to understand at what sampling rate the measurements are being performed.

Also, the de-embedding filters might differ based on the type of input. For example, if a single ended input is made using a matched SMA cable pair, a filter file for de-embedding a single SMA cable must be provided, since matched SMA cables mostly have similar s-parameters. So in this case, the same filter file is used to de-embed the SMA cable pair.

The maximum sampling rate provided on any channel combination on MSO/DPO/DSA70000/C/D/DX series oscilloscopes is 50 GS/s in realtime mode. The maximum sampling rate provided on Ch1-Ch3 and Ch2-Ch4 channel combinations on MSO/DPO/DSA70000C/D/DX/SX series oscilloscopes is 100 GS/s, provided only 2 channels are on at a given time.

See also

Common test parameters and values

Configuration test parameters

Setup files

TekExpress PCI Express package contains setup files (*.TekX) which can be used at PCI-SIG workshop for compliance tests.

Table 1. Setup files configuration details
Setup files (*.TekX) Configuration details (exclusively used in Gen1/2/3 Gold Suite of PCI-SIG Work Shop (WS))

Compliance_CEM_AIC _x1

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 1 Lane (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_AIC_x2

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 2 Lanes (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_AIC _x4

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 4 Lanes (Selected test lane: L0, L03)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_AIC_x8

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 8 Lanes (Selected test lane: L0, L03, L07)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_AIC _x16

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 16 Lanes (Selected test lane: L0, L07, L15)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_SYB_x1

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 1 Lane (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_SYB_x2

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 2 Lanes (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_SYB_x4

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 4 Lanes (Selected test lane: L0, L03)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_SYB_x8

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 8 Lanes (Selected test lane: L0,L03,L07)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_CEM_SYB_x16

  • Specification - CEM
  • Device Type - Add-In-Card
  • Version - Gen3 - 3.0
  • Data Rates - 2.5 Gbps, 5 Gbps (Tx equalization 3.5dB, 6 dB) and 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 16 Lanes (Selected test lane: L0,L07,L15)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_Module_x1

  • Specification - U.2 (SFF8639)
  • Device Type - Module
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 1 Lane (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_Module_x2

  • Specification - U.2 (SFF8639)
  • Device Type - Module
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 2 Lanes (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_Module_x4

  • Specification - U.2 (SFF8639)
  • Device Type - Module
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 4 Lanes (Selected test lane: L0,L03)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_Host_x1

  • Specification - U.2 (SFF8639)
  • Device Type - Host
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 1 Lane (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_ Host _x2

  • Specification - U.2 (SFF8639)
  • Device Type - Host
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 2 Lanes (Selected test lane: L0)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

Compliance_U2_ Host _x4

  • Specification - U.2 (SFF8639)
  • Device Type - Host
  • Version - Gen3 - 3.0
  • Data Rates - 8 Gbps
  • Signal Quality Preset Selection - P0, P7 and P8 for L0 and All Presets from P0 to P10 for Lane0
  • Link Width - 4 Lanes (Selected test lane: L0, L03)
  • Automated DUT Control - unchecked
  • Signal Validation - Pattern Decoding

How to open a setup file

  1. Click Options > Open Test Setup
  2. Select the TekExpress Setup File as per your required configuration. Check Setup files configuration details table for configuration details.

  3. Make the configuration details and start the test execution.
  4. Click Save Test Setup As and save the setup.
    Note:You cannot edit the TekExpress Test Setup files as they are in Read Only mode.
Note:The setup files path is C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express\Setup Files

RF Switch configuration files

TekExpress PCI Express package contains RF Switch configuration files.

File name Configuration details

PCE_Keithley_SYB_x6

Recall this file for Keithley S46T RF Switch and System-Board device type. The below are the configuration details:

  • Lane0 Positive to Lane05 Positive connected as Signal Inputs to Relay S1.
  • Lane0 Negative to Lane05 Negative connected as Signal Inputs to Relay S3.
  • Common output of relay A, B is connected to CH1, CH3 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3 respectively.
  • Connect the Ref Clock Positive and Negative from CLB to CH3, CH4 of oscilloscope. For 2-Unit, SX box >=59GHz, set the Ref Clock Positive and Negative to CH2 and CH4 respectively.

PCE_KthCCD_SYB_x12

Recall this file for Keithley S46T RF Switch and System-Board device type. The below are the configuration details:

  • Lane0 Positive to Lane05 Positive connected as Signal Inputs to Relay A which is Cascade to Relay 4 and Input to NO.
  • Lane0 Negative to Lane05 Negative connected as Signal Inputs to Relay B which is Cascade to Relay 5 and Input to NO.
  • Lane06 Positive to Lane11 Positive connected as Signal Inputs to Relay C which is Cascade to Relay 4and Input to NC.
  • Lane06 Negative to Lane11 Negative connected as Signal Inputs to Relay D which is Cascade to Relay 5 and Input to NC.
  • Relay 4 is selected as Positive and Relay 5 as Negative; common output of 4 and 5 is connected to CH1, CH2 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3 respectively.
  • Connect the Ref Clock Positive and Negative from CLB to CH3, CH4 of oscilloscope. For 2-Unit, SX box >=59GHz, set the Ref Clock Positive and Negative to CH2 and CH4 respectively.

PCE_Giga_SYB_x8

Recall this file for Gigatronics ASCOR 8000 Series RF Switch and System-Board device type. The below are the configuration details:

  • Lane0 Positive to Lane07 Positive connected as Signal Inputs to Relay S1.
  • Lane0 Negative to Lane07 Negative connected as Signal Inputs to Relay S3.
  • Common output of relay S1, S3 is connected to CH1, CH3 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3 respectively.
  • Connect the Ref Clock Positive and Negative from CLB to CH3, CH4 of oscilloscope. For 2-Unit, SX box >=59GHz, set the Ref Clock Positive and Negative to CH2 and CH4 respectively.

PCE_GigCCD_SYB_x16

Recall this file for Gigatronics ASCOR 8000 Series RF Switch and System-Board device type. The below are the configuration details:

  • Lane0 Positive to Lane07 Positive connected as Signal Inputs to Relay S1 which is Cascade to Relay S2 and Input to NO.
  • Lane0 Negative to Lane07 Negative connected as Signal Inputs to Relay S3 which is Cascade to Relay S5 and Input to NO.
  • Lane08 Positive to Lane15 Positive connected as Signal Inputs to Relay S4 which is Cascade to Relay S2 and Input to NC.
  • Lane08 Negative to Lane15 Negative connected as Signal Inputs to Relay S6 which is Cascade to Relay s5 and Input to NC.
  • Relay S2 is selected as Positive and Relay S5 as Negative; common output of S2 and S5 is connected to CH1, CH2 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3 respectively.
  • Connect the Ref Clock Positive and Negative from CLB to CH3, CH4 of oscilloscope. For 2-Unit, SX box >=59GHz, set the Ref Clock Positive and Negative to CH2 and CH4 respectively.

PCE_Keithley_AIC_x12

Recall this file for Keithley S46T RF Switch and Add-In-Card device type. The below are the configuration details:

  • Lane0 Positive to Lane05 Positive connected as Signal Inputs to Relay A.
  • Lane0 Negative to Lane05 Negative connected as Signal Inputs to Relay B.
  • Lane08 Positive to Lane11 Positive connected as Signal Inputs to Relay C.
  • Lane08 Negative to Lane11 Negative connected as Signal Inputs to Relay D.
  • Common output of relay A, B, C ,D is connected to CH1, CH2, CH3, CH4 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3, CH2 and CH4 respectively.

PCE_Giga_AIC_x16

Recall this file for Gigatronics ASCOR 8000 Series RF Switch and Add-In-Card device type. The below are the configuration details:

  • Lane0 Positive to Lane07 Positive connected as Signal Inputs to Relay S1.
  • Lane0 Negative to Lane07 Negative connected as Signal Inputs to Relay S3.
  • Lane08 Positive to Lane15 Positive connected as Signal Inputs to Relay S4.
  • Lane08 Negative to Lane15 Negative connected as Signal Inputs to Relay S6.
  • Common output of relay S1, S2, S3 , S4 is connected to CH1, CH2 , CH3, CH4 of the oscilloscope respectively. For 2-Unit, SX box >= 59 GHz, set the common outputs to CH1, CH3, CH2 and CH4 respectively.

How to run Base SRIS Tx Test Board tests

This document describes the procedure to run PCIe Base Spec Gen4/Gen5 SRIS Tx Test Board tests using TekExpress PCI Express.

Accessories required

  • Gen4/Gen5 Base specification fixture
  • SMA-SMP cables
  • TCA-SMA 292D / TriMode probes
  • AWG7002A or AWG7001A

Capture data signals at sampling rate of 100Gsps/200Gsps with 12.5 M record length. Ensure the PCIE_TX_Toggle_Patterns_v10.0.0.2.exe is installed on AWG-70K series and the recommended probes and real time oscilloscopes are used.

  1. In DUT panel, select Specification as BaseSpec and Device Type as SRIS Tx Test Board.

  2. If AWG70K is detected then the AWG Clock Setup check box will be enabled in the configuration panel. Click the Setup button next to AWG Clock Setup check box. This will bring up the SRIS configuration, with a selection to choose SSC on/Off.

  3. Based on the selections of the AWG Clock Setup check box, SSC on/Off selection and different combinations of AWG setup files will be loaded on the AWG. These combinations dictate if an external 100 MHz reference clock (with SSC on/Off) on Ch1 of the AWG will be transmitted. The following AWG files loaded as per configuration for Base specification (Device) and DUT Type SRIS Tx Test Board (Suite) for Gen4 and Gen5.

  4. Click Start and when the application prompts, power on the Gen4/Gen5 DUT. Ensure that the DUT transmits Gen4/Gen5 selected presets. Analysis will be done with SigTest.

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