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Products (2)
- Discontinued (2)
Datasheet (5)
Manuals (1)
- Declassification Manuals (1)
Resources (3)
- Application Note (1)
- Fact Sheet (1)
- Whitepaper (1)

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Products
BERTScope BSA Series (Discontinued)

This product has been discontinued, but information is still available.

Product Discontinued

Last Update: Thursday, April 20, 2023
Products
BERTScope Digital Pre-emphasis

BSA Series accessories serving high speed serial designers' needs for Pre-Emphasis or Equalization.

Product Discontinued

Last Update: Thursday, April 20, 2023
Manual
Tektronix BERTScope BSA Series

Provides instructions to declassify or cleanse Tektronix BERTscope instruments for security purposes.

Manual
Declassification Manuals | P/N 077079100 | Date: Monday, January 14 2013
Technical Document
BSA Series BERTScope Bit Error Rate Testers Fact Sheet

This BERTScope Fact Sheet contains key specs and ordering information for the BSA Series BERTScope Bit Error Rate Testers.

65W-25456-0 | Date: Friday, June 04 2010
Datasheet
BERTScope Clock Recovery Datasheet

65W-25479-9 | Date: Monday, March 27 2017
Datasheet
Bit Error Rate Tester

The BERTScope BSX-series Bit Error Rate Tester introduces a receiver test platform capable of supporting emerging Gen4 standards and beyond. With the addition of powerful data processing and internal Tx equalization, the BERTScope supports protocol …

65W-61052-9 | Date: Friday, April 05 2019
Datasheet
Bit Error Rate Tester

The BERTScope Bit Error Rate Tester Series provides a new approach to signal integrity measurements of serial data systems. Perform bit error rate detection more quickly, accurately, and thoroughly by bridging eye diagram analysis with BER pattern …

65W-25444-15 | Date: Monday, January 29 2018
Datasheet
DisplayPort™ 1.4 Sink Calibration and Test Software (DP-SINK-BSX/DP-SINK)

65W-61393-00 | Date: Tuesday, August 28 2018
Datasheet
PCI Express® 4.0 and 3.0 Base Specification Receiver Test Automation Software (BSXPCI4BSE)

65W-61392-0 | Date: Monday, June 24 2019
Technical Document
Clock Recovery’s Impact on Test and Measurement

This application note discusses the outside influences that can disturb the relationship between data and how it is clocked.

65W_26074_0 | Date: Tuesday, September 28 2010