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Who will use SourceMeter®?
From Science & Engineering Graduates to University Professors, from Material Scientists to Nano-electronics Engineers, from Bio-Chemistry to Electro-Chemistry Researchers, from Semiconductor Quality Assurance Engineers to R&D Failure Analysis Reliability Engineers…there are so many engineers and scientists who had used and continue to use SourceMeter® to accomplish their measurements and tests in a more accurate, faster and easy way.
Academic & Government Research
Test Solutions
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Nanotechnology
Application Notes
Nano Technology Measurement Book Discover Today’s Solutions for Tomorrow’s Nano Characterization Challenges Electrical Measurements on Nanoscale Materials Characterizing Nanoscale Devices With Differential Conductance Measurements Exploring the boundaries of materials science or device development eGuide Nanoscale Device & Material Electrical Measurements Advances in Electrical Measurements for Nanotechnology E-Handbook Which Keithley Nanotechnology Solution is Best for Your Sourcing or Measurement Application? The Emerging Challenges of Nanotechnology Testing The Role of Nanotechnology in the Semiconductor IndustryRelated Products
2400 Series SourceMeter®2600 Series SourceMeter® Talk to Keithley Application Engineers![](/sites/default/files/2019-02/cn_pc_campaign_smu_hall.jpg)
Superconductor & Conductance Test
Application Notes
Automatic Resistance Measurements on High Temperature Superconductors An Improved Method for Differential Conductance White Paper New dG Measurement Methods Reveal Nanodevice Characteristics Fast and at lower costBlogs
Measuring the resistivity of conductors is not rocket science! Low Resistance Measurement with a SourceMeter: Do I use Current Reversal, Offset Compensation or Delta Mode measurement methods?Related Products
6220/6221 2182A Super Low Resistance Configuration Talk to Keithley Application Engineers![](/sites/default/files/2019-02/cn_pc_campaign_smu_semiconductor.jpg)
Electro-Chemistry
Application Notes
Keithley Instrumentation for Electrochemical Test Methods and Applications Performing Cyclic Voltammetry Measurements using 2450-EC or 2460-EC Biosensor/Transducer Qualification Using 2450 Interactive SourceMeter®Blogs
Electrochemical Biosensor Qualification Using a Source Measure Unit to Perform Open Circuit Potential of an Electrochemical Cell How Source Measure Units can be used as Potentiostats for Cyclic Voltammetry, Chronoamperometry and other Electrochemical Tests Test Setup Tips to make electrochemical measurements (Cyclic Voltammetry, Chronoamperometry) using Keithley 2450-EC and 2460-EC Performing Cyclic Voltammetry Charge/Discharge measurements on Galvanic Cells (without a reference electrode) using Keithley 2450-EC and 2460-ECDemo Videos
How to Perform Cyclic Voltammetry Measurements with the 2450-EC Electrochemistry Lab SystemRelated Products
2450-EC Potentiostats2460-EC Potentiostats
2461-EC Potentiostats Talk to Keithley Application Engineers
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HALL Effect Material Characterization
Application Notes
Hall Effect Measurements Overview Hall Effect Measurements in Materials Characterization White Paper High Impedance Semiconductor Resistivity and Hall Effects Test Configurations Hall Effect Measurements Essential for Characterizing High Carrier Mobility Instrumentation and Techniques for Measuring High Resistivity and Hall Voltage of Semiconductor Materials Four-Probe Resistivity and Hall Voltage Measurements with 4200-SCSBlogs
New Plug-in Cards Extend Keithley Automated Test Solution’s Capabilities for Hall Effect and Sensitive MeasurementsDemo Videos
The Equipment and Connections of Hall Effect MeasurementsWebinar
Use Hall Effect Measurements for the Characterization of New and Existing Materials Low Level Measurements Techniques and Considerations for Quantum Hall Effect MeasurementRelated Products
2400 Series SourceMeter®Keithley 4200A-SCS Parameter Analyzer Talk to Keithley Application Engineers
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Material Science
Application Notes
Exploring the boundaries of materials science or device development eGuide Leakage Current and Insulation Resistance Measurements Using 2450 SourceMeter Resistivity Measurements Using 2450 SourceMeter Making High Resistance Measurements on Small Crystal in Inert Gas or High Vacuum with 6517A Electrometer Electrical Characterization of Carbon Nanotube Transistors with 4200-SCS New Materials - New Reliability Issues - White Paper Qualifying High κ Gate Materials with Charge-Trapping MeasurementsRelated Products
2450 SourceMeter®6517A ElectrometerKeithley 4200A-SCS Parameter Analyzer Talk to Keithley Application EngineersIndustry R&D & Production Test
Test Solutions
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Device Characterization (Diode, Transistor, MOSFET)
Application Notes
Diode Production Testing with 2400 Series SourceMeter® Diode Production Testing with 2600 Series SourceMeter® Easy I-V Characterization of Diodes using 2450 SourceMeter® DC Electrical Characterization of RF Power Amplifiers Dual Channel Pulse Testing Simplifies RF Transistor Characterization Simplified I-V Characterization of Transistors Accurately Measuring High Speed GaN TransistorsRelated Products
PCT Parametric Curve Tracer2400 Series SourceMeter® Talk to Keithley Application Engineers![](/sites/default/files/2019-02/cn_pc_campaign_smu_led.jpg)
Optoelectronic Device Characterization (Laser Diode, LED, Photo Detector)
Application Notes
Fixing, Avoiding Problems in Pulse Testing of High Power Laser Diodes Pulse Testing Of Laser Diodes Laser Diode Array Test - 3D Sensing with 2602B or 2606B SourceMeter® Measuring Laser Diode Optical Power with Keithley Model 2500INT Integrating Sphere High-Throughput DC Production Testing of Telecommunications Laser Diode Modules & VSCEL with 2602B SourceMeter® Instrumenting DWDM Laser Diode Production Test Photodetectors—Choose and Use Wisely for Best Results in Pulsed Laser Diode Test System Discover the Industry Standard for LED Electrical Test Testing High Brightness LEDs under Pulse Width Modulation Using the Model 2651A High Power SourceMeter InstrumentBlogs
3D Sensing: How to improve accuracy, throughput and yield when pulse testing high-power laser diodes Four things to know when measuring laser diode optical power with an integrating sphereRelated Products
2650 High Power SourceMeter® 2600 Series SourceMeter® Talk to Keithley Application Engineers![](/sites/default/files/2019-02/cn_pc_campaign_smu_resistance-testing.jpg)