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IsoVu™ Isolated Current Probes

TICP100, TICP050, TICP025 Datasheet

TICP100, TICP050, TICP025 Datasheet

Overview

TICP Series IsoVu™ isolated current probes deliver exceptional bandwidth, noise rejection, accuracy, and ease of use for making current measurements.

Complete galvanic isolation eliminates ground loops and enables very high common mode rejection. In a 1X configuration, the TICP Series probe's 50 Ω input offers extremely low noise of less than 4.7 nV/√Hz, ideal for making accurate measurements on shunts. The probes offer a variety of attenuation tips to extend the differential voltage range. Depending upon the shunt used, the probes can perform current measurements from microamperes (µA) for low-power mobile designs to hundreds of amperes for industrial and mobility systems.

Key performance specifications and features

  • Galvanic isolation between probe tip and the oscilloscope
  • Available in three bandwidths: 1 GHz, 500 MHz, and 250 MHz
  • Wide current measurement range determined by the shunt used with 1X, 10X or 100X probe tips
  • Noise <4.70 nV / √Hz (<21 μVRMS at 20 MHz)
  • Up to 90 dB CMRR at 1 MHz
  • Maximum common mode voltage: 1.8 kV; For use in a Pollution Degree 1 environment; transient level not to exceed 5 kVpk
  • 1.5% DC gain accuracy
  • Compatible with the 4, 5, and 6 Series MSO instruments, including the latest B models
  • TekVPI™ interface enables control and probe configuration from the oscilloscope front panel or programming interface

Key applications

  • Current shunt measurements
  • Half/full bridge designs using SiC or GaN, FETs, or IGBTs
  • Double pulse testing (DPT)
  • Floating gate measurements
  • Power converter designs
  • Switching power supply designs
  • Steady state, sleep, and wake-up state current monitoring

Tips expand measurement ranges, minimize hassle, and reduce noise

TICP Series probes are well-suited for both low current and high current measurements that are challenging or impossible with sensor-based clamp-on oscilloscope probes. With three different attenuation tips, you can easily measure a wide range of currents based on the shunt resistance and its power rating.

The probes are designed to provide high-performance current measurements while offering convenient connectivity. Tips are equipped with MMCX and SMA connectors to ensure proper grounding and shielding, which is crucial for minimizing noise, ground loops, and ensuring accurate current measurements. These tips enable direct connection to most commercially available shunts, but you can also use appropriate adapters to interface the tips with their shunts.

The probe tips connect to the probe body with a unique reversible IsoConnect™ interface, allowing you to snap-fit the tips without worrying about orientation. Designed for flexibility, the probe tips have a small bend radius, facilitating connection in tight spaces. The standard probe includes a tripod adapter and a bipod for convenient placement and positioning in the test setup.

Current shunt measurements

There are two methods to measure current in test systems. The first method involves sensing the fields around the electrical conductors and converting them into signals that represent the current. This method is used by most clamp-on style current probes, or Rogowski coils. The second method involves measuring currents using Ohm’s law. One can measure current by measuring the voltage drop across a precision shunt resistor, which is the method used by the TICP Series probes.

Current shunts, or current viewing resistors (CVRs), typically have a wide frequency response, accurately measuring both AC and DC currents across a broad spectrum of frequencies. Their compact size allows for easy integration into existing circuitry with minimal space requirements. Although shunt resistors must be designed into a PCB and result in voltage drop, they offer some key advantages compared to sensor-based current measurements, including high accuracy, minimal distortion, and low interference.

TICP 51W740630

Isolation enables floating measurements and exceptionally low noise

TICP Series IsoVu isolated current probes enable you to make more accurate dynamic current measurements on your oscilloscope, outside traditional limits.

Unlike transformer, Rogowski, or Hall effect current probes, TICP current probes enable measurements from DC to hundreds of MHz when paired with high-performance shunts or CVRs. Complete RF isolation between the probe tip and the oscilloscope eliminates ground loops and helps deliver extraordinary common mode rejection (CMRR) up to 90 dB at 1 MHz to dramatically reduce common mode noise. Low attenuation and low input impedance (50 Ω) limits noise contribution to less than 4.7 nV/√Hz noise contribution (<150 µV at 1 GHz) when measuring low voltages (± 0.5 V) across shunts.

TICP 51W740630

Measuring high-fidelity currents in high power systems

TICP Series probes provide the bandwidth you need to accurately see the fast risetimes of wide bandgap (WBG) switching devices. This enables you to accurately measure dynamic currents in high-power SiC and GaN power converters. They complement the groundbreaking IsoVu™ TIVP isolated voltage probes and represent a similar isolation breakthrough for current measurements. The isolation eliminates ground loops and enables accurate measurements of high-side drain currents (Ids).

TICP 51W740630

Measuring low currents in low power systems

TICP Series probes have the bandwidth to measure current consumption during specific system activities and transitions from sleep to active states. The low-noise architecture is critical for accurately measuring low currents across the shunts. The common mode voltage rating of TICP Series is higher than most differential probes, enabling current shunt measurements on higher voltage power rails. When paired with the low-noise of the 6 Series MSO, the overall system offers low-noise performance to efficiently measure rail currents.

TICP 51W740630

Specifications

All specifications are typical and apply to all models unless noted otherwise.

Probe and tip overview

ProbesTICP100 TICP050 TICP025
Bandwidth 1 GHz500 MHz250 MHz
Rise time400 ps700 ps 1.4 ns
DC gain accuracy±1.5%
Maximum common mode voltage1800 V; For use in a Pollution Degree 1 environment; Max with transient level not to exceed 5kVpk
1300 V; Pollution degree 2; Max with transient level not to exceed 5kVpk
600 V for CAT III; Pollution degree 2
1000 V for CAT II; Pollution degree 2
RMS noise spectral density4.70 nV / √Hz (<21 μVRMS at 20 MHz)
Probe cable length 2 meters (78 inches)​

Input voltage range, input impedance

Differential input voltage range + offset range will not exceed maximum measurable input voltage. For example, offset limited to ±0.15 V in TICPSMA's ±0.5 V range. Full ±0.5 V offset available in the TICP Series probe's ±0.125 V range.

Probe tipsDifferential input voltage range Offset rangeMaximum measurable input voltage (Vpk)Maximum non-destructive differential voltageInput impedance
TICPSMA±0.5 V±0.5 V0.65 V±3 V; 3 VRMS50 Ω || N.A.
TICPMM1 ±0.5 V±0.5 V0.65 V±3 V; 3 VRMS50 Ω || N.A.
TICPMM10±5 V±5 V6.5 V±15 V; 15 VRMS500 Ω || <3 pF
TICPMM100±50 V±50 V50 V±60 V; 60 VRMS5000 Ω || <3 pF
TICP 51W740630
Differential input voltage range

Noise floor (A RMS)

TICP 51W740630
Shunt selection20 MHz250 MHz1 GHz
50 Ω TICP as shunt420 nA1.5 μA3.0 μA
5 Ω shunt4.2 μA14.9 μA29.7 μA
1 Ω shunt21 μA74.3 μA149 μA
500 mΩ shunt42 μA149 μA297 μA
50 mΩ shunt420 μA1.5 mA3.0 mA
5 mΩ shunt4.2 mA14.9 mA29.7 mA
500 μΩ shunt42 mA149 mA297 mA
50 μΩ shunt420 mA1.5 A3.0 A
15 μΩ shunt1.4 A5.0 A9.9 A

Maximum measurable current

Maximum depends on shunt power rating.

TICP 51W740630

Shunt selectionTICPMM1TICPSMATICPMM10TICPMM100
50 Ω TICP as shunt13 mA--
5 Ω shunt130 mA1.3 A10 A
1 Ω shunt650 mA6.5 A50 A
500 mΩ shunt1.3 A13 A100 A
50 mΩ shunt13 A130 A1.0 kA
5 mΩ shunt130 A1.3 kA10 kA
500 μΩ shunt1.3 kA13 kA100 kA
50 μΩ shunt13 kA130 kA1000 kA
15 μΩ shunt43.3 kA433.3 kA3300 kA

Probe Ranges

Numbers are published for TICPSMA and TICPMM1 tips. For 10X or 100X tips, multiply by 10 or 100 respectively.

Input rangeOffset rangeRMS noise spectral density (VRMS)Noise floor at 20 MHz (VRMS)
±0.5 V±0.15 V22.9 nV / √Hz102.5 µVRMS
±0.35 V±0.30 V17.4 nV / √Hz77.8 µVRMS
±0.25 V±0.40 V15.0 nV / √Hz67.2 µVRMS
±0.175 V±0.475 V9.5 nV / √Hz42.4 µVRMS
±0.125 V±0.5 V8.7 nV / √Hz38.9 µVRMS
±0.09 V±0.5 V6.3 nV / √Hz28.3 µVRMS
±0.065 V±0.5 V5.5 nV / √Hz24.7 µVRMS
±0.045 V±0.5 V4.7 nV / √Hz21.2 µVRMS
±0.03 V±0.5 V4.7 nV / √Hz21.2 µVRMS
±0.02 V±0.5 V4.7 nV / √Hz21.2 µVRMS

Common mode rejection ratio (CMRR)

Probe tipDC 1 MHz100 MHz250 MHz500 MHz1 GHz
TICPSMA140 dB90 dB75 dB50 dB45 dB35 dB
TICPMM1140 dB90 dB80 dB70 dB70 dB50 dB
TICPMM1090 dB70 dB60 dB60 dB40 dB20 dB
TICPMM10075 dB50 dB45 dB30 dB20 dB6 dB

Application Examples

Application examples for Wide Bandgap (WBG) and PMIC power integrity.

WBG example (800V, 40 A typical; 0.125 Ω shunt)

In a 800 V SiC circuit switching at 40 A, a 125 mΩ shunt will produce a 5 V signal. To measure this using the TICP the 10X tip must be used. In the ±3.5 V range apply 0.3 V of offset.

The measurable current range goes from 52 A to -4 A. At these settings, the RMS noise floor at 250 MHz bandwidth is 2.2 mA RMS

TICP 51W740630

PMIC power integrity (48 V, 3 mA typical; 1 Ω shunt)

On a 48 V PMIC bus, the standby current of 3 mA will produce a 3 mV signal on a 1 Ω shunt. Use the 1X tip in the most sensitive ±20 mV range, apply offset to view the 3mA current and capture transients from 0 A to 40 mA with a RMS noise floor of 21.2 µA

TICP 51W740630

Environmental requirements

CharacteristicComponentOperatingNon-operating
TemperatureCompensation box and probe head0°C to +50°C-20°C to +70°C
Tip cables and adapters-40°C to +85°C -40°C to +85°C
HumidityCompensation box and probe head5% to 85% relative humidity up to +40°C, 5% to 45% relative humidity up to +50°C, non-condensing5% to 85% relative humidity up to +40°C, 5% to 45% relative humidity up to +70°C, non-condensing
Tip cables and adapters
AltitudeAll componentsUp to 3,000 meters (9,842 feet)Up to 12,000 meters (39370 feet)

Regulatory compliance

EMC
Conforms to European Union EMC Directive (CE-marked)
Safety
Conforms to European Union Low Voltage Directive (CE-marked)
Conforms to ANSI/UL61010-1 (CSA-marked)
Conforms to ANSI/UL61010-2-030 (CSA-marked)
Certified to CAN/CSA C22.2 No.61010-1 (CSA-marked)
Certified to CAN/CSA C22.2 No.61010-2-030 (CSA-marked)
RoHS
Conforms to European Union Restrictions on Hazardous Substances (CE-marked)

Ordering information

Select the appropriate instrument and options for your measurement needs.

Model overview

ModelDescription
TICP025250 MHz Tektronix Isolated Current Probe
TICP050500 MHz Tektronix Isolated Current Probe
TICP1001 GHz Tektronix Isolated Current Probe

Standard accessories

The following table lists the accessories that are shipped with the probe.
AccessoryDescription Part number
TICP 51W740630
1X probe tip cable with MMCX connectorTICPMM1
TICP 51W740630
10X probe tip cable with MMCX connectorTICPMM10
TICP 51W740630
SMA tip adapterTICPSMA
TICP 51W740630
Clamp-on ferrite common mode choke 276-0905-XX
TICP 51W740630
Bipod is used to hold the probe.020-3210-XX
TICP 51W740630
Tripod adapter for ¼ in - 20 UNC thread accessories.103-0508-XX
TICP 51W740630
Probe tip adapter. Adapts an MMCX IsoVu tip to standard 0.100" spaced, 0.025" square pins. 131-9717-XX
TICP 51W740630
Soft carrying case with foam insert.016-2147-XX

Recommended accessories

The following table lists optional accessories.
Accessory Description Part number
TICP 51W740630
100X probe tip with MMCX connector TICPMM100
TICP 51W740630
Square pin to MMCX adapter, 0.062" spacing131-9677-XX
TICP 51W740630
MMCX to IC grabber lead196-3546-XX
TICP 51W740630
Square pin to IC grabber lead196-3547-XX
TICP 51W740630
MicroCKT grabbers206-0569-XX

Supported oscilloscopes

The measurement systems can be used with the following Tektronix oscilloscopes.
  • 4 Series MSO, 4 Series B MSO
  • 5 Series MSO, 5 Series B MSO, 5 Series MSO LP
  • 6 Series MSO, 6 Series B MSO

Service options

Standard warranty
1 year
Opt. R3
Repair Service 3 Years (including warranty)
Opt. R5
Repair Service 5 Years (including warranty)
Opt. C3
Calibration Service 3 Years
Opt. C5
Calibration Service 5 Years
Opt. D1
Calibration Data Report
Opt. D3
Calibration Data Report 3 Years (with Opt. C3)
Opt. D5
Calibration Data Report 5 Years (with Opt. C5)

Probes and accessories are not covered by the oscilloscope warranty and Service Offerings. Refer to the datasheet of each probe and accessory model for its unique warranty and calibration terms.